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对Si(Li)探测器测谱中产生伪峰现象的分析
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作者 张开春 吴丽萍 +1 位作者 周厚全 李志勇 《四川大学学报(自然科学版)》 CAS CSCD 北大核心 2001年第1期115-117,共3页
The Be window is destroyed by chance during using the Si(Li) detector.After it is repaired,the detector is used to measure characteristic X ray of following elements of V,Fe,Ni,Cu,Zn and Pb.The concomitent fake peak a... The Be window is destroyed by chance during using the Si(Li) detector.After it is repaired,the detector is used to measure characteristic X ray of following elements of V,Fe,Ni,Cu,Zn and Pb.The concomitent fake peak appears going with the photoelectric peak of above mentioned elements,and the ratio of two peaks’ energy is nearly a constant.By experiment test and reason analysis,it is found that the fare peak is resulted from Li ions’ contrary diraction drift in Si(Li) detector,which is caused by the suddenly sharp change of outward the degree of vacuum and high voltage. 展开更多
关键词 探测器 测谱 伪峰现象
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