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质子辐照作用下浮栅单元的数据翻转及错误退火
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作者 刘晔 郭红霞 +6 位作者 琚安安 张凤祁 潘霄宇 张鸿 顾朝桥 柳奕天 冯亚辉 《物理学报》 SCIE EI CAS CSCD 北大核心 2022年第11期383-389,共7页
本文利用60 MeV质子束流,开展了NAND(not and)flash存储器的质子辐照实验,获取了浮栅单元的单粒子翻转截面,分析了浮栅单元错误的退火规律,研究了质子辐照对浮栅单元的数据保存能力的影响.实验结果表明,浮栅单元单粒子翻转截面随质子能... 本文利用60 MeV质子束流,开展了NAND(not and)flash存储器的质子辐照实验,获取了浮栅单元的单粒子翻转截面,分析了浮栅单元错误的退火规律,研究了质子辐照对浮栅单元的数据保存能力的影响.实验结果表明,浮栅单元单粒子翻转截面随质子能量的升高而增大,随质子注量的升高而减小.浮栅单元错误随着退火时间的推移持续增多,该效应在低能量质子入射时更为明显.经质子辐照后,浮栅单元的数据保存能力有明显的退化.分析认为高能质子通过与靶原子的核反应,间接电离导致浮栅单元发生单粒子翻转,翻转截面与质子注量的相关性是因为浮栅单元单粒子敏感性的差异.质子引起的非电离损伤会在隧穿氧化层形成部分永久性的缺陷损伤,产生可以泄漏浮栅电子的多辅助陷阱导电通道,导致浮栅单元错误增多及数据保存能力退化. 展开更多
关键词 FLASH存储器 /质子辐照 /单粒子翻转 /多陷阱辅助导电通道
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电子/质子综合辐照带通滤光片的性能退化机理研究
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作者 张剑锋 郭云 杨生胜 《真空与低温》 2016年第4期210-213,共4页
随着航天器的寿命从5年增加到8年以上,光学薄膜在空间飞行中经受的带电粒子辐照时间更长,光学薄膜更容易受到损伤,因此对光学薄膜抗辐射性能要求也不断提高。开展了光学薄膜带通滤光片电子/质子综合辐照实验,研究电子/质子综合辐照作用... 随着航天器的寿命从5年增加到8年以上,光学薄膜在空间飞行中经受的带电粒子辐照时间更长,光学薄膜更容易受到损伤,因此对光学薄膜抗辐射性能要求也不断提高。开展了光学薄膜带通滤光片电子/质子综合辐照实验,研究电子/质子综合辐照作用下带通滤光片的性能退化规律,借助于XPS和AFM等表面分析技术对带通滤光片微观分析,研究带通滤光片在电子/质子综合辐照下的退化机理。为带通滤光片空间适应性研究提供基础,同时为带通滤光片工艺设计与可靠性提供技术支撑。 展开更多
关键词 带通滤光片 电子/质子辐照 性能退化
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Proton Irradiation and Thermal Annealing of GaAs Solar Cells
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作者 向贤碧 杜文会 +1 位作者 廖显伯 常秀兰 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第6期710-714,共5页
The investigation on proton irradiation and thermal annealing of AlGaAs/GaAs solar cells has been reported.The energy of the proton irradiation is 325keV and the fluences are ranging from 5×10 10 to 1×1... The investigation on proton irradiation and thermal annealing of AlGaAs/GaAs solar cells has been reported.The energy of the proton irradiation is 325keV and the fluences are ranging from 5×10 10 to 1×10 13 cm -2 .It is demonstrated that the irradiation-induced degradation in the photovoltaic performance of the solar cells exists mainly in the short circuit current and the irradiation damage can be partly recovered by low temperature annealing at 200℃.In addition,it is found that the borosilicate cover glass has an obvious protection effect against the proton irradiation. 展开更多
关键词 proton irradiation thermal annealing solor cell
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Effects of Heavy-ion Beams Irradiation on Survival Rate and Antioxidant Enzymes of Sweet Sorghum Seedlings
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作者 刘智全 谷卫彬 李文建 《Agricultural Science & Technology》 CAS 2012年第11期2257-2260,2268,共5页
[Objective] This study aimed to investigate the effects of heavy-ion beams irradiation on the seed germination potential, survival rate, antioxidant enzyme activi- ties and lipid peroxidation of sweet sorghum. [Method... [Objective] This study aimed to investigate the effects of heavy-ion beams irradiation on the seed germination potential, survival rate, antioxidant enzyme activi- ties and lipid peroxidation of sweet sorghum. [Method] The dry seeds were irradiated by '2(36. heavy ion beams with absorbed doses: 0, 40, 80, 120, 160 and 200 Gy, respectively. Then, the seed germination potential, survival rate, antioxidant enzyme activities and lipid peroxidation of sweet sorghum were measured. [Result] Heavy-ion beams irradiation exhibited different influence on germination potential and survival rates. Germination rate showed a downward trend, but the corresponding survival curve of seedlings was saddle-shaped. The activities of SOD, POD, CAT and ASA- POD changed in different trends as well. The MDA content rose toward increasing irradiation dose, suggesting that high dose of heavy-ion beams irradiation enhanced the damage to membrane of sweet sorghum seedlings. [Conclusion] After being irra- diated, germination potential and survival rates of sweet sorghum were decreased, and antioxidant enzymes activity changed greatly. This study laid the basis for fur- ther work on breeding and improvement of sweet sorghum irradiated by ,^(12)C^(6+) heavy ion beams. 展开更多
关键词 Heavy ion beams IRRADIATION Sweet sorghum Antioxidant enzymes
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Resistance of LEDs Based on AIGalnP Heterostructures to Irradiation by Fast Neutrons
