The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solut...The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials.This method is tested by experimental SAXS data,which were measured at 25℃,of organo-modified mesoporous silica prepared by condensation of tetraethoxysiland(TEOS) and methyltriethoxysilane(MTES) using non-ionic neutral surfactant as template under neutral condition.展开更多
A small-angle x-ray scattering(SAXS)technique using synchrotron radiation as the x-ray source has been employed to characterize the microstructure of mesoporous silica prepared by one-pot template-directed synthesis m...A small-angle x-ray scattering(SAXS)technique using synchrotron radiation as the x-ray source has been employed to characterize the microstructure of mesoporous silica prepared by one-pot template-directed synthesis methodology.The scattering of pure silica agreed with Porod’s law.the scattering of organomodified mesoporous silica showed a negative deviation from Porod’s law,suggesting that an interfacial layer exists between the pores and silica matrix.It was the organic groups comprising the interface,as shown by ^29Si cross-polarization magic-angle spinning nuclear magnetic resonance imaging (^29Si cp MAS/NMR) and Fourier transform infrared spectroscopy(FTIR),that caused this negative deviation of SAXS intensity from Porod’s law,and the average thichness of the interfacial layer could be deduced from this negative deviation.Copyright 2001 john Wiley and Sons,Ltd.展开更多
Small angle X-ray scattering experiments have been performed to study the microstructure of messoporous silica meterials prepared by condensation of tetraethylorthosilicate using nonionic alkylpolyethyleneoxide(AEO9) ...Small angle X-ray scattering experiments have been performed to study the microstructure of messoporous silica meterials prepared by condensation of tetraethylorthosilicate using nonionic alkylpolyethyleneoxide(AEO9) and ionic cetyltrimethylammonium bromide (CTAB) surfactant as templates.It is the pores within the nanometre range that produce the main cattering.The scattering of the pure silica systems obey Porod’s law.This may be because the templates produce some additional scattering background and then make the scattering of pores distorted.The results show that the full removal of templates from the pores of the materials by Soxhlet extraction is very easy for AEO9,but it is difficult for CTAB.The positive deviation correction is also perfromed.展开更多
Small X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepard by condensation of tetraethylorthosilicate(TEOS) using...Small X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepard by condensation of tetraethylorthosilicate(TEOS) using non-ionic alkylpolyethyleneoxide(AEO9) surfactant as templates.The results agreed with that of high-resolution TEM(HRTEM) measurement.展开更多
文摘The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials.This method is tested by experimental SAXS data,which were measured at 25℃,of organo-modified mesoporous silica prepared by condensation of tetraethoxysiland(TEOS) and methyltriethoxysilane(MTES) using non-ionic neutral surfactant as template under neutral condition.
文摘A small-angle x-ray scattering(SAXS)technique using synchrotron radiation as the x-ray source has been employed to characterize the microstructure of mesoporous silica prepared by one-pot template-directed synthesis methodology.The scattering of pure silica agreed with Porod’s law.the scattering of organomodified mesoporous silica showed a negative deviation from Porod’s law,suggesting that an interfacial layer exists between the pores and silica matrix.It was the organic groups comprising the interface,as shown by ^29Si cross-polarization magic-angle spinning nuclear magnetic resonance imaging (^29Si cp MAS/NMR) and Fourier transform infrared spectroscopy(FTIR),that caused this negative deviation of SAXS intensity from Porod’s law,and the average thichness of the interfacial layer could be deduced from this negative deviation.Copyright 2001 john Wiley and Sons,Ltd.
文摘Small angle X-ray scattering experiments have been performed to study the microstructure of messoporous silica meterials prepared by condensation of tetraethylorthosilicate using nonionic alkylpolyethyleneoxide(AEO9) and ionic cetyltrimethylammonium bromide (CTAB) surfactant as templates.It is the pores within the nanometre range that produce the main cattering.The scattering of the pure silica systems obey Porod’s law.This may be because the templates produce some additional scattering background and then make the scattering of pores distorted.The results show that the full removal of templates from the pores of the materials by Soxhlet extraction is very easy for AEO9,but it is difficult for CTAB.The positive deviation correction is also perfromed.
文摘Small X-ray Scattering (SAXS) experiment using Synchrotron Radiation as X-ray source was used to determine the average wall thickness of mesoporous silica prepard by condensation of tetraethylorthosilicate(TEOS) using non-ionic alkylpolyethyleneoxide(AEO9) surfactant as templates.The results agreed with that of high-resolution TEM(HRTEM) measurement.
