A double sampling circuit to eliminating fixed pattern noise(FPN) in CMOS image sensor (CIS) is presented. Double sampling is implemented by column switch capacitor amplifier directly, and offset compensation is added...A double sampling circuit to eliminating fixed pattern noise(FPN) in CMOS image sensor (CIS) is presented. Double sampling is implemented by column switch capacitor amplifier directly, and offset compensation is added to the amplifier to suppress column FPN. The amplifier is embedded in a 64×64 CIS and successfully fabricated with chartered 0.35 μm process. Theory analysis and circuit simulation indicate that FPN can be suppressed from millivolt to microvolt. Test results show that FPN is smaller than one least-significant bit of 8 bit ADC. FPN is reduced to an acceptable level with double sampling technique implemented with switch capacitor amplifier.展开更多
In this paper,a photoelectric device is introduced,which is used in detecting the quality on internal surface of thin and long steel pipe.In this device,the CCTV lens is used for extract tile flaw information on inter...In this paper,a photoelectric device is introduced,which is used in detecting the quality on internal surface of thin and long steel pipe.In this device,the CCTV lens is used for extract tile flaw information on internal surface of the pipe,and make IBM-PC/AT 486 computer as controlling and image processing system.By this instrument,the functions,such as the digital conversion of input information,image processing,classification of recognition and output display can be obtained.In the petroleum and chemical industry,by using this apparatus,we can detect the quality on internal surface of various metal pipes with real-time automatically.展开更多
基金Supported by National Natural Science Foundation of China (No.60576025).
文摘A double sampling circuit to eliminating fixed pattern noise(FPN) in CMOS image sensor (CIS) is presented. Double sampling is implemented by column switch capacitor amplifier directly, and offset compensation is added to the amplifier to suppress column FPN. The amplifier is embedded in a 64×64 CIS and successfully fabricated with chartered 0.35 μm process. Theory analysis and circuit simulation indicate that FPN can be suppressed from millivolt to microvolt. Test results show that FPN is smaller than one least-significant bit of 8 bit ADC. FPN is reduced to an acceptable level with double sampling technique implemented with switch capacitor amplifier.
文摘In this paper,a photoelectric device is introduced,which is used in detecting the quality on internal surface of thin and long steel pipe.In this device,the CCTV lens is used for extract tile flaw information on internal surface of the pipe,and make IBM-PC/AT 486 computer as controlling and image processing system.By this instrument,the functions,such as the digital conversion of input information,image processing,classification of recognition and output display can be obtained.In the petroleum and chemical industry,by using this apparatus,we can detect the quality on internal surface of various metal pipes with real-time automatically.