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一种低压差线性稳压电路的并行测试方法
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作者 张鹏辉 《电子与封装》 2014年第12期8-10,41,共4页
介绍了一种特别的低压差线性稳压电路,以及针对该电路的测试方法。该电路的特殊之处在于圆片上所有管芯的输出端短接在一起,无法直接用常规方式进行多工位并行测试,需要使用浮动电源对每个工位进行隔离测试。同时在测试方案中加入了自... 介绍了一种特别的低压差线性稳压电路,以及针对该电路的测试方法。该电路的特殊之处在于圆片上所有管芯的输出端短接在一起,无法直接用常规方式进行多工位并行测试,需要使用浮动电源对每个工位进行隔离测试。同时在测试方案中加入了自校准功能,可以在长期大规模测试中有效地保证测试准确性,避免因测试系统出现异常造成误测。 展开更多
关键词 低压差线性稳压电路 测试 自校准测试
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CMOS low-dropout regulator with 3.3 μA quiescent current without off-chip capacitor
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作者 王忆 崔传荣 +1 位作者 巩文超 何乐年 《Journal of Southeast University(English Edition)》 EI CAS 2009年第1期13-17,共5页
A CMOS (complementary metal-oxide-semiconductor transistor) low-dropout regulator (LDO) with 3. 3 V output voltage and 100 mA output current for system-on-chip applications to reduce board space and external pins ... A CMOS (complementary metal-oxide-semiconductor transistor) low-dropout regulator (LDO) with 3. 3 V output voltage and 100 mA output current for system-on-chip applications to reduce board space and external pins is presented. By utilizing a dynamic slew-rate enhancement(SRE) circuit and nested Miller compensation (NMC) on the LDO structure, the proposed LDO provides high stability during line and load regulation without off-chip load capacitors. The overshot voltage is limited within 550 mV and the settling time is less than 50 μs when the load current decreases from 100 mA to 1 mA. By using a 30 nA reference current, the quiescent current is 3.3 μA. The proposed design is implemented by CSMC 0. 5 μm mixed-signal process. The experimental results agree with the simulation results. 展开更多
关键词 low-dropout regulator off-chip capacitor slew-rate enhancement circuit nested Miller compensation(NMC)
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