The form invariance of Routh equations in holonomic systems is studied. The definition and criterion for the form invariance under the infinitesimal transformations are given. The relation of the form invariance with ...The form invariance of Routh equations in holonomic systems is studied. The definition and criterion for the form invariance under the infinitesimal transformations are given. The relation of the form invariance with the Noether symmetry and the Lie symmetry is discussed.展开更多
A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition...A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition between random fluctuation growth and applied electric strength enhanced deterministic growth. The necessary and sufficient conditions resulting in fractal behaviour in dielectric ageing are found.展开更多
基于推广的微分方程不变原理,设计了一个简单的自适应反馈控制器,并证明了在这一控制器的作用下,可以识别出非自治混沌系统中的未知参数.这一识别方法简单便于工程实现,且具有鲁棒性.对于Duffing-Van der pol系统和Duffing系统的数值模...基于推广的微分方程不变原理,设计了一个简单的自适应反馈控制器,并证明了在这一控制器的作用下,可以识别出非自治混沌系统中的未知参数.这一识别方法简单便于工程实现,且具有鲁棒性.对于Duffing-Van der pol系统和Duffing系统的数值模拟验证了我们的结论.展开更多
文摘The form invariance of Routh equations in holonomic systems is studied. The definition and criterion for the form invariance under the infinitesimal transformations are given. The relation of the form invariance with the Noether symmetry and the Lie symmetry is discussed.
文摘A stochastic model of conducting crack propagation is presented to provide a conceptual framework dedicated to the study of the formation of fractal structure of dielectric ageing patterns as a result of a competition between random fluctuation growth and applied electric strength enhanced deterministic growth. The necessary and sufficient conditions resulting in fractal behaviour in dielectric ageing are found.