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测定离子注入单晶损伤与应变的双晶(n^v,-n^v)排列方法 被引量:2
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作者 李润身 H.K.Wagenfeld +2 位作者 J.S.Williams Stephen Milkins Andrew Stevenson 《Journal of Semiconductors》 EI CAS CSCD 北大核心 1990年第1期14-19,共6页
依据双晶摇摆曲线的形成原理,提出了一种高分辨率,高灵敏度的测定离子注入单晶损伤与应变的双晶(n^v,—n^v)排列方法。考虑到掠入射情形的色散效应,对掠射角的选择进行了讨论。对Ga注入Si单晶样品的测定证实了(n^v—n^v)排列的优越性,... 依据双晶摇摆曲线的形成原理,提出了一种高分辨率,高灵敏度的测定离子注入单晶损伤与应变的双晶(n^v,—n^v)排列方法。考虑到掠入射情形的色散效应,对掠射角的选择进行了讨论。对Ga注入Si单晶样品的测定证实了(n^v—n^v)排列的优越性,摇摆曲线上得到了未曾见过的细微振荡。 展开更多
关键词 离子注入 单晶损伤 双晶排列法
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测定离子注入单晶损伤与应变的双晶(n^v,—n^v)排列方法
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作者 李润身 《科技通讯(上海船厂)》 1989年第4期41-45,54,共6页
关键词 离子注入 单晶损伤 应变 双晶排列
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Subsurface Damage in the Monocrystal Silicon Grinding on Atomic Scale
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作者 郭晓光 郭东明 +1 位作者 康仁科 金洙吉 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第9期1353-1358,共6页
A molecular dynamics (MD) simulation is carried out to analyze the effect of cutting edge radius,cutdepth, and grinding speed on the depth of subsurface damage layers in monocrystal silicon grinding processes on an ... A molecular dynamics (MD) simulation is carried out to analyze the effect of cutting edge radius,cutdepth, and grinding speed on the depth of subsurface damage layers in monocrystal silicon grinding processes on an atomic scale. The results show that when the cutting edge radius decreases in the nanometric grinding process with the same cut-depth and grinding speed, the depth of the damage layers and the potential energy between the silicon atoms decrease too. Also, when the cut depth increases, both the depth of the damage layers and the potential energy between silicon atoms increase. When the grinding speed is between 20 and 200m/s,the depth of the damage layers does not change much with the increase of the grinding speed under the same cutting edge radius and cut depth conditions. This means that the MD simulation is not sensitive to changes in the grinding speed, and thus increasing the grinding speed properly can shorten the sion,the subsurface damage of monocrystal silicon is silicon atoms, which is verified by the ultra-precision simulation time and enlarge the simulation scale. In conclumainly based on the change of the potential energy between grinding and CMP experiments. 展开更多
关键词 molecular dynamics GRINDING subsurface damage monocrystal silicon
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