To alleviate the amount of work involved in constructing a domain ontology, starting with the base of an existing terminological-rich thesaurus is better than starting from scratch. With a case study of reengineering ...To alleviate the amount of work involved in constructing a domain ontology, starting with the base of an existing terminological-rich thesaurus is better than starting from scratch. With a case study of reengineering the Defense Science and Technology Thesaurus into a prototype military aircraft ontology, a four-phase thesaurus-based methodology is introduced and investigated, which consists of identifying the application purpose, overall design, designing in detail and evaluation. Designing in detail is the core step, converting the terms and semantic relationships of the thesaurus into an ontology and supplementing richer semantic relationships. The resulting prototype ontology includes 87 concepts and 34 relationships, and can be extended and scaled up to a full-fledged domain ontology in the future. Eight universal genres of relationships of this ontology are preliminarily summarized and analyzed, including equivalent relationships, approximate relationships, generic/abstract relationships, part/whole relationships, cause/effect relationships, entity/location relationships etc., and the normalization of semantic relationships is critical to the merging and reusing of follow-up multiple ontologies.展开更多
This paper describes the foundation underlying the device physics and theory of the semiconductor field effect transistor which is applicable to any devices with two carrier species in an electric field. The importanc...This paper describes the foundation underlying the device physics and theory of the semiconductor field effect transistor which is applicable to any devices with two carrier species in an electric field. The importance of the boundary conditions on the device current-voltage characteristics is discussed. An illustration is given of the transfer DCIV characteristics computed for two boundary conditions,one on electrical potential,giving much higher drift-limited parabolic current through the intrinsic transistor, and the other on the electrochemical potentials, giving much lower injection-over-thebarrier diffusion-limited current with ideal 60mV per decade exponential subthreshold roll-off, simulating electron and hole contacts. The two-MOS-gates on thin pure-body silicon field-effect transistor is used as examples展开更多
The hydrolysis process of Ru(III) complex (HL)[trans-RuC14L(dmso-S)] (L=l-methyl-l,2,4- triazole and dmso-S=S-dimethyl sulfoxide) (1), a potential antitumor complex similar to the well-known antitumor agent ...The hydrolysis process of Ru(III) complex (HL)[trans-RuC14L(dmso-S)] (L=l-methyl-l,2,4- triazole and dmso-S=S-dimethyl sulfoxide) (1), a potential antitumor complex similar to the well-known antitumor agent (Him)[trans-RuC14 (dmso-S)(im)] (NAMI-A, im=imidazole), was investigated using density functional theory combined with the conductor-like polarizable continuum model approach. Tile structural characteristics and the detailed energy profiles for the hydrolysis processes of this complex were obtained. For the first hydrolysis step, complex 1 has slightly higher barrier energies than the reported anticancer drug NAMI-A, and the result is in accordance with the experimental evidence indicating larger half-life for complex 1. For the second hydrolysis step, the formation of cis-diaqua species is thermodynamic preferred to that of trans isomers. In addition, on the basis of the analysis of electronic characteristics of species in the hydrolysis process, the trend in nucleophilic attack abilities of hydrolysis products by pertinent biomolecules is revealed and predicted.展开更多
This paper describes the short channel theory of the bipolar field-effect transistor (BiFET) by partitioning the transistor into two sections,the source and drain sections,each can operate as the electron or hole em...This paper describes the short channel theory of the bipolar field-effect transistor (BiFET) by partitioning the transistor into two sections,the source and drain sections,each can operate as the electron or hole emitter or collector under specific combinations of applied terminal voltages. Analytical solution is obtained in the source and drain sections by separating the two-dimensional trap-free Shockley Equations into two one-dimensional equations parametrically coupled via the surface-electric-potential and by using electron current continuity and hole current continuity at the boundary between the emitter and collector sections. Total and electron-hole-channel components of the output and transfer currents and conductances, and the electrical lengths of the two sections are computed and presented in graphs as a function of the D. C. terminal voltages for the model transistor with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin pure-silicon base over practical ranges of thicknesses of the silicon base and gate oxide. Deviations of the long physical channel currents and conductances from those of the short electrical channels are reported.展开更多
