A secondary electron yield test device for vacuum material study is set up,and its detailed design described in this paper.The test results for a few common vacuum materials with and without TiN film coating are prese...A secondary electron yield test device for vacuum material study is set up,and its detailed design described in this paper.The test results for a few common vacuum materials with and without TiN film coating are presented,and the influential factors on secondary electron yield are analyzed.All the work will be helpful to the surface pretreatment of vacuum materials.展开更多
基金supported by Open Fund of Key Laboratory of Material Preparation and Protection for Harsh Environment(Nanjing University of Aeronautics and Astronautics)Ministry of Industry and Information Technology(56XCA17006)the Innovation Fund of NUAA(Nanjing University of Aeronautics and Astronautics)(kfjj20180602)。
文摘A secondary electron yield test device for vacuum material study is set up,and its detailed design described in this paper.The test results for a few common vacuum materials with and without TiN film coating are presented,and the influential factors on secondary electron yield are analyzed.All the work will be helpful to the surface pretreatment of vacuum materials.