Design of a visual system for predicting SMT solder joint shape

A visual software system has been developed for predicting and analyzing the shape of solder joints in surface mount technology (SMT). The formation of the solder joint is numerically simulated through Surface Evolver program and the calculation is automated with an additional controller. A preprocessor is developed in which process parameters determining the shape of solder joints can be input visually and transferred into Evolver program automatically. A postprocessor is built to analyze the global three dimensional shape and cross section profiles of solder fillets in multiple windows. Also, the application for predicting the solder joint shape of RC chip component is conducted with the PSJS system.

Influences of fine pitch solder joint shape parameters on fatigue life under thermal cycle

The solder joint reliability of a 0.5mm lead pitch, 240-pin quad flat package(QFP) was studied by nonlinear finite element analysis(FEA). The stress/strain distributions within the solder joints and the maximum plastic strain range of the solder joints were determined. Based on the calculated maximum plastic strain range the thermal fatigue life of the solder joints was calculated using Coffin-Manson equation. The influences of shape parameters including volume of solder joint, pad size and stand-off on the thermal fatigue life of the solder joints were also studied. The results show that the stress and strain distribution in the solder joint are not uniform; the interface between the lead and the solder joint is the high stress and strain region; the maximum stress and stain occur at the topmost point where the solder joint intersects with the inner side of the lead. The solder joint cracks should occur firstly at this point and propagate along the interface between the solder and the lead. The solder joint with the pad size of 1.25mm×0.35mm, the stand-off of 0.02mm and the solder volume of 0.026mm^3 has longer fatigue life than that of any others. These optimal parameters have been applied in practice to assemble the 240-pin, 0.5mm pitch QFP.

THE DESIGN OF AN INTEGRATED SYSTEM FOR PREDICTING AND ANALYZING SOLDER JOINT SHAPE AND RELIABILITY INSMT

Solder joint reliability is one of critical problems detemining whether Sirface Mount Technology (SMT) can be used in the prohotion of important electronic products. Optimizing solder joint shape is one of effective ways to improve SMT solder joint reliability.In this paper. based on the theorem of minimum potential energy, an energy model of 3 - D solder joint shape is established,and the forma- tion of solder joint is numerically simulated by Surface Ecolver program. On the basis of the prediction of SMT solder joint shape,the mechanical model of analyzing solder joint reliability is established. An elasto - plasto - creep mateial model and its mechanical constitutive equaton are established for SnPb solder alloy, and the stress/strain response of SMT solder joint under thermal cyclical loabing is ana- lyzed with nonlinear 3 - D FEM. The fatigue life of solder joint is predicted according to Coffin- Manson fatigue life model. An integrated system for Predicting and analyzing SMT solder joint shape and reliability(PSAR) is developed.The system can analyze efficiently SMT solder joint reliability with the variation of structural parameters in the joint and give the optimal structure.

Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration

The spacecraft for deep space exploration missions will face extreme environments,including cryogenic temperature,intense radiation,wide-range temperature variations and even the combination of conditions mentioned above.Harsh environments will lead to solder joints degradation or even failure,resulting in damage to onboard electronics.The research activities on high reliability solder joints using in extreme environments can not only reduce the use of onboard protection devices,but effectively improve the overall reliability of spacecraft,which is of great significance to the aviation industry.In this paper,we review the reliability research on SnPb solder alloys,Sn-based lead-free solder alloys and In-based solder alloys in extreme environments,and try to provide some suggestions for the follow-up studies,which focus on solder joint reliability under extreme environments.

Ni_(47)Ti_(44)Nb_9合金丝氩弧焊接头的显微组织和力学行为

系统研究了Ni47Ti44Nb9宽滞后记忆合金带氩弧焊点丝材的显微组织和力学行为.结果表明,焊后适当温度退火处理可显著改善焊点的显微组织,得到细小、均匀的等轴晶,从而提高了焊点的力学性能,室温下表现出较高的拉伸强度和延伸率.焊后未经退火处理的试样,室温拉伸断口均位于焊缝金属的熔合区内,微观断口存在明显的解理台阶,为典型脆性断裂.退火处理后,断口位于近焊缝处的热影响区内,是韧窝型断口,属塑性断裂.韧窝内镶嵌有(Ti,Nb)2Ni相,该相内部及其与基体交界处存在有明显的微裂纹.带焊点丝材经退火处理后在—60℃下变形,最大弯曲可恢复应变约为5%,表明焊点处仍具有一定的记忆效应.