Based on the orthodox theory,a model of a single electron transistor (SET) of metallic tunneling junctions is built using the master equation method. Several parameters of the device, such as capacitance, resistance...Based on the orthodox theory,a model of a single electron transistor (SET) of metallic tunneling junctions is built using the master equation method. Several parameters of the device, such as capacitance, resistance and temperature,are input into the model and thus the I-V curves are attained. These curves are consistent with those from other experiments; therefore, the model is verified. However, there still exists a difference between simulated results and experimental results,mainly comes from the stationary case of the master equation. In other words, precision of simulated results would be increased if the transient case of the master equation is considered. Moreover, the current increases exponentially at higher drain voltages, which is due to the fact that the barrier suppression is caused by the image charge potential.展开更多
This paper describes the bipolar field-effect transistor (BiFET) and its theory. Analytical solution is ob- tained from partitioning the two-dimensional transistor into two one-dimensional transistors. The analysis ...This paper describes the bipolar field-effect transistor (BiFET) and its theory. Analytical solution is ob- tained from partitioning the two-dimensional transistor into two one-dimensional transistors. The analysis employs the parametric surface-electric-potential and the electrochemical (quasi-Fermi) potential-gradient driving force to compute the current. Output and transfer D. C. current and conductance versus voltage are presented over practi- cal ranges of terminal D. C. voltages and device parameters. Electron and hole surface channel currents are pres- ent simultaneously, a new feature which could provide circuit functions in one physical transistor such as the CMOS inverter and SRAM memory.展开更多
Based on the theory of thematic complexity, a contrastive analysis on 2 sections selected from research articles-method and discussion, was conducted. The differences and similarities between the 2 sections in simple ...Based on the theory of thematic complexity, a contrastive analysis on 2 sections selected from research articles-method and discussion, was conducted. The differences and similarities between the 2 sections in simple theme, multiple theme, textual theme, interpersonal theme, topical theme and thematic progression were analyzed and concluded. The author believes that the causes of the differences and similarities are the different genre features of the 2 sections and the academic features of the materials selected.展开更多
The previous report (XI) gave the electrochemical-potential theory of the Bipolar Field-Effect Transistors. This report (XII) gives the drift-diffusion theory. Both treat 1-gate and 2-gate, pure-base and impure-ba...The previous report (XI) gave the electrochemical-potential theory of the Bipolar Field-Effect Transistors. This report (XII) gives the drift-diffusion theory. Both treat 1-gate and 2-gate, pure-base and impure-base, and thin and thick base. Both utilize the surface and bulk potentials as the parametric variables to couple the voltage and current equations. In the present drift-diffusion theory, the very many current terms are identified by their mobility multiplier for the components of drift current,and the diffusivity multiplier for the components of the diffusion current. Complete analytical driftdiffusion equations are presented to give the DC current-voltage characteristics of four common MOS transistor structures. The drift current consists of four terms: 1-D (One-Dimensional) bulk charge drift term, 1-D carrier space-charge drift term,l-D Ex^2 (transverse electric field) drift term,2-D drift term. The diffusion current consists of three terms: 1-D bulk charge diffusion term,l-D carrier space-charge diffusion term,and 2-D diffusion term. The 1-D Ex^2 drift term was missed by all the existing transistor theories, and contributes significantly, as much as 25 % of the total current when the base layer is nearly pure. The 2-D terms come from longitudinal gradient of the longitudinal electric field,which scales as the square of the Debye to Channel length ratio, at 25nm channel length with nearly pure base, (LD/L)^2 = 10^6 but with impurity concentration of 10^18cm^-3 , (LD/L)^2 = 10^-2 .展开更多
This paper reports the intrinsic-structure DC characteristics computed from the analytical electrochemical current theory of the bipolar field-effect transistor (BiFET) with two identical MOS gates on nanometer-thic...This paper reports the intrinsic-structure DC characteristics computed from the analytical electrochemical current theory of the bipolar field-effect transistor (BiFET) with two identical MOS gates on nanometer-thick pure-base of silicon with no generation-recombination-trapping. Numerical solutions are rapidly obtained for the three potential variables,electrostatic and electron and hole electrochemical potentials,to give the electron and hole surface and volume channel currents,using our cross-link two-route or zig-zag one-route recursive iteration algorithms. Boundary conditions on the three potentials dominantly affect the intrinsic-structure DC characteristics,illustrated by examples covering 20-decades of current (10-22 to 10-2 A/Square at 400cm^2/(V · s) mobility for 1.5nm gate-oxide, and 30nm-thick pure-base). Aside from the domination of carrier space-charge-limited drift current in the strong surface channels,observed in the theory is also the classical drift current saturation due to physical pinch-off of an impure-base volume channel depicted by the 1952 Shockley junction-gate field-effect transistor theory,and its extension to complete cut-off of the pure-base volume channel,due to vanishing carrier screening by the few electron and hole carriers in the pure-base,with Debye length (25mm) much larger than device dimension (25nm).展开更多
