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Temperature Dependence of Performance of 6H-SiC Unipolar Power Devices
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作者 何进 张兴 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第10期1235-1239,共5页
The temperature dependence of some performance of 6H SiC unipolar power devices is analyzed theoretically.By employing the temperature dependent ionization coefficient and mobility of a silicon carbide,the analytica... The temperature dependence of some performance of 6H SiC unipolar power devices is analyzed theoretically.By employing the temperature dependent ionization coefficient and mobility of a silicon carbide,the analytical expressions of the temperature dependent performance,such as breakdown characteristics and on resistance of 6H SiC unipolar power devices are derived in a closed form.The analytical results are compared with the experimental results,with good accordance found in the breakdown characteristics. 展开更多
关键词 wide band gap semiconductor devices 6H SiC impact ionization coefficient avalanche breakdown on resistance temperature dependence of performance
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