An analytical method, using sector field inductively coupled plasma mass spectrometry （SF-ICP-MS） for rapid simultaneous determination of Be, Na, Mg, Si, Ca, Ti, V, Cr, Fe, Co, Ni, Cu, Zn, As, Sn, Sb, Pb and Bi in e...An analytical method, using sector field inductively coupled plasma mass spectrometry （SF-ICP-MS） for rapid simultaneous determination of Be, Na, Mg, Si, Ca, Ti, V, Cr, Fe, Co, Ni, Cu, Zn, As, Sn, Sb, Pb and Bi in electrolytic manganese metal, was described. At the beginning, the samples were decomposed by HNO3 and H2504, and then analyzed by SF-ICP-MS. Most of the spectral interferences could be avoided by measuring in different mass resolution modes. The matrix effects due to the excess of sulfuric acid and Mn were evaluated. Correction of matrix effects was conducted by using the internal standard elements. The optimum condition for the determination was investigated and discussed. The detection limit is in the range of 0.001-0.169 gg/L. The current method is applied to the determination of trace impurities in electrolytic manganese metal. And experiments show that good results can be obtained much faster, more accurately and conveniently by current method.展开更多
The contents ofMg, Al, Si, Ti, Cr, Mn, Fe, Co, Cu, Ga, As, Se, Cd, Sb, Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry （HR-ICP-MS）. The sample was diss...The contents ofMg, Al, Si, Ti, Cr, Mn, Fe, Co, Cu, Ga, As, Se, Cd, Sb, Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry （HR-ICP-MS）. The sample was dissolved in HNO3 and HCI by microwave digestion. Most of the spectral interferences could be avoided by measuring in the high resolution mode. The matrix effects because of the presence of excess HC1 and nickel were evaluated. Correction for matrix effects was made using Sc, Rh and T1 as internal standards. The optimum conditions for the determination were tested and discussed. The detection limits range from 0.012 to 1.76 ~tg/g depending on the type of elements. The applicability of the proposed method is also validated by the analysis of high purity nickel reference material （NIST SRM 671）. The relative standard deviation （RSD） is less than 3.3%. Results for determination of trace elements in high purity nickel were presented.展开更多
A new way based on a modified bubble function and stationary wavelet transform(SWT) is proposed to solve the problem that the conventional edge detection algorithms are sensitive to the noises.Firstly,the traditional ...A new way based on a modified bubble function and stationary wavelet transform(SWT) is proposed to solve the problem that the conventional edge detection algorithms are sensitive to the noises.Firstly,the traditional bubble function is modified in order to get different time-frequency domain responses and to get filtering effects through adjusting the parameters. Secondly, the modified bubble function is combined with SWT to construct a multiresolution network. By using the modified bubble function to enhance the edges and by using SWT to reduce the noises, the edges can be extracted accurately,effectively and quickly with lower noise.Finally, the experimental results of the proposed edge detection algorithm are verified to be better than that with the traditional bubble function.展开更多
The nanomechanical properties of single human immunoglobulin G and M antibodies were measured in a liquid environment using a fast force-volume technique with sub-10-nm spatial resolution. The ultrastructural details ...The nanomechanical properties of single human immunoglobulin G and M antibodies were measured in a liquid environment using a fast force-volume technique with sub-10-nm spatial resolution. The ultrastructural details of these molecules were resolved in the images. Simultaneously, important physical properties, including elasticity, adhesion, and deformation were measured. The dimensions and adsorption of the immunoglobulin M antibodies onto the substrate indicated that they are highly by a low elastic stiffness （34 ± 10 MPa） flexible. The antibodies were characterized and high deformability （1.5 ± 0.5 nm）.展开更多
基金Project(21075138)supported by the National Natural Science Foundation of ChinaProject(cstc2013jcyjA10088)supported by Chongqing Natural Science Foundation,ChinaProject(KJ121311)supported by Scientific and Technological Research Program of Chongqing Municipal Education Commission,China
文摘An analytical method, using sector field inductively coupled plasma mass spectrometry （SF-ICP-MS） for rapid simultaneous determination of Be, Na, Mg, Si, Ca, Ti, V, Cr, Fe, Co, Ni, Cu, Zn, As, Sn, Sb, Pb and Bi in electrolytic manganese metal, was described. At the beginning, the samples were decomposed by HNO3 and H2504, and then analyzed by SF-ICP-MS. Most of the spectral interferences could be avoided by measuring in different mass resolution modes. The matrix effects due to the excess of sulfuric acid and Mn were evaluated. Correction of matrix effects was conducted by using the internal standard elements. The optimum condition for the determination was investigated and discussed. The detection limit is in the range of 0.001-0.169 gg/L. The current method is applied to the determination of trace impurities in electrolytic manganese metal. And experiments show that good results can be obtained much faster, more accurately and conveniently by current method.
基金Project(21075138) supported by the National Natural Science Foundation of ChinaProject(cstc2011jjA0780) supported by Natural Science Foundation of Chongqing City,ChinaProject(KJ121311) supported by Educational Commission of Chongqing City of China
文摘The contents ofMg, Al, Si, Ti, Cr, Mn, Fe, Co, Cu, Ga, As, Se, Cd, Sb, Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry （HR-ICP-MS）. The sample was dissolved in HNO3 and HCI by microwave digestion. Most of the spectral interferences could be avoided by measuring in the high resolution mode. The matrix effects because of the presence of excess HC1 and nickel were evaluated. Correction for matrix effects was made using Sc, Rh and T1 as internal standards. The optimum conditions for the determination were tested and discussed. The detection limits range from 0.012 to 1.76 ~tg/g depending on the type of elements. The applicability of the proposed method is also validated by the analysis of high purity nickel reference material （NIST SRM 671）. The relative standard deviation （RSD） is less than 3.3%. Results for determination of trace elements in high purity nickel were presented.
基金This researchis supported by Research Fundfor the DoctoralProgramof Higher Education.NO.20020699014
文摘A new way based on a modified bubble function and stationary wavelet transform(SWT) is proposed to solve the problem that the conventional edge detection algorithms are sensitive to the noises.Firstly,the traditional bubble function is modified in order to get different time-frequency domain responses and to get filtering effects through adjusting the parameters. Secondly, the modified bubble function is combined with SWT to construct a multiresolution network. By using the modified bubble function to enhance the edges and by using SWT to reduce the noises, the edges can be extracted accurately,effectively and quickly with lower noise.Finally, the experimental results of the proposed edge detection algorithm are verified to be better than that with the traditional bubble function.
文摘The nanomechanical properties of single human immunoglobulin G and M antibodies were measured in a liquid environment using a fast force-volume technique with sub-10-nm spatial resolution. The ultrastructural details of these molecules were resolved in the images. Simultaneously, important physical properties, including elasticity, adhesion, and deformation were measured. The dimensions and adsorption of the immunoglobulin M antibodies onto the substrate indicated that they are highly by a low elastic stiffness （34 ± 10 MPa） flexible. The antibodies were characterized and high deformability （1.5 ± 0.5 nm）.