This paper gives the short channel analytical theory of the bipolar field-effect transistor (BiFET) with the drift and diffusion currents separately computed in the analytical theory. As in the last-month paper whic...This paper gives the short channel analytical theory of the bipolar field-effect transistor (BiFET) with the drift and diffusion currents separately computed in the analytical theory. As in the last-month paper which represented the drift and diffusion current by the single electrochemical (potential-gradient) current, the two-dimensional transistor is partitioned into two sections, the source and drain sections, each can operate as the electron or hole emitter or collector under specific combinations of applied terminal voltages. Analytical solution is then obtained in the source and drain sections by separating the two-dimensional trap-free Shockley Equations into two one-dimensional equations parametrically coupled via the surface-electric-potential and by using electron current continuity and hole current continuity at the boundary between the emitter and collector sections. Total and the drift and diffusion components of the electron-channel and hole-channel currents and output and transfer conductances, and the electrical lengths of the two sections are computed and presented in graphs as a function of the D. C. terminal voltages for the model transistor with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin pure-silicon base over practical ranges of thicknesses of the silicon base and gate oxide. Deviations of the two-section short-channel theory from the one-section long-channel theory are described.展开更多
The field-effect transistor is inherently bipolar, having simultaneously electron and hole surface and volume channels and currents. The channels and currents are controlled by one or more externally applied transvers...The field-effect transistor is inherently bipolar, having simultaneously electron and hole surface and volume channels and currents. The channels and currents are controlled by one or more externally applied transverse electric fields. It has been known as the unipolar field-effect transistor for 55-years since Shockley's 1952 invention,because the electron-current theory inevitably neglected the hole current from over-specified internal and boundary conditions, such as the electrical neutrality and the constant hole-electrochemical-potential, resulting in erroneous solutions of the internal and terminal electrical characteristics from the electron channel current alone, which are in gross error when the neglected hole current becomes comparable to the electron current, both in subthreshold and strong inversion. This report presents the general theory, that includes both electron and hole channels and currents. The rectangular ( x, y, z) parallelepiped transistors,uniform in the width direction (z-axis),with one or two MOS gates on thin and thick,and pure and impure base, are used to illustrate the two-dimensional effects and the correct internal and boundary conditions for the electric and the electron and hole electrochemical potentials. Complete analytical equations of the DC current-voltage characteristics of four common MOS transistor structures are derived without over-specification: the 1-gate on semi-infinite-thick impure-base (the traditional bulk transistor), the 1-gate on thin impure-silicon layer over oxide-insulated silicon bulk (SOI) ,the 1-gate on thin impure-silicon layer deposited on insulating glass (SOI TFT), and the 2-gates on thin pure-base (FinFETs).展开更多
This paper describes the drift-diffusion theory of the bipolar field-effect transistor (BiFET) with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin-pure-base. Analytical solution is obt...This paper describes the drift-diffusion theory of the bipolar field-effect transistor (BiFET) with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin-pure-base. Analytical solution is obtained by partitioning the two-dimensional transistor into two one-dimensional problems coupled by the parametric sur- face-electric-potential. Total and component output and transfer currents and conductances versus D. C. voltages from the drift-diffusion theory, and their deviations from the electrochemical (quasi-Fermi) potential-gradient theory,are presented over practical ranges of thicknesses of the silicon base and gate oxide. A substantial contri- bution from the longitudinal gradient of the square of the transverse electric field is shown.展开更多
