This paper presents an analog circuit built-in-test （BIT） structure based on boundary scan and realizes the BI＇I. It predigests the test process and improves the test precision by taking the rectangular pulse as st...This paper presents an analog circuit built-in-test （BIT） structure based on boundary scan and realizes the BI＇I. It predigests the test process and improves the test precision by taking the rectangular pulse as stimulator and analog switch as auxiliary bridge. The experiment of uA741 shows that the design is feasible. Compared with the traditional test method, it is better regarding reliability and measurability of the analog circuit system.展开更多
文摘This paper presents an analog circuit built-in-test （BIT） structure based on boundary scan and realizes the BI＇I. It predigests the test process and improves the test precision by taking the rectangular pulse as stimulator and analog switch as auxiliary bridge. The experiment of uA741 shows that the design is feasible. Compared with the traditional test method, it is better regarding reliability and measurability of the analog circuit system.
