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FR-4型覆铜板层压成型技术探讨 被引量:1
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作者 曾光龙 《印制电路信息》 2002年第3期15-18,共4页
覆铜板压制成型是在层压机上完成的,粘结变为粘流态.随着温度逐步升高,树脂开始发生固化反应,粘度逐步增大.
关键词 FR-4型覆铜板 层压成型 PCB 升温速度控制 打高压点
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论釉疤、色疤缺陷在日用陶瓷中产生的原因及解决措施
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作者 卢丽新 《陶瓷科学与艺术》 CAS 2004年第4期34-35,共2页
釉疤、色疤在陶瓷缺陷中术语的解释是这样的:"指由于施釉不合要求而致烧后产品釉出现的局部严重不平".但在实际生产中,釉疤、色疤样式有多种.这一缺陷在整体缺陷中的比例虽然不大,但就某个品种或某个色调是相当突出的,而且影... 釉疤、色疤在陶瓷缺陷中术语的解释是这样的:"指由于施釉不合要求而致烧后产品釉出现的局部严重不平".但在实际生产中,釉疤、色疤样式有多种.这一缺陷在整体缺陷中的比例虽然不大,但就某个品种或某个色调是相当突出的,而且影响实物质量.这两种缺陷大多集中发生在大件产品、杯把根处、有孔雀绿、黑色等颜色的的绘产品.釉疤、色疤缺陷是一种现象,其实质是由于瓷体的气相、坯体、釉层三者吸附、湿润、粘附物理化学变化的结果. 展开更多
关键词 釉疤 色疤 缺陷 日用陶瓷 高温阶段 升温速度控制 釉层厚度控制 坯面
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Precise Control of Temperature Rising Speed of Wafer during Rapid Thermal Processing
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作者 Shigeki Hirasawa Tsuyoshi Kawanami Katsuaki Shirai Tetsuya Urimoto Naoki Morimoto Atsushi Fujiwara Sadanori Toda 《Journal of Mechanics Engineering and Automation》 2014年第5期359-364,共6页
In rapid thermal processing of a semiconductor wafer, it is important to keep a given temperature rising speed of the wafer during the temperature rising process. We made an experimental apparatus to measure the tempe... In rapid thermal processing of a semiconductor wafer, it is important to keep a given temperature rising speed of the wafer during the temperature rising process. We made an experimental apparatus to measure the temperature rising speed of a ceramic ball of 2 mm in diameter heated with four halogen lamp heaters. The heating rate of the halogen lamp heaters was controlled by computer to keep a given temperature rising speed of 50 ℃/s with a controlling time interval of 0.1 s. We examined the effect of various heating control methods on the error of the temperature rising speed of the ceramic ball. We found that a combined method of control with prepared correlation and PID (proportional integral derivative) control is a good method to decrease the error of the temperature rising speed. The average error of the temperature rising speed is 0.5 ℃/s, and the repetition error is almost zero for the temperature rising speed of 50 ℃/s from 330 ℃ to 370 ℃. We also measured the effects of artificial control delay time and measuring error of the monitoring temperature on the error of the temperature rising speed. 展开更多
关键词 Electronic equipment manufacturing rapid heating heat treatment temperature control PID control.
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