一种低功耗测试图形的生成方法

为解决测试图形生成电路功耗高、硬件开销大、故障检测难等问题,提出了一种用于内建自测试的低功耗测试图形生成方法。该方法将种子向量和SIC计数器生成向量进行运算,产生MSIC测试向量。通过设计一种可配置SIC计数器和种子生成电路,证明了该方法中任意的2个MSIC图形在任何情况下都是相异的。以国际基准测试电路ISCAS’89为对象,在nangate 45nm工艺上的仿真实验表明,基于该方法的测试生成电路的平均功耗占被测电路正常工作时平均功耗的1%～3%;与传统的伪随机测试生成电路相比,该测试生成电路的测试功耗降低了5.48%～66.86%,且其所生成的测试图形具有唯一性、低跳变等特性。

Microstructure Development after Coiling Process in Low-Si Content TRIP-Assisted Steels

The present work aimed to investigate the effect of coiling process conditions on microstructure development in a low-Si content TRIP （transformation-induced plasticity）-assisted steel after thermomechanical processing. In this framework, compression samples which were deformed above Tnr and then intercritically annealed were held isothermally for different durations at temperatures below bainite transformation start temperature. Microstructure of samples were characterized by optical and electron microscopy, XRD （X-ray diffraction） and M6ssbauer spectroscopy. The results indicated that due to low-silicon content of the present steel, the incomplete bainite reaction phenomena was not observed and, hence, the maximum carbon enrichment of residual austenite was achieved in the samples which held for short durations. It was also shown that the maximum carbon enrichment and volume fraction of residual austenite were achieved at intermediate bainite hold temperature of 450 ℃ as the result of competing phenomena, such as microstructural refinement, dislocation density, carbide precipitation and growth.