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作者 Gradoboev Alexander V Orlova Ksenia N. Asanov Ivan A 《Journal of Chemistry and Chemical Engineering》 2013年第5期409-413,共5页
The change of light output power of LEDs based on A1GalnP heterostructures with multiple quantum wells (590 nm and 630 nm) under irradiation by fast neutrons depends on the operating current density. It can be disti... The change of light output power of LEDs based on A1GalnP heterostructures with multiple quantum wells (590 nm and 630 nm) under irradiation by fast neutrons depends on the operating current density. It can be distinguished the regions of high, average and low electron injection. Operating current, this corresponds to the position of the boundary between the selected levels of the electron injection, increases with increasing neutron fluence. The final stage of the reducing process of the light output power under irradiation is the regime of low electron injection. The relative change in light output power depends on the operating current (operating current density) and can be described by a fairly simple equation. Established relations predict radiation resistance of LEDs, and it makes the most rational justification of operating modes of light-emitting diodes in terms of radiation resistance. 展开更多
关键词 LEDS heterostructures AIGalnP quantum wells fast neutrons.
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Microstructures of the interlayer in Mo/Si multilayers induced by proton irradiation
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作者 LV Peng WANG XiaoDong +4 位作者 LIU Hai ZHANG ZaiQiang GUAN JinTong CHEN Bo GUAN QingFeng 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2012年第11期2194-2198,共5页
In this work,the microstructure and optical properties of the Mo/Si multilayers mirror for the space extreme-ultraviolet solar telescope before and after 100 keV proton irradiation have been investigated.EUV/soft X-ra... In this work,the microstructure and optical properties of the Mo/Si multilayers mirror for the space extreme-ultraviolet solar telescope before and after 100 keV proton irradiation have been investigated.EUV/soft X-ray reflectometer(EXRR) results showed that,after proton irradiation,the reflectivity of the Mo/Si multilayer decreased from 12.20% to 8.34% and the center wavelength revealed red shift of 0.38 nm,as compared with those before proton irradiation.High-resolution transmission electron microscopy(HRTEM) observations revealed the presence of MoSi 2,Mo 3 Si and Mo 5 Si 3 in Mo-on-Si interlayers before irradiation.The preferred orientation such as MoSi 2 with(101) texture and Mo 5 Si 3 with(310) texture was formed in Mo-on-Si interlayers after proton irradiation,which led to the increase of thickness in the interlayers.It is suggested that the changes of microstructures in Mo/Si multilayers under proton irradiation could cause optical properties degradation. 展开更多
关键词 MULTILAYER MICROSTRUCTURE irradiation damage optical properties
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The effects of proton irradiation on the electrical properties of NbAlO/AlGaN/GaN MIS-HEMT
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作者 BI ZhiWei FENG Qian +5 位作者 ZHANG JinCheng LU Ling MAO Wei GU WenPing MA XiaoHua HAO Yue 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2012年第1期40-43,共4页
AlGaN/GaN metal-insulator-semiconductor high electron-mobility transistors (MIS-HEMTs) with atomic layer deposited (ALD) NbA10 gate dielectric were investigated using 3 MeV proton irradiation at a fluence of 1015 ... AlGaN/GaN metal-insulator-semiconductor high electron-mobility transistors (MIS-HEMTs) with atomic layer deposited (ALD) NbA10 gate dielectric were investigated using 3 MeV proton irradiation at a fluence of 1015 p/crn2. It was found that the proton irradiation damage caused degradation in DC performance and a flatband voltage shift in the capacitance-voltage curve. Gate-drain conductance measurements indicated that new traps were introduced in GaN from the irradiation, and the trap densities increased from 1.18×10^12 cm-2.eV-1 to 1.82×10^12 cm-2.eV-1 in MIS-HEMTs after irradiation. However, these increases in trap densities caused by irradiation in MIS-HEMT are less than those in HEMT, which can be attributed to the protection of the A1GaN surface by the NbA10 dielectric layer. 展开更多
关键词 AIGAN/GAN MIS-HEMT proton irradiation TRAP
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