In order to study the failure mechanism of backfill and the reasonable matches between backfill and rock mass, and to achieve the object of safe and efficient mining in metal mine, four types of backfills were tested ...In order to study the failure mechanism of backfill and the reasonable matches between backfill and rock mass, and to achieve the object of safe and efficient mining in metal mine, four types of backfills were tested under uniaxial compression loading, with cement?tailing ratios of 0.250:1, 0.125:1, 0.100:1 and 0.083:1, respectively. With the help of the stress?strain curves, the deformation and failure characteristics of different backfills with differing cement?tailing ratios were analyzed. Based on the experimental results, the damage constitutive equations of cemented backfills with four cement?tailing ratios were proposed on the basis of damage mechanics. Moreover, comparative analysis of constitutive model and experimental results were made to verify the reliability of the damage model. In addition, an energy model using catastrophe theory to obtain the instability criteria of system was established to study the interaction between backfill and rock mass, and then the system instability criterion was deduced. The results show that there are different damage characteristics for different backfills, backfills with lower cement?tailing ratio tend to have a lower damage value when stress reaches peak value, and damage more rapidly and more obviously in failure process after peak value of stress; the stiffness and elastic modulus of rock mass with lower strength are more likely to lead to system instability. The results of this work provide a scientific basis for the rational strength design of backfill mine.展开更多
文摘To alleviate the amount of work involved in constructing a domain ontology, starting with the base of an existing terminological-rich thesaurus is better than starting from scratch. With a case study of reengineering the Defense Science and Technology Thesaurus into a prototype military aircraft ontology, a four-phase thesaurus-based methodology is introduced and investigated, which consists of identifying the application purpose, overall design, designing in detail and evaluation. Designing in detail is the core step, converting the terms and semantic relationships of the thesaurus into an ontology and supplementing richer semantic relationships. The resulting prototype ontology includes 87 concepts and 34 relationships, and can be extended and scaled up to a full-fledged domain ontology in the future. Eight universal genres of relationships of this ontology are preliminarily summarized and analyzed, including equivalent relationships, approximate relationships, generic/abstract relationships, part/whole relationships, cause/effect relationships, entity/location relationships etc., and the normalization of semantic relationships is critical to the merging and reusing of follow-up multiple ontologies.
文摘This paper describes the foundation underlying the device physics and theory of the semiconductor field effect transistor which is applicable to any devices with two carrier species in an electric field. The importance of the boundary conditions on the device current-voltage characteristics is discussed. An illustration is given of the transfer DCIV characteristics computed for two boundary conditions,one on electrical potential,giving much higher drift-limited parabolic current through the intrinsic transistor, and the other on the electrochemical potentials, giving much lower injection-over-thebarrier diffusion-limited current with ideal 60mV per decade exponential subthreshold roll-off, simulating electron and hole contacts. The two-MOS-gates on thin pure-body silicon field-effect transistor is used as examples
基金This work was supported by the National Natural Science Foundation of China (No.20903027), the Natural Science Foundation of Guangdong Province (No.9452402301001941), and the Doctor Startup Fund of Guangdong Medical College (No.XB0802 and No.XB0804).
文摘The hydrolysis process of Ru(III) complex (HL)[trans-RuC14L(dmso-S)] (L=l-methyl-l,2,4- triazole and dmso-S=S-dimethyl sulfoxide) (1), a potential antitumor complex similar to the well-known antitumor agent (Him)[trans-RuC14 (dmso-S)(im)] (NAMI-A, im=imidazole), was investigated using density functional theory combined with the conductor-like polarizable continuum model approach. Tile structural characteristics and the detailed energy profiles for the hydrolysis processes of this complex were obtained. For the first hydrolysis step, complex 1 has slightly higher barrier energies than the reported anticancer drug NAMI-A, and the result is in accordance with the experimental evidence indicating larger half-life for complex 1. For the second hydrolysis step, the formation of cis-diaqua species is thermodynamic preferred to that of trans isomers. In addition, on the basis of the analysis of electronic characteristics of species in the hydrolysis process, the trend in nucleophilic attack abilities of hydrolysis products by pertinent biomolecules is revealed and predicted.
文摘This paper describes the short channel theory of the bipolar field-effect transistor (BiFET) by partitioning the transistor into two sections,the source and drain sections,each can operate as the electron or hole emitter or collector under specific combinations of applied terminal voltages. Analytical solution is obtained in the source and drain sections by separating the two-dimensional trap-free Shockley Equations into two one-dimensional equations parametrically coupled via the surface-electric-potential and by using electron current continuity and hole current continuity at the boundary between the emitter and collector sections. Total and electron-hole-channel components of the output and transfer currents and conductances, and the electrical lengths of the two sections are computed and presented in graphs as a function of the D. C. terminal voltages for the model transistor with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin pure-silicon base over practical ranges of thicknesses of the silicon base and gate oxide. Deviations of the long physical channel currents and conductances from those of the short electrical channels are reported.
