The dynamic aspects of dielectric breakdown (DB) is studied in this article. A quantitative model based on impact ionization is presented. The formulae of microdefect growth rate and lifetime prediction are derived an...The dynamic aspects of dielectric breakdown (DB) is studied in this article. A quantitative model based on impact ionization is presented. The formulae of microdefect growth rate and lifetime prediction are derived and show fair agreement with experimental data in SiO2. All the fitting parameters have definite physical meanings.展开更多
文摘The dynamic aspects of dielectric breakdown (DB) is studied in this article. A quantitative model based on impact ionization is presented. The formulae of microdefect growth rate and lifetime prediction are derived and show fair agreement with experimental data in SiO2. All the fitting parameters have definite physical meanings.
