Bi3.15Nd0.85Ti3O12 （BNT） powder and thin film were prepared by metal organic decomposition （MOD） method. The heat flow curve of BNT powder was measured with a modulated temperature differential scanning calorimete...Bi3.15Nd0.85Ti3O12 （BNT） powder and thin film were prepared by metal organic decomposition （MOD） method. The heat flow curve of BNT powder was measured with a modulated temperature differential scanning calorimeter, and thermal physical parameters such as thermal conductivity coefficient and thermal diffusion coefficient were obtained from the heat flow curve. The phase identification, ferroelectric, and piezoelectric properties of BNT thin film annealed at 700℃ were investigated with X-ray diffractometer, ferroelectric analyzer, and scanning probe microscope. The results show that the thin films consisting of a single phase of bismuth-layered perovskite are polycrystalline, without a preferred orientation. Remnant polarization 2Pr is 63.2 μC/cm2 under 530 kV/cm applied field, and the effective piezoelectric coefficient d33 is 30 pm/V.展开更多
基金Projects(10825209,50872117) supported by the National Natural Science Foundation of ChinaProject([2009]17) supported by Changjiang Scholar Incentive Program,China+2 种基金Project([2007]362) supported by Hunan’s Prestigious Furong Scholar Award,ChinaProject supported by Aid Program for Science and Technology Innovative Research Team in Higher Educational Instituions of Hunan Province,ChinaProject(09JJ7004) supported by the Natural Science Foundation of Hunan Province for Innovation Group,China
文摘Bi3.15Nd0.85Ti3O12 （BNT） powder and thin film were prepared by metal organic decomposition （MOD） method. The heat flow curve of BNT powder was measured with a modulated temperature differential scanning calorimeter, and thermal physical parameters such as thermal conductivity coefficient and thermal diffusion coefficient were obtained from the heat flow curve. The phase identification, ferroelectric, and piezoelectric properties of BNT thin film annealed at 700℃ were investigated with X-ray diffractometer, ferroelectric analyzer, and scanning probe microscope. The results show that the thin films consisting of a single phase of bismuth-layered perovskite are polycrystalline, without a preferred orientation. Remnant polarization 2Pr is 63.2 μC/cm2 under 530 kV/cm applied field, and the effective piezoelectric coefficient d33 is 30 pm/V.