Solder joint geometry of tin-lead alloy and its application in electronic packaging

By employing the minimum energy theorem, the Potential energy controlling equation, which consists of surface energy and gravitational energy for molten meniscus, was investigated. The soder joint geometry of molten tin-lead soder alloy for chip component and thin quad flat package were simulated with finite element method. The simulation results 0f solder joint geometry are coincident well with the experimental results. The solder joint geometry was applied to study the solder joint reliability for chip component RC3216.The thermal cycling tests revealed that the solder joint geometry plays an important ro1e in solder joint reliability.

Influence of Bi Addition on Pure Sn Solder Joints: Interfacial Reaction, Growth Behavior and Thermal Behavior

The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering time and the influence of Bi addition on the thermal behavior of Sn-x Bi solder alloys were investigated. The Cu6 Sn5 IMC could be observed as long as the molten solder contacted with the Cu substrate. However, with the longer welding time such as 60 and 300 s, the Cu3 Sn IMC was formed at the interface between Cu6 Sn5 and Cu substrate. With the increase of soldering time, the thickness of total IMCs increased, meanwhile, the grain size of Cu6 Sn5 also increased. An appropriate amount of Bi element was beneficial for the growth of total IMCs,but excessive Bi（≥ 5 wt%） inhibited the growth of Cu6 Sn5 and Cu3 Sn IMC in Sn-x Bi/Cu microelectronic interconnects. Furthermore, with the Bi contents increasing（Sn-10 Bi solder in this present investigation）, some Bi particles accumulated at the interface between Cu6 Sn5 layer and the solder.

Research on optimal drive joints configuration of a rolling robot of closed five-bow-shaped-bar linkage

The relationship between the stability and the configuration of the driving joint was studied as a measure to improve the stability of robot.The Lagrange dynamic equation of the robot was established.According to the principle of virtual work,the least squares solution of each joint torque was obtained.The relationship between the stability of the robot and the configuration of the driving joint is obtained by the sum of the norms of the joint torque.Finally,numerical simulations verify the correctness of the theory.

Influence of electroless Sn/Bi on Sn/Pb soldered joint strength

The solder joint strength of Pb/Sn soldering aluminum with electroless layer Sn/Bi and Cu was studied. The results show that the joint shear strength of electroless Sn/Bi on aluminum surface is lower than that of Cu. A Pb-riched region with porosity is formed in region of soldering fillet with electroless Sn/Bi. Both the electroless Sn/Bi layer and Pb-riched layer become thicker, which are the reasons why the shear strength of the solder joint with electroless Sn/Bi on aluminum surface is lower than that of electroless Cu, and the higher the thickness of the electroless Sn/Bi layer is, the lower the shear strength of solder joint is.

Hillock Sn whiskers growth behaviors in Sn0.3Ag0.7Cu/Cu solder joints during corrosion

Hillock Sn whiskers in Sn0.3Ag0.7Cu solder are investigated in 20 seconds in corrosive climate(95% methanol and 5% nitric acid),and the growth mechanism of hillock Sn whiskers is studied.The results indicate that hillock Sn whiskers are formed near the interface of Sn0.3Ag0.7Cu/Cu solder joints,and small corrosion pits provide conceive sites for Sn whiskers. Moreover,compressive stress induced by IMC reaction and oxidation for the whisker growth may be suggested as the driving force.

Thermo-mechanical fatigue reliability optimization of PBGA solder joints based on ANN-PSO

Based on a method combined artificial neural network (ANN) with particle swarm optimization (PSO) algorithm, the thermo-mechanical fatigue reliability of plastic ball grid array (PBGA) solder joints was studied. The simulation experiments of accelerated thermal cycling test were performed by ANSYS software. Based on orthogonal array experiments, a back-propagation artificial neural network (BPNN) was used to establish the nonlinear multivariate relationship between thermo-mechanical fatigue reliability and control factors. Then, PSO was applied to obtaining the optimal levels of control factors by using the output of BPNN as the affinity measure. The results show that the control factors, such as print circuit board (PCB) size, PCB thickness, substrate size, substrate thickness, PCB coefficient of thermal expansion (CTE), substrate CTE, silicon die CTE, and solder joint CTE, have a great influence on thermo-mechanical fatigue reliability of PBGA solder joints. The ratio of signal to noise of ANN-PSO method is 51.77 dB and its error is 33.3% less than that of Taguchi method. Moreover, the running time of ANN-PSO method is only 2% of that of the BPNN. These conclusions are verified by the confirmative experiments.

