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Micronic与ASML就光掩膜蚀刻技术签署合作协议
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《集成电路应用》 2005年第2期25-25,共1页
瑞典Micronic Laser Systems AB公司日前表示,该公司与荷兰ASML Netherlands公司最近签署了一项授权协议,授予ASML以Micronic在空间光调制器和数据通道技术领域的专利产品组合为基础,面向半导体应用推广光学掩膜蚀刻的权利。
关键词 Micronic公司 ASML公司 掩膜蚀刻技术 合作协议
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基因芯片及其应用 被引量:1
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作者 张鸿鸣 《金华职业技术学院学报》 2002年第1期18-21,88,共5页
基因芯片又称DNA微矩阵,是一种分析大量复杂生物样品的有效工具。它可以通过光引导聚合技术、电压打印或人工直接点样制备。光蚀刻技术可以使探针密度达到106/cm2。它们可以被广泛地应用于DNA序列测定、新基因的检测和突变基因的分析。... 基因芯片又称DNA微矩阵,是一种分析大量复杂生物样品的有效工具。它可以通过光引导聚合技术、电压打印或人工直接点样制备。光蚀刻技术可以使探针密度达到106/cm2。它们可以被广泛地应用于DNA序列测定、新基因的检测和突变基因的分析。在医学上,基因芯片可以被用于癌症的诊断,传染病疾病如AIDS和肝炎等的早期检测。它在新药开发上也有巨大的市场。 展开更多
关键词 基因芯片 DNA微矩阵 生物样品 光蚀刻技术 探针 密度 基因 疾病
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10cm×10cm Bulk Micromegas探测器的研制 被引量:3
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作者 李沛玉 周静 +8 位作者 陈雷 赵明锐 智宇 刘雯迪 贾世海 张昀昱 胡守扬 于伟翔 李笑梅 《原子能科学技术》 EI CAS CSCD 北大核心 2020年第6期963-967,共5页
Bulk Micromegas探测器是一种新型微结构气体探测器.利用光蚀刻技术制作了有效面积为10cm×10cm的多通道Bulk Micromegas探测器.对探测器的各通道进行了电容测试,显示探测器具有较好的均匀性.在Ar+10%CO2气体中,使用55Fe放射源和自... Bulk Micromegas探测器是一种新型微结构气体探测器.利用光蚀刻技术制作了有效面积为10cm×10cm的多通道Bulk Micromegas探测器.对探测器的各通道进行了电容测试,显示探测器具有较好的均匀性.在Ar+10%CO2气体中,使用55Fe放射源和自主研制的基于APV25前端卡的数字化电子学,对制作的有效面积为10cm×10cm的探测器进行了测试,其结果显示探测器性能良好,能得到清晰的二维事件分布图.该探测器目前全部工艺国产化,并能进行批量生产,成品率接近100%. 展开更多
关键词 Bulk Micromegas APV25 光蚀刻技术 前端电子学
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重新定义可提高成品率的设计
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作者 Synopsys公司 Srinivas Raghvendra 《电子设计应用》 2004年第6期15-18,共4页
关键词 重新定义 成品率 芯片 半导体行业 光蚀刻技术 CMP技术 设计流程 学逼近纠正法
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ITO Etched by Photolithography Used in the Fabrication of Flexible Organic Solar Cells with PET Substrates 被引量:2
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作者 Ourahmoun Ourida Belkaid Med Said +1 位作者 Trigaud Thierry Shirr-Bonnans Martin 《Journal of Energy and Power Engineering》 2014年第1期107-111,共5页
In this study, the authors have shown the power conversion efficiency of flexible organic solar cells. The structure of the device is PET/ITO/PEDOT: PSS/P3HT: PCBM/AI. P3HT (poly-3-hexylthiophene). It was used as ... In this study, the authors have shown the power conversion efficiency of flexible organic solar cells. The structure of the device is PET/ITO/PEDOT: PSS/P3HT: PCBM/AI. P3HT (poly-3-hexylthiophene). It was used as an electron donor, PCBM ([6, 6]-phenyl C6 l-butyric acid methyl ester) as an electron acceptor and PEDOT: PSS used as a HIL (hole injection layer). These materials were deposited by spin coating method on the flexible substrates. Photolithography method is used to etch ITO. The electrical parameters of the fabricated cells were investigated by means of J (V), FF (fill factor), the efficiency (r/), photocurrent and IPCE measurement. It was observed that 45% of the absorbed photons are converted into current. The results obtained using etching technology by photolithography is better than that obtained in the clean room. 展开更多
关键词 Flexible substrate PET PHOTOLITHOGRAPHY organic solar cells P3HT: PCBM.
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An Improvement on Si-etching Tetramethyl Ammonium Hydroxide Solution
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作者 杨笛 余金中 +2 位作者 陈少武 樊中朝 李运涛 《Chinese Journal of Chemical Engineering》 SCIE EI CAS CSCD 2005年第1期48-50,共3页
An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (NH4)2S2O8, was achieved in this paper. For this etching solution, the etching rates o... An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (NH4)2S2O8, was achieved in this paper. For this etching solution, the etching rates of silicon and silicon dioxide were about 1.1μm·min-1 and 0.5nm·min-1, respectively. The etching ratio between (100) and (111) planes was about 34:1, and the etched surface was very smooth. 展开更多
关键词 SILICON silicon dioxide tetramethyl ammonium hydroxide etching rate
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A New Approach to Cleave MEMS Devices from Silicon Substrates
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作者 Mehdi Rezaei Jonathan Lueke Dan Sameoto Don Raboud Walied Moussa 《Journal of Mechanics Engineering and Automation》 2013年第12期731-738,共8页
Dicing of fabricated MEMS (microelectromechanical system) devices is sometimes a source of challenge, especially when devices are overhanging structures. In this work, a modified cleaving technique is developed to p... Dicing of fabricated MEMS (microelectromechanical system) devices is sometimes a source of challenge, especially when devices are overhanging structures. In this work, a modified cleaving technique is developed to precisely separate fabricated devices from a silicon substrate without requiring a dicing machine. This technique is based on DRIE (deep reactive ion etching) which is regularly used to make cleaving trenches in the substrate during the releasing stage. Other similar techniques require some extra later steps or in some cases a long HF soak. To mask the etching process, a thick photoresist is used. It is shown that by applying different UV (ultraviolate) exposure and developing times for the photoresist, the DRIE process could be controlled to etch specific cleaving trenches with less depth than other patterns on the photoresist. Those cleaving trenches are used to cleave the wafer later, while the whole wafer remains as one piece until the end of the silicon etching despite some features being etched all the way through the wafer at the same time. The other steps of fabricating and releasing the devices are unaffected. The process flow is described in details and some results of applying this technique for cleaving fabricated cantilevers on a silicon substrate are presented. 展开更多
关键词 DICING cleaving MICROFABRICATION dry release exposure characterization deep reactive ion etching.
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