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A New hcp Phase Formed in the Ni-Nb System during Ion-beam-assisted Deposition
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作者 Bin ZHAO, Kuiwei GENG, Fei ZENG and Feng PANLaboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2004年第5期577-579,共3页
The Ni80Nb20 films were prepared by ion beam assisted deposition (IBAD) with various Ar+ ion energies. A phase evolution of fcc→amorphous→Ni+Nb→Ni+hcp was observed with the increasing of ion beam energy from 2 keV ... The Ni80Nb20 films were prepared by ion beam assisted deposition (IBAD) with various Ar+ ion energies. A phase evolution of fcc→amorphous→Ni+Nb→Ni+hcp was observed with the increasing of ion beam energy from 2 keV to 8 keV. When bombarded by Ar+ ions of 8 keV during deposition, a new crystalline phase with hcp structure was obtained, of which the lattice parameters are a=0.286 nm and c=0.483 nm, different from those of the similar A3B-type hcp phase previously reported. The experimental results were discussed in terms of thermodynamics and restricted kinetic conditions in the far-from-equilibrium process of IBAD. The formation of hep phase may also be related to the valence electron effect. 展开更多
关键词 Hcp phase Ni-Nb Ion beam assisted deposition THERMODYNAMICS valence electron effect
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