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Thermodynamic analysis of growth of ternary Ⅲ-Ⅴ semiconductor materials by molecular-beam epitaxy
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作者 叶志成 舒永春 +5 位作者 曹雪 龚亮 皮彪 姚江宏 邢晓东 许京军 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2011年第1期146-151,共6页
Thermodynamic models for molecular-beam epitaxy(MBE) growth of ternary Ⅲ-Ⅴ semiconductor materials are proposed.These models are in agreement with our experimental materials InGaP/GaAs and InGaAs/InP,and reported ... Thermodynamic models for molecular-beam epitaxy(MBE) growth of ternary Ⅲ-Ⅴ semiconductor materials are proposed.These models are in agreement with our experimental materials InGaP/GaAs and InGaAs/InP,and reported GaAsP/GaAs and InAsP/InP in thermodynamic growth.The lattice strain energy △G and thermal decomposition sensitive to growth temperature are demonstrated in the models simultaneously.△G is the function of the alloy composition,which is affected by flux ratio and growth temperature directly.The calculation results reveal that flux ratio and growth temperature mainly influence the growth process.Thermodynamic model of quaternary InGaAsP/GaAs semiconductor material is discussed also. 展开更多
关键词 semiconductor materials - compounds GROWTH THERMODYNAMICS
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激光诱导液相电极腐蚀新方法 被引量:2
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作者 陈镇龙 叶玉堂 +4 位作者 刘霖 范超 田骁 吴云峰 王昱琳 《光电工程》 EI CAS CSCD 北大核心 2006年第12期136-140,共5页
提出了一种激光诱导液相腐蚀新方法—电极腐蚀法。电极腐蚀法是指进行激光化学液相腐蚀时,在腐蚀溶液中添加电极,以吸引反应中间离子脱离基片表面,实现腐蚀的持续稳定进行。理论分析和实验结果都表明,电极腐蚀法可以有效地加快激光腐蚀... 提出了一种激光诱导液相腐蚀新方法—电极腐蚀法。电极腐蚀法是指进行激光化学液相腐蚀时,在腐蚀溶液中添加电极,以吸引反应中间离子脱离基片表面,实现腐蚀的持续稳定进行。理论分析和实验结果都表明,电极腐蚀法可以有效地加快激光腐蚀的进程;吸附在基片表面的离子在电极作用下,快速迁移出基片表面,保证了基片表面腐蚀溶液构成的稳定,进而得到更加均匀的腐蚀表面;利用电流随腐蚀速率变化而变化的特点,使腐蚀速率和深度的直接监控转变为对腐蚀电流的间接控制,简化腐蚀控制方法。基于以上优点,电极腐蚀法可以克服现有激光腐蚀方法的诸多弊端,改善激光腐蚀性能,在特殊结构光电器件的制作和半导体的微细加工中具有广阔的应用前景。 展开更多
关键词 激光诱导腐蚀 光电子 ⅲ—ⅴ族半导体
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Implant Compositional Disordering on InGaAs/InP MQW Structures
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作者 ZHAO Jie LIU Baojun +2 位作者 WANG Yufang WANG Yuongchen Thompson D A(Tianjin Normal University, Tianjin 300074, CHN) 《Semiconductor Photonics and Technology》 CAS 1996年第1期42-48,共7页
Some new results of implant disordering on InP based MQW structures by implanted compositional disordering are presented. The energy shift of PL peak depends on ion species, ion dose, annealing conditions and target t... Some new results of implant disordering on InP based MQW structures by implanted compositional disordering are presented. The energy shift of PL peak depends on ion species, ion dose, annealing conditions and target temperature. The results indicate that the nonactive ions such as F+ and Ne+ are the best candidates for IICD, the ion dose which caused biggest blue shift is around 1 × 10 14 cm-2 for room temperature implantation and 5 × 10 14 cm-2 for an elevated implanted temperature of 200 ℃ and the optimum annealing condition is approximately 750 ℃ for 30 s. AES and TEM characterization suggests that ion bombardment by nonelectrically active ions such as F+, Ne+ induced same amount of layer interdiffusion which results in the band gap blue shift due to the compositional changes. 展开更多
关键词 Quantum Wells - Semiconductors MBE Ion Implantation
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InAs(001)表面脱氧动力学分析
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作者 魏文喆 郭祥 +5 位作者 刘珂 王一 罗子江 周清 王继红 丁召 《物理学报》 SCIE EI CAS CSCD 北大核心 2013年第22期351-357,共7页
利用反射式高能电子衍射(RHEED)实时监控对InAs衬底进行两步完全脱氧的过程,对比了有低(高)砷等效束流压强保护下采用两步法对InAs衬底缓慢长时间的高温脱氧过程.InAs衬底两步完全脱氧法的第一步为传统的缓慢升温脱氧方法,第二步为高温I... 利用反射式高能电子衍射(RHEED)实时监控对InAs衬底进行两步完全脱氧的过程,对比了有低(高)砷等效束流压强保护下采用两步法对InAs衬底缓慢长时间的高温脱氧过程.InAs衬底两步完全脱氧法的第一步为传统的缓慢升温脱氧方法,第二步为高温In束流辅助脱氧方法.衬底高温脱氧的RHEED衍射图样说明了高温In束流辅助脱氧最终完全清除传统的缓慢升温法无法去掉的残留氧化物,通过脱氧完成同质外延生长后的扫描隧道显微镜图像,说明高砷等效束流压强保护下的脱氧方法是可行的;分析了高温In束流能完全清除衬底表面残余In氧化物的原理. 展开更多
关键词 热分解 ⅲ—ⅴ族半导体 反射式高能电子衍射
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