文摘Based on the orthodox theory,a model of a single electron transistor (SET) of metallic tunneling junctions is built using the master equation method. Several parameters of the device, such as capacitance, resistance and temperature,are input into the model and thus the I-V curves are attained. These curves are consistent with those from other experiments; therefore, the model is verified. However, there still exists a difference between simulated results and experimental results,mainly comes from the stationary case of the master equation. In other words, precision of simulated results would be increased if the transient case of the master equation is considered. Moreover, the current increases exponentially at higher drain voltages, which is due to the fact that the barrier suppression is caused by the image charge potential.
文摘This paper describes the bipolar field-effect transistor (BiFET) and its theory. Analytical solution is ob- tained from partitioning the two-dimensional transistor into two one-dimensional transistors. The analysis employs the parametric surface-electric-potential and the electrochemical (quasi-Fermi) potential-gradient driving force to compute the current. Output and transfer D. C. current and conductance versus voltage are presented over practi- cal ranges of terminal D. C. voltages and device parameters. Electron and hole surface channel currents are pres- ent simultaneously, a new feature which could provide circuit functions in one physical transistor such as the CMOS inverter and SRAM memory.
文摘Based on the theory of thematic complexity, a contrastive analysis on 2 sections selected from research articles-method and discussion, was conducted. The differences and similarities between the 2 sections in simple theme, multiple theme, textual theme, interpersonal theme, topical theme and thematic progression were analyzed and concluded. The author believes that the causes of the differences and similarities are the different genre features of the 2 sections and the academic features of the materials selected.
文摘The previous report (XI) gave the electrochemical-potential theory of the Bipolar Field-Effect Transistors. This report (XII) gives the drift-diffusion theory. Both treat 1-gate and 2-gate, pure-base and impure-base, and thin and thick base. Both utilize the surface and bulk potentials as the parametric variables to couple the voltage and current equations. In the present drift-diffusion theory, the very many current terms are identified by their mobility multiplier for the components of drift current,and the diffusivity multiplier for the components of the diffusion current. Complete analytical driftdiffusion equations are presented to give the DC current-voltage characteristics of four common MOS transistor structures. The drift current consists of four terms: 1-D (One-Dimensional) bulk charge drift term, 1-D carrier space-charge drift term,l-D Ex^2 (transverse electric field) drift term,2-D drift term. The diffusion current consists of three terms: 1-D bulk charge diffusion term,l-D carrier space-charge diffusion term,and 2-D diffusion term. The 1-D Ex^2 drift term was missed by all the existing transistor theories, and contributes significantly, as much as 25 % of the total current when the base layer is nearly pure. The 2-D terms come from longitudinal gradient of the longitudinal electric field,which scales as the square of the Debye to Channel length ratio, at 25nm channel length with nearly pure base, (LD/L)^2 = 10^6 but with impurity concentration of 10^18cm^-3 , (LD/L)^2 = 10^-2 .
文摘This paper reports the intrinsic-structure DC characteristics computed from the analytical electrochemical current theory of the bipolar field-effect transistor (BiFET) with two identical MOS gates on nanometer-thick pure-base of silicon with no generation-recombination-trapping. Numerical solutions are rapidly obtained for the three potential variables,electrostatic and electron and hole electrochemical potentials,to give the electron and hole surface and volume channel currents,using our cross-link two-route or zig-zag one-route recursive iteration algorithms. Boundary conditions on the three potentials dominantly affect the intrinsic-structure DC characteristics,illustrated by examples covering 20-decades of current (10-22 to 10-2 A/Square at 400cm^2/(V · s) mobility for 1.5nm gate-oxide, and 30nm-thick pure-base). Aside from the domination of carrier space-charge-limited drift current in the strong surface channels,observed in the theory is also the classical drift current saturation due to physical pinch-off of an impure-base volume channel depicted by the 1952 Shockley junction-gate field-effect transistor theory,and its extension to complete cut-off of the pure-base volume channel,due to vanishing carrier screening by the few electron and hole carriers in the pure-base,with Debye length (25mm) much larger than device dimension (25nm).
