Based on the solid-gas eutectic unidirectional solidification technique and the principle of unidirectional solidification of single-phase alloy, a new method for evaluating the diffusion coefficient of hydrogen in li...Based on the solid-gas eutectic unidirectional solidification technique and the principle of unidirectional solidification of single-phase alloy, a new method for evaluating the diffusion coefficient of hydrogen in liquid metals was proposed. Taking Cu-H2 system for example, the influences of argon partial pressure and superheat degree of melt on the diffusion coefficient of hydrogen in liquid metal were studied and the predicted values were similar to each other. The obtained temperature-dependent equation for diffusion coefficient of hydrogen in liquid copper is comparable with experimental data in literature, which validates the effectiveness of this method. The temperature-dependent equations for diffusion coefficient of hydrogen in liquid Mg, Si and Cu-34.6%Mn alloy were also evaluated by this method, along with the values at the melting point of each metal and alloy.展开更多
An electrochemical study on the redox behavior of indium in the eutectic LiCl-KCl system at 450 ℃ was carried out with the transient techniques of cyclic voltammetry and chronopotentiometry on an inert molybdenum ele...An electrochemical study on the redox behavior of indium in the eutectic LiCl-KCl system at 450 ℃ was carried out with the transient techniques of cyclic voltammetry and chronopotentiometry on an inert molybdenum electrode. The reduction of In(Ⅲ) was found to be a two-step process involving In(Ⅲ)/In(Ⅰ) and In(Ⅰ)/In couples at the potentials of about-0.4 and-0.8 V versus Ag/AgCl, respectively. The redox mechanism was further confirmed by the theoretical evaluation of the number of transferred electrons based on cyclic voltammetry and characterizations of the precipitates generated by the potentiostatic electrolysis. The diffusion coefficients of indium ions in the eutectic LiCl-KCl melt at 450 ℃ were estimated by cyclic voltammetry and chronopotentiometry. The results obtained through the two methods are in fair agreement, delivering an average diffusion coefficient of approximately 1.8×10^(-5)cm^(2)/s for In(Ⅲ), and 1.4×10^(-4)cm^(2)/s for In(Ⅰ).展开更多
Contact resistance at the interface between metal electrodes and semiconductors can significantly limit the performance of organic field-effect transistors, leading to a distinct voltage drop at the interface. Here, w...Contact resistance at the interface between metal electrodes and semiconductors can significantly limit the performance of organic field-effect transistors, leading to a distinct voltage drop at the interface. Here, we demonstrate enhanced performance of n-channel field-effect transistors based on solution-grown C60 single-crystalline ribbons by introducing an interlayer of a conjugated polyelectrolyte （CPE） composed of poly[（9,9-bis（3＇-（（N,N-dimethyl）-N-ethylammonium）-propyl）-2,7-fluorene）- alt-2,7-（9,9-dioctylfluorene）] dibromide （PFN＋Br-）. The PFN＋Br- interlayer greatly improves the charge injection. Consequently, the electron mobility is promoted up to 5.60 cm2 V-1 s-1 and the threshold voltage decreased dramatically with the minimum of 4.90 V.展开更多
基金Project(51271096)supported by the National Natural Science Foundation of ChinaProject(NCET-12-0310)supported by Program for New Century Excellent Talents in University,China
文摘Based on the solid-gas eutectic unidirectional solidification technique and the principle of unidirectional solidification of single-phase alloy, a new method for evaluating the diffusion coefficient of hydrogen in liquid metals was proposed. Taking Cu-H2 system for example, the influences of argon partial pressure and superheat degree of melt on the diffusion coefficient of hydrogen in liquid metal were studied and the predicted values were similar to each other. The obtained temperature-dependent equation for diffusion coefficient of hydrogen in liquid copper is comparable with experimental data in literature, which validates the effectiveness of this method. The temperature-dependent equations for diffusion coefficient of hydrogen in liquid Mg, Si and Cu-34.6%Mn alloy were also evaluated by this method, along with the values at the melting point of each metal and alloy.
基金the National Natural Science Foundation of China(Nos.51904003,U1703130,51704011)the China Postdoctoral Science Foundation(No.2019M651466)the Foundation of Anhui Province Key Laboratory of Metallurgical Engineering&Resources Recycling of China(Nos.SKF18-01,SKF19-05).
文摘An electrochemical study on the redox behavior of indium in the eutectic LiCl-KCl system at 450 ℃ was carried out with the transient techniques of cyclic voltammetry and chronopotentiometry on an inert molybdenum electrode. The reduction of In(Ⅲ) was found to be a two-step process involving In(Ⅲ)/In(Ⅰ) and In(Ⅰ)/In couples at the potentials of about-0.4 and-0.8 V versus Ag/AgCl, respectively. The redox mechanism was further confirmed by the theoretical evaluation of the number of transferred electrons based on cyclic voltammetry and characterizations of the precipitates generated by the potentiostatic electrolysis. The diffusion coefficients of indium ions in the eutectic LiCl-KCl melt at 450 ℃ were estimated by cyclic voltammetry and chronopotentiometry. The results obtained through the two methods are in fair agreement, delivering an average diffusion coefficient of approximately 1.8×10^(-5)cm^(2)/s for In(Ⅲ), and 1.4×10^(-4)cm^(2)/s for In(Ⅰ).
基金supported by the National Basic Research Program of China(2014CB643503)the National Natural Science Foundation of China(51625304,51373150,51461165301)the Zhejiang Province Natural Science Foundation(LZ13E030002)
文摘Contact resistance at the interface between metal electrodes and semiconductors can significantly limit the performance of organic field-effect transistors, leading to a distinct voltage drop at the interface. Here, we demonstrate enhanced performance of n-channel field-effect transistors based on solution-grown C60 single-crystalline ribbons by introducing an interlayer of a conjugated polyelectrolyte （CPE） composed of poly[（9,9-bis（3＇-（（N,N-dimethyl）-N-ethylammonium）-propyl）-2,7-fluorene）- alt-2,7-（9,9-dioctylfluorene）] dibromide （PFN＋Br-）. The PFN＋Br- interlayer greatly improves the charge injection. Consequently, the electron mobility is promoted up to 5.60 cm2 V-1 s-1 and the threshold voltage decreased dramatically with the minimum of 4.90 V.
