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聚合物三维微图案加工的转移微模塑新方法 被引量:2
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作者 王哲 邢汝博 +1 位作者 韩艳春 李滨耀 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2003年第5期946-948,共3页
光刻蚀技术[1]是微电子加工技术中最成功的一种, 但由于受到光学衍射等的限制, 100 nm是光刻蚀的极限, 为此人们探索了许多先进的刻蚀技术[2,3], 如超紫外线刻蚀(EUV)、软X射线刻蚀、电子束刻蚀和聚焦离子束刻蚀(FIB)等, 可制作尺寸小于... 光刻蚀技术[1]是微电子加工技术中最成功的一种, 但由于受到光学衍射等的限制, 100 nm是光刻蚀的极限, 为此人们探索了许多先进的刻蚀技术[2,3], 如超紫外线刻蚀(EUV)、软X射线刻蚀、电子束刻蚀和聚焦离子束刻蚀(FIB)等, 可制作尺寸小于100 nm的图形, 但普遍存在加工速度慢及成本高等缺点. 展开更多
关键词 转移微模塑 弹性软模板 聚合物三维微图案 加工 光刻蚀技术 微电子加工技术
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ITO Etched by Photolithography Used in the Fabrication of Flexible Organic Solar Cells with PET Substrates 被引量:2
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作者 Ourahmoun Ourida Belkaid Med Said +1 位作者 Trigaud Thierry Shirr-Bonnans Martin 《Journal of Energy and Power Engineering》 2014年第1期107-111,共5页
In this study, the authors have shown the power conversion efficiency of flexible organic solar cells. The structure of the device is PET/ITO/PEDOT: PSS/P3HT: PCBM/AI. P3HT (poly-3-hexylthiophene). It was used as ... In this study, the authors have shown the power conversion efficiency of flexible organic solar cells. The structure of the device is PET/ITO/PEDOT: PSS/P3HT: PCBM/AI. P3HT (poly-3-hexylthiophene). It was used as an electron donor, PCBM ([6, 6]-phenyl C6 l-butyric acid methyl ester) as an electron acceptor and PEDOT: PSS used as a HIL (hole injection layer). These materials were deposited by spin coating method on the flexible substrates. Photolithography method is used to etch ITO. The electrical parameters of the fabricated cells were investigated by means of J (V), FF (fill factor), the efficiency (r/), photocurrent and IPCE measurement. It was observed that 45% of the absorbed photons are converted into current. The results obtained using etching technology by photolithography is better than that obtained in the clean room. 展开更多
关键词 Flexible substrate PET PHOTOLITHOGRAPHY organic solar cells P3HT: PCBM.
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An Improvement on Si-etching Tetramethyl Ammonium Hydroxide Solution
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作者 杨笛 余金中 +2 位作者 陈少武 樊中朝 李运涛 《Chinese Journal of Chemical Engineering》 SCIE EI CAS CSCD 2005年第1期48-50,共3页
An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (NH4)2S2O8, was achieved in this paper. For this etching solution, the etching rates o... An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (NH4)2S2O8, was achieved in this paper. For this etching solution, the etching rates of silicon and silicon dioxide were about 1.1μm·min-1 and 0.5nm·min-1, respectively. The etching ratio between (100) and (111) planes was about 34:1, and the etched surface was very smooth. 展开更多
关键词 SILICON silicon dioxide tetramethyl ammonium hydroxide etching rate
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A New Approach to Cleave MEMS Devices from Silicon Substrates
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作者 Mehdi Rezaei Jonathan Lueke Dan Sameoto Don Raboud Walied Moussa 《Journal of Mechanics Engineering and Automation》 2013年第12期731-738,共8页
Dicing of fabricated MEMS (microelectromechanical system) devices is sometimes a source of challenge, especially when devices are overhanging structures. In this work, a modified cleaving technique is developed to p... Dicing of fabricated MEMS (microelectromechanical system) devices is sometimes a source of challenge, especially when devices are overhanging structures. In this work, a modified cleaving technique is developed to precisely separate fabricated devices from a silicon substrate without requiring a dicing machine. This technique is based on DRIE (deep reactive ion etching) which is regularly used to make cleaving trenches in the substrate during the releasing stage. Other similar techniques require some extra later steps or in some cases a long HF soak. To mask the etching process, a thick photoresist is used. It is shown that by applying different UV (ultraviolate) exposure and developing times for the photoresist, the DRIE process could be controlled to etch specific cleaving trenches with less depth than other patterns on the photoresist. Those cleaving trenches are used to cleave the wafer later, while the whole wafer remains as one piece until the end of the silicon etching despite some features being etched all the way through the wafer at the same time. The other steps of fabricating and releasing the devices are unaffected. The process flow is described in details and some results of applying this technique for cleaving fabricated cantilevers on a silicon substrate are presented. 展开更多
关键词 DICING cleaving MICROFABRICATION dry release exposure characterization deep reactive ion etching.
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