Electrochemical corrosion of Sn-0.75Cu solder joints in NaCl solution

The corrosion behaviors of Sn-0.75Cu solder and Sn-0.75Cu/Cu joint in 3.5% NaCl（mass fraction） solution were studied by potentiodynamic polarization test and leaching measurement.The polarization curves indicated that the corrosion rate of Sn-0.75Cu solder was lower than that of Sn-0.75Cu/Cu joint.The morphology observation and phase composition analysis on the corroded product at each interesting potential suggested that Sn3O（OH）2Cl2 formed on the surface of Sn-0.75Cu solder at active dissolution stage.As the potential increased from active/passive transition stage,all the surface of Sn-0.75Cu solder was covered by the Sn3O（OH）2Cl2 and some pits appeared after the polarization test.Compared to the Sn-0.75Cu solder alloy,much more Sn3O（OH）2Cl2 formed at active dissolution stage and the pits with bigger size were observed after polarization test for the Sn-0.75Cu/Cu solder joints.The leaching test confirmed that the faster electrochemical corrosion rate resulted in the larger amount of Sn released from the Sn-0.75Cu/Cu solder joints.

非抗震设计的异形柱框架剪力墙结构节点承载力计算

按《混凝土异形柱结构技术规程》送审稿要求,对高度为最大限值的非抗震设计异形柱框架剪力墙住宅结构在恒、活及风载作用组合下的梁柱节点承载力进行了核算。结果表明,在整体结构及剪力墙、柱、梁构件均容易满足混凝土结构设计规范和异形柱规程要求的情况下,部分梁柱节点核心区的箍筋配置还是由强度计算决定的,远大于节点配筋构造要求的配置量。

Research on Complexity of Surface Undulating Shapes of Rock Joints

The surface undulating shapes of rock joints have been described qualitatively or experimental quantitatively for a long time. The non determined describing method can not fit quantitative evaluation of mechanical parameters of rock joints in engineering. In this paper, relative amplitude ( R A) is chosen as a quantitative describing index of surface measurement of 1 023 surface undulating curves which conducted by profile curve device(PCD). We discuss the nonuniformity,anisotropy and unhomogeneity of surface undulating shapes of joints. A new method that analyzes the complexity of surface undulating shapes of rock joints directional statistically in various rock joints is also put forward.

Interfacial intermetallic compound growth and shear strength of low-silver SnAgCuBiNi/Cu lead-free solder joints

The growth rule of the interfacial intermetallic compound （IMC） and the degradation of shear strength of Sn-0.SAg-0.5Cu-2.0Bi-0.05Ni （SACBN）/Cu solder joints were investigated in comparison with Sn-3.0Ag-0.5Cu （SAC305）/ Cu solder joints aging at 373, 403, and 438 K. The results show that （Cul-x,Nix）6Sn5 phase forms between the SACBN solder and Cu substrate during soldering. The interracial IMC thickens constantly with the aging time increasing, and the higher the aging temperature, the faster the IMC layer grows. Compared with the SAC305/Cu couple, the SACBN/Cu couple exhibits a lower layer growth coefficient. The activation energies of IMC growth for SACBN/Cu and SAC305/Cu couples are 111.70 and 82.35 kJ/mol, respectively. In general, the shear strength of aged solder joints declines continuously. However, SACBN/Cu solder joints exhibit a better shear strength than SAC305/Cu solder joints.

Mg_(2)Sn-induced whisker growth on the surfaces of Mg/Sn/Mg ultrasonic-assisted soldering joints

In this paper,the phenomena of Mg_(2)Sn-induced Sn whisker growth were explored on the surfaces of Mg/Sn/Mg ultrasonic-assisted soldering joints after aging treatment.The in-situ observation and thermal analysis confirmed that the formation and the corrosion of Mg_(2)Sn nanoparticles were the dominant reason of Sn whisker growth.The Mg_(2)Sn accumulation at the grain boundaries would pin the dislocation slip and affect the continuity of whisker growth,and the boundary angle would thus play a decisive role in the growth shape of Sn whiskers due to the pining effect of Mg_(2)Sn.This study might be conducive to elucidating the growth behavior of Sn whiskers and provide the exploration strategy to further improve the bonding strength of Mg/Sn/Mg ultrasonic-assisted soldering joints.

