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光刻机系统中193nm薄膜的研究进展 被引量:2
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作者 尚淑珍 易葵 +1 位作者 邵建达 范正修 《激光与光电子学进展》 CSCD 北大核心 2006年第1期11-14,共4页
193nm的ArF准分子激光光刻可将特征线宽推进到0.10μm。重点介绍了193nm薄膜的研究进展及影响薄膜性能的主要因素,并对具体的研究方向进行了总结。
关键词 光刻 193nm 光学薄膜 准分子激光光刻 光刻机系
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Thick SU8 microstructures prepared by broadband UV lithography and the applications in MEMS devices
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作者 李东玲 温志渝 +1 位作者 尚正国 佘引 《Optoelectronics Letters》 EI 2016年第3期182-187,共6页
Thick SU8 microstructures with high aspect ratio and good side wall quality were fabricated by ultraviolet (UV) lithography, and the processing parameters were comprehensively studied. It proves that the adhesion of... Thick SU8 microstructures with high aspect ratio and good side wall quality were fabricated by ultraviolet (UV) lithography, and the processing parameters were comprehensively studied. It proves that the adhesion of SU8 on silicon (Si) substrates is influenced by Si-OH on the surface, and can be improved by the HF treatment. Cracks and de- lamination are caused by large internal stress during fabrication process, and are significantly influenced by soft bake and post-exposure bake processes. The internal stress is reduced by a low post-exposure bake exposure tem- perature of 85 ℃ for 40 rain. A three-step soft bake enhances the reflowing ofSU8 photoresist, and results in uni- form surface and less air bubbles. The vertical side wall is obtained with the optimized exposure dose of 800 mJ/cm2 for the thickness of 160 μm. Using the optimized fabrication process combined with a proper structure design, dense SU8 micro pillars are achieved with the aspect ratio of 10 and the taper angle of 89.86°. Finally, some possible ap- plications of SU8 in micro-electromechanical system (MEMS) device are developed and demonstrated. 展开更多
关键词 MEMS器件 紫外光刻 微结构 应用 微机电 烘烤过程 编写 宽带
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