文摘This paper gives the short channel analytical theory of the bipolar field-effect transistor (BiFET) with the drift and diffusion currents separately computed in the analytical theory. As in the last-month paper which represented the drift and diffusion current by the single electrochemical (potential-gradient) current, the two-dimensional transistor is partitioned into two sections, the source and drain sections, each can operate as the electron or hole emitter or collector under specific combinations of applied terminal voltages. Analytical solution is then obtained in the source and drain sections by separating the two-dimensional trap-free Shockley Equations into two one-dimensional equations parametrically coupled via the surface-electric-potential and by using electron current continuity and hole current continuity at the boundary between the emitter and collector sections. Total and the drift and diffusion components of the electron-channel and hole-channel currents and output and transfer conductances, and the electrical lengths of the two sections are computed and presented in graphs as a function of the D. C. terminal voltages for the model transistor with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin pure-silicon base over practical ranges of thicknesses of the silicon base and gate oxide. Deviations of the two-section short-channel theory from the one-section long-channel theory are described.
文摘The field-effect transistor is inherently bipolar, having simultaneously electron and hole surface and volume channels and currents. The channels and currents are controlled by one or more externally applied transverse electric fields. It has been known as the unipolar field-effect transistor for 55-years since Shockley's 1952 invention,because the electron-current theory inevitably neglected the hole current from over-specified internal and boundary conditions, such as the electrical neutrality and the constant hole-electrochemical-potential, resulting in erroneous solutions of the internal and terminal electrical characteristics from the electron channel current alone, which are in gross error when the neglected hole current becomes comparable to the electron current, both in subthreshold and strong inversion. This report presents the general theory, that includes both electron and hole channels and currents. The rectangular ( x, y, z) parallelepiped transistors,uniform in the width direction (z-axis),with one or two MOS gates on thin and thick,and pure and impure base, are used to illustrate the two-dimensional effects and the correct internal and boundary conditions for the electric and the electron and hole electrochemical potentials. Complete analytical equations of the DC current-voltage characteristics of four common MOS transistor structures are derived without over-specification: the 1-gate on semi-infinite-thick impure-base (the traditional bulk transistor), the 1-gate on thin impure-silicon layer over oxide-insulated silicon bulk (SOI) ,the 1-gate on thin impure-silicon layer deposited on insulating glass (SOI TFT), and the 2-gates on thin pure-base (FinFETs).
文摘This paper describes the drift-diffusion theory of the bipolar field-effect transistor (BiFET) with two identical and connected metal-oxide-silicon-gates (MOS-gates) on a thin-pure-base. Analytical solution is obtained by partitioning the two-dimensional transistor into two one-dimensional problems coupled by the parametric sur- face-electric-potential. Total and component output and transfer currents and conductances versus D. C. voltages from the drift-diffusion theory, and their deviations from the electrochemical (quasi-Fermi) potential-gradient theory,are presented over practical ranges of thicknesses of the silicon base and gate oxide. A substantial contri- bution from the longitudinal gradient of the square of the transverse electric field is shown.
基金Projects(2013BAB02B05,2012BAB08B01)supported by the National Science and Technology Support Program of ChinaProject(2013JSJJ029)supported by the Teacher Foundation of Central South University,ChinaProject(51074177)supported by the Joint Funding of National Natural Science Foundation and Shanghai Baosteel Group Corporation,China
文摘In order to study the failure mechanism of backfill and the reasonable matches between backfill and rock mass, and to achieve the object of safe and efficient mining in metal mine, four types of backfills were tested under uniaxial compression loading, with cement?tailing ratios of 0.250:1, 0.125:1, 0.100:1 and 0.083:1, respectively. With the help of the stress?strain curves, the deformation and failure characteristics of different backfills with differing cement?tailing ratios were analyzed. Based on the experimental results, the damage constitutive equations of cemented backfills with four cement?tailing ratios were proposed on the basis of damage mechanics. Moreover, comparative analysis of constitutive model and experimental results were made to verify the reliability of the damage model. In addition, an energy model using catastrophe theory to obtain the instability criteria of system was established to study the interaction between backfill and rock mass, and then the system instability criterion was deduced. The results show that there are different damage characteristics for different backfills, backfills with lower cement?tailing ratio tend to have a lower damage value when stress reaches peak value, and damage more rapidly and more obviously in failure process after peak value of stress; the stiffness and elastic modulus of rock mass with lower strength are more likely to lead to system instability. The results of this work provide a scientific basis for the rational strength design of backfill mine.