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半导体薄膜生长实时监控系统的设计与应用
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作者 周智猛 徐茵 刘国涛 《计算机测量与控制》 CSCD 2003年第8期585-587,共3页
文章分析了半导体薄膜生长工艺流程的特点。在此基础上 ,为实验室的ECR -MOCVD设备设计了一套半导体薄膜生长的实时监控系统 ,介绍了系统的硬件结构以及在WIN98环境下用VB6 0实现生长实时监控系统软件的实现方法。经实验证明 ,系统保... 文章分析了半导体薄膜生长工艺流程的特点。在此基础上 ,为实验室的ECR -MOCVD设备设计了一套半导体薄膜生长的实时监控系统 ,介绍了系统的硬件结构以及在WIN98环境下用VB6 0实现生长实时监控系统软件的实现方法。经实验证明 ,系统保证了工艺流程的连续可靠运行 ,实验数据的可靠性和工艺流程的可重复性也大大提高 ,使用方便 ,降低了试验人员的劳动强度 ,实现了预期的设计目标。 展开更多
关键词 半导体薄膜生长 实时监控系统 设计 薄膜结构 半导体工业
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Deposition of Thick SiO_2 from Tetraethylorthosilicate and H_2O by Plasma-Enhanced CVD 被引量:1
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作者 雷红兵 王红杰 +5 位作者 邓晓清 杨沁清 胡雄伟 王启明 廖左升 杨基南 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第5期543-547,共5页
The deposition of silicon dioxide by plasma enhanced chemical vapor deposition from tetraethylorthosilicate (TEOS) and H_2O has been studied.Silicon oxide with refractive index of 1453 has been obtained.Tests on the 5... The deposition of silicon dioxide by plasma enhanced chemical vapor deposition from tetraethylorthosilicate (TEOS) and H_2O has been studied.Silicon oxide with refractive index of 1453 has been obtained.Tests on the 51mm wafers show that both thickness uniformity of ±15% and constant refractive index of 1453 can be achieved.By raising the deposition temperature,the qualities have been improved,while the deposition rate decreased.A SiO_2 thick film deposition technique has been developed combining TEOS-PECVD technique with high temperature annealing. 展开更多
关键词 silicon dioxide plasma-enhanced CVD planar waveguide
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Preparation and surface characterization of nanodisk/nanoflower-structured gallium-doped zinc oxide as a catalyst for sensor applications
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作者 R. Jothi Ramalingam T.Radika Hamad A.Al-Lohedan 《Chinese Journal of Catalysis》 SCIE EI CAS CSCD 北大核心 2016年第8期1235-1241,共7页
Nanostructured gallium‐doped zinc oxide (GZO) thin films were fabricated on piezoelectric sub‐strates. The GZO thin films with nanodisk/nanoflower morphologies were prepared by a simple spin‐coating process follo... Nanostructured gallium‐doped zinc oxide (GZO) thin films were fabricated on piezoelectric sub‐strates. The GZO thin films with nanodisk/nanoflower morphologies were prepared by a simple spin‐coating process followed by one‐step hydrothermal treatment. Addition of polymer during hydrothermal treatment resulted in nanodisk and nanoflower morphologies. The morphology, microstructure and chemical composition of thin films prepared under different conditions were examined by field‐emission scanning electron microscopy (FE‐SEM), X‐ray diffraction (XRD) and Raman spectroscopy. The XRD and FE‐SEM investigations confirmed that the GZO nanodisks, na‐norods and nanoflowers formed on the AlN/Si substrates were all wurtzite phase. Green fluorescent protein (GFP) was immobilized on the as‐synthesized GZO nanostructured materials by a dipping process. Atomic force microscopy (AFM) and fluorescence spectroscopy measurements were con‐ducted to confirm the surface binding nature of GFP on the GZO nanostructures to determine their suitability for use in sensor applications and bioimaging techniques. Trace‐level addition of GFP to the GZO nanostructures resulted in a fluorescence response, revealing good activity for ultraviolet light sensor applications. 展开更多
关键词 SEMICONDUCTORS Thin films Sol-gel growth Atomic force microscopy Electrical conductivity Surface property
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