第8届国际Ⅱ-Ⅵ族化合物会议于1997年8月25日至29日在法国Grenoble举行。参加会议的有来自26个国家的415名代表。会议收到论文摘要501篇,录用311篇。被录用的部分论文将在国际《晶体生长杂志》(Journal of Crystal Growth)的专集上发表...第8届国际Ⅱ-Ⅵ族化合物会议于1997年8月25日至29日在法国Grenoble举行。参加会议的有来自26个国家的415名代表。会议收到论文摘要501篇,录用311篇。被录用的部分论文将在国际《晶体生长杂志》(Journal of Crystal Growth)的专集上发表。会议交流了Ⅱ-Ⅵ化合物(主要为半导体)材料、物理和器件研究领域进展情况,内容涉及半导体蓝绿激光器件,Be-基化合物及其异质结构,激子及其复合体的光学性质,纳米结构(即量子点)和微腔(Microcavity)的光学性质,表面和界面,窄禁带半导体,稀磁半导体,红外和γ射线探测器,掺杂,材料的生长及表征等。展开更多
由中国物理学会发光分会主办,郑州大学与中国科学院长春光学精密机械与物理研究所承办的第19届Ⅱ-Ⅵ族化合物及相关材料国际学术会议(The 19th International Conference onⅡ-ⅥCompounds and Related Materials)于10月27-31日在郑州...由中国物理学会发光分会主办,郑州大学与中国科学院长春光学精密机械与物理研究所承办的第19届Ⅱ-Ⅵ族化合物及相关材料国际学术会议(The 19th International Conference onⅡ-ⅥCompounds and Related Materials)于10月27-31日在郑州成功举行。Ⅱ-Ⅵ族化合物及相关材料国际学术会议每两年一届,涵盖新材料和新器件的设计与研制、材料光电性能的调控与掺杂缺陷的研究、磁性半导体材料和器件、理论与能带结构研究、新型实验技术等专题,是国际Ⅱ-Ⅵ族化合物半导体领域最重要的学术会议之一。展开更多
Various single crystalline IIB-VIA one-dimensional nanostructures have been fabricated using thermal evaporation. Although these nanostructures possess large amount of unpassivated surface, it does not lead to dissoci...Various single crystalline IIB-VIA one-dimensional nanostructures have been fabricated using thermal evaporation. Although these nanostructures possess large amount of unpassivated surface, it does not lead to dissociation of excitons, which fact indicates the high purity and high quality of the electronic structure of these nanostructures.展开更多
The trace impurities in high purity Te were measured by use of VG9000 glow discharge mass spectrometer (GDMS). Results showed that the stability of analytical performance and the accuracy of analytical results can be ...The trace impurities in high purity Te were measured by use of VG9000 glow discharge mass spectrometer (GDMS). Results showed that the stability of analytical performance and the accuracy of analytical results can be assured by means of optimizing the glow discharge conditions and effective eliminating interference. The test results are based on the average value of the three-time tests. The reproducibility and accuracy of the test data indicated that GDMS is a useful tool for elemental analysis of high purity solid samples.展开更多
文摘第8届国际Ⅱ-Ⅵ族化合物会议于1997年8月25日至29日在法国Grenoble举行。参加会议的有来自26个国家的415名代表。会议收到论文摘要501篇,录用311篇。被录用的部分论文将在国际《晶体生长杂志》(Journal of Crystal Growth)的专集上发表。会议交流了Ⅱ-Ⅵ化合物(主要为半导体)材料、物理和器件研究领域进展情况,内容涉及半导体蓝绿激光器件,Be-基化合物及其异质结构,激子及其复合体的光学性质,纳米结构(即量子点)和微腔(Microcavity)的光学性质,表面和界面,窄禁带半导体,稀磁半导体,红外和γ射线探测器,掺杂,材料的生长及表征等。
文摘由中国物理学会发光分会主办,郑州大学与中国科学院长春光学精密机械与物理研究所承办的第19届Ⅱ-Ⅵ族化合物及相关材料国际学术会议(The 19th International Conference onⅡ-ⅥCompounds and Related Materials)于10月27-31日在郑州成功举行。Ⅱ-Ⅵ族化合物及相关材料国际学术会议每两年一届,涵盖新材料和新器件的设计与研制、材料光电性能的调控与掺杂缺陷的研究、磁性半导体材料和器件、理论与能带结构研究、新型实验技术等专题,是国际Ⅱ-Ⅵ族化合物半导体领域最重要的学术会议之一。
文摘Various single crystalline IIB-VIA one-dimensional nanostructures have been fabricated using thermal evaporation. Although these nanostructures possess large amount of unpassivated surface, it does not lead to dissociation of excitons, which fact indicates the high purity and high quality of the electronic structure of these nanostructures.
文摘The trace impurities in high purity Te were measured by use of VG9000 glow discharge mass spectrometer (GDMS). Results showed that the stability of analytical performance and the accuracy of analytical results can be assured by means of optimizing the glow discharge conditions and effective eliminating interference. The test results are based on the average value of the three-time tests. The reproducibility and accuracy of the test data indicated that GDMS is a useful tool for elemental analysis of high purity solid samples.