Drop failure modes of Sn-3.0Ag-0.5Cu solder joints in wafer level chip scale package

To reveal the drop failure modes of the wafer level chip scale packages （WLCSPs） with Sn-3.0Ag-0.5Cu solder joints, board level drop tests were performed according to the JEDEC standard. Six failure modes were identified, i.e., short FR-4 cracks and complete FR-4 cracks at the printing circuit board （PCB） side, split between redistribution layer （RDL） and Cu under bump metallization （UBM）, RDL fracture, bulk cracks and partial bulk and intermetallic compound （IMC） cracks at the chip side. For the outmost solder joints, complete FR-4 cracks tended to occur, due to large deformation of PCB and low strength of FR-4 dielectric layer. The formation of complete FR-4 cracks largely absorbed the impact energy, resulting in the absence of other failure modes. For the inner solder joints, the absorption of impact energy by the short FR-4 cracks was limited, resulting in other failure modes at the chip side.

Joint 2D DOA and Doppler frequency estimation for L-shaped array using compressive sensing

A joint two-dimensional(2D)direction-of-arrival(DOA)and radial Doppler frequency estimation method for the L-shaped array is proposed in this paper based on the compressive sensing(CS)framework.Revised from the conventional CS-based methods where the joint spatial-temporal parameters are characterized in one large scale matrix,three smaller scale matrices with independent azimuth,elevation and Doppler frequency are introduced adopting a separable observation model.Afterwards,the estimation is achieved by L1-norm minimization and the Bayesian CS algorithm.In addition,under the L-shaped array topology,the azimuth and elevation are separated yet coupled to the same radial Doppler frequency.Hence,the pair matching problem is solved with the aid of the radial Doppler frequency.Finally,numerical simulations corroborate the feasibility and validity of the proposed algorithm.

Study on solder joint reliability of ceramic ball grid array component based on design of experiment method

Four process parameters, pad diameter, stencil thickness, ball diameter and stand-off were chosen as four control factors. By using an L25 （5^6 ） orthogonal array the ceramic ball grid array （ CBGA ） solder joints which have 25 different combinations of process parameters were designed. The numerical models of all the 25 CBGA solder joints were developed using the Sugrace Evolver. Utilizing the sugrace coordinate exported from the 25 CBGA solder joints numerical models, the finite element analysis models were set up and the nonlinear finite element analysis of the CBGA solder joints under thermal cycles were pegrormed by ANSYS. The thermal fatigue life of CBGA solder joint was calculated using Coffin-Manson equation. Based on the calculated thermal fatigue life results, the range analysis and the variance analysis were pegrormed. The results show that the fatigue life of CBGA solder joint is affected by the pad diameter, the stencil thickness, the ball diameter and the stand-off in a descending order, the best combination of process parameters results in the longest fatigue life is 0.07 mm stand-off, 0.125 mm stencil thickness of, 0.85 mm ball diameter and 0. 89 mm pad diameter. With 95% confidence the pad diameter has a significant effect on the reliability of CBGA solder joints whereas the stand-off, the stencil thickness and the ball diameter have little effect on the reliability of CBGA solder joints.

An exPerimental study of effect of solder joint geometry on thermal cycle life in SMT

The geometry of solder joint in SMT is one of the important factors whichdetermine the solder joint reliability. In this study, a type of solder joint specimen has beendesigned and is subjected to thermal cycling to failure between -55 ℃ to +125 ℃ with a 36℃/min heating and cooling rate and 10 min temperature holding times. The solder jointgeometry is castellated and controlled with different solder fillet shape and stand off height.A statistical analysis of the scattered thermal cycle lives of solder joints by two parameterWeibull's probability density function has been carried out in this paper. The experimentalresults show that the more reliable solder joint geometry has flat or slight convex solderfillet with a stand off height larger than 0.1 mm. The results may be the recommendedguideline to design optimal solder joint geometry.