用PC机实现卷径检测

利用PC强大的逻辑运算，时序控制和数据处理能力，在冷带轧机上实现全数字卷经检测，预置，提高张力的控制精度。

A method for workpiece surface small-defect detection based on CutMix and YOLOv3

Surface small defects are often missed and incorrectly detected due to their small quantity and unapparent visual features.A method named CSYOLOv3,which is based on CutMix and YOLOv3,is proposed to solve such a problem.First,a four-image CutMix method is used to increase the small-defect quantity,and the process is dynamically adjusted based on the beta distribution.Then,the classic YOLOv3 is improved to detect small defects accurately.The shallow and large feature maps are split,and several of them are merged with the feature maps of the predicted branch to preserve the shallow features.The loss function of YOLOv3 is optimized and weighted to improve the attention to small defects.Finally,this method is used to detect 512×512 pixel images under RTX 2060Ti GPU,which can reach the speed of 14.09 frame/s,and the mAP is 71.80%,which is 5%-10%higher than that of other methods.For small defects below 64×64 pixels,the mAP of the method reaches 64.15%,which is 14%higher than that of YOLOv3-GIoU.The surface defects of the workpiece can be effectively detected by the proposed method,and the performance in detecting small defects is significantly improved.

Wafer bin map inspection based on DenseNet

Wafer bin map(WBM)inspection is a critical approach for evaluating the semiconductor manufacturing process.An excellent inspection algorithm can improve the production efficiency and yield.This paper proposes a WBM defect pattern inspection strategy based on the DenseNet deep learning model,the structure and training loss function are improved according to the characteristics of the WBM.In addition,a constrained mean filtering algorithm is proposed to filter the noise grains.In model prediction,an entropy-based Monte Carlo dropout algorithm is employed to quantify the uncertainty of the model decision.The experimental results show that the recognition ability of the improved DenseNet is better than that of traditional algorithms in terms of typical WBM defect patterns.Analyzing the model uncertainty can not only effectively reduce the miss or false detection rate but also help to identify new patterns.

Neighborhood fusion-based hierarchical parallel feature pyramid network for object detection

In order to improve the detection accuracy of small objects,a neighborhood fusion-based hierarchical parallel feature pyramid network(NFPN)is proposed.Unlike the layer-by-layer structure adopted in the feature pyramid network(FPN)and deconvolutional single shot detector(DSSD),where the bottom layer of the feature pyramid network relies on the top layer,NFPN builds the feature pyramid network with no connections between the upper and lower layers.That is,it only fuses shallow features on similar scales.NFPN is highly portable and can be embedded in many models to further boost performance.Extensive experiments on PASCAL VOC 2007,2012,and COCO datasets demonstrate that the NFPN-based SSD without intricate tricks can exceed the DSSD model in terms of detection accuracy and inference speed,especially for small objects,e.g.,4%to 5%higher mAP(mean average precision)than SSD,and 2%to 3%higher mAP than DSSD.On VOC 2007 test set,the NFPN-based SSD with 300×300 input reaches 79.4%mAP at 34.6 frame/s,and the mAP can raise to 82.9%after using the multi-scale testing strategy.