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在兰宝石衬底上重生长红宝石
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作者 青春 《电子材料快报》 1995年第9期15-16,共2页
关键词 兰宝石衬底 掺杂 Cr^++ 红宝 薄膜生长
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Dislocation of Cz-sapphire substrate for GaN growth by chemical etching method 被引量:1
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作者 牛新环 卢国起 +2 位作者 张维连 高金雍 刘玉岭 《中国有色金属学会会刊:英文版》 CSCD 2006年第B01期187-190,共4页
The diameter of Czochralski (Cz) sapphire crystals is 50 mm. The sapphire substrates were lapped by using diamond powders and polished by chemical mechanical polishing(CMP) method using alkali slurry with SiO2 abrasiv... The diameter of Czochralski (Cz) sapphire crystals is 50 mm. The sapphire substrates were lapped by using diamond powders and polished by chemical mechanical polishing(CMP) method using alkali slurry with SiO2 abrasive. After obtaining the smooth surfaces, the chemical etching experiments were processed by using fused KOH and NaOH etchants at different temperature for different times. The dislocation was observed by means of optical microscope and scanning electron microscope. The clear and stable contrast images of sample etching pits were observed. On the whole, the dislocation density is about 104?105 cm?2. Comparing the results under the conditions of different etchants, temperatures and times during the etching proceeding, it was found that the optimal condition for dislocation displaying is etching 15 min with fused KOH at 290 ℃. At the same time, the formation of the etch pits and the reducing method of dislocation density were also discussed. 展开更多
关键词 化学蚀刻法 氮化镓 单晶生长 兰宝石衬底 位错
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