An improved arc discharge method is developed to fabricate the carbon nanotube probe. In this method, the silicon probe and the carbon nanotube were manipulated under an optical microscope. When the silicon probe and ...An improved arc discharge method is developed to fabricate the carbon nanotube probe. In this method, the silicon probe and the carbon nanotube were manipulated under an optical microscope. When the silicon probe and the carbon nanotube were very close, 30-60 V dc or ae was applied between them, and the carbon nanotube was divided and attached to the end of the silicon probe. Comparing with the arc discharge method, the new method need not coat the silicon probe with metal in advance, which can greatly reduce the fabrication difficulty and cost. The fabricated carbon nanotube probe exhibits the good property of high aspect ratio and can reflect the true topography more accurately than the silicon probe.展开更多
Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versa...Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm.展开更多
Objective cytomorphometric differential diagnostic criteria of breast, thyroid, stomach, and cervical cancer were obtained with the method of atomic force microscopy. Statistically significant increased ratio of the n...Objective cytomorphometric differential diagnostic criteria of breast, thyroid, stomach, and cervical cancer were obtained with the method of atomic force microscopy. Statistically significant increased ratio of the nucleus and the cytoplasm height and the nucleolus and the nucleus height is characteristically for cancer cells compared to normal cells. AFM method allows determining the viral changes in squamous cells by detecting the perinuclear area of enlightenment. AFM allows objectifying immunocytochemistry data by quantifying the height of immune complexes. Possibilities of quantitative immunocytochemistry with AFM are shown in the model of Her2/neu oncoprotein expression in breast cancer and thyroglobulin in papillary thyroid cancer.展开更多
Non-contact atomic force microscopy（nc-AFM） atomic-scale imaging process of monocrystalline silicon surface using capped single-wall carbon nanotube tip is simulated by molecular dynamic method. The simulation resuh...Non-contact atomic force microscopy（nc-AFM） atomic-scale imaging process of monocrystalline silicon surface using capped single-wall carbon nanotube tip is simulated by molecular dynamic method. The simulation resuhs show that the nc-AFM imaging force mainly comes from the C-Si and C-C chemical covalent bonding forces, especially the former, the nonbonding Van der Waals force change is small during the range of stable imaging height. When the tip-surface distance is smaller than the stable imaging height, several neighboring carbon atoms at the tip apex are attracted, and some of them jump onto the sample surface. Finally the tip apex configuration is destroyed with the tip indenting further.展开更多
Silver nanoparticles （Ag-NPs） were prepared using an electrochemical technique. The optical properties were measured by absorption spectroscopy. The dimension of the prepared nanoparticles as estimated by the Atomic...Silver nanoparticles （Ag-NPs） were prepared using an electrochemical technique. The optical properties were measured by absorption spectroscopy. The dimension of the prepared nanoparticles as estimated by the Atomic Force Microscope （AFM）, was 91.57 nm. This reaserch effort proposes a mechanism for reducing the size of silver nanoparticles by adding the hydrogen peroxide （H202）, and protecting the silver nanoparticle to inhibit agglomeration by adding PVP polymer.展开更多
The adhesion between two parallel solid surfaces is of great interest with the rapid development of micro-nano devices and instruments.The adhesion forces between a flat tip with a diameter^1.7μm and some surface hav...The adhesion between two parallel solid surfaces is of great interest with the rapid development of micro-nano devices and instruments.The adhesion forces between a flat tip with a diameter^1.7μm and some surface have been determined by recording the force-displacement curves with an atomic force microscope(AFM).The flat tip is used to prevent wear and mimic the adhesion between two parallel surfaces.The free energy of the solid surface is calculated by the contact angles between the probe liquids and the surface.The adhesion force between parallel solid surfaces cannot be predicted by the theory of thermodynamic surface free energy.The adhesion measurements were carried out under ambient conditions,in a nitrogen-filled glove box,under distilled water,and under potassium chloride(KCl)solution.The outcome shows that the real contact area without the applied load is only a small proportion of the apparent contact area.The measurement stability and repeatability of adhesion by the AFM depend on the surface characterization,measurement methods and the environment.Under different environments,there are different interactions and factors affecting the adhesion force,and the dominant interactions and factors may be different too.The various interactions and factors are mutually coupled to determine the final adhesion force.展开更多
Atomic force microscope （AFM）, as an important instrument in micro/nano operation, has been widely used to measure sampie＇s height information. However, the so called compression effect, due to force aroused from t...Atomic force microscope （AFM）, as an important instrument in micro/nano operation, has been widely used to measure sampie＇s height information. However, the so called compression effect, due to force aroused from the contact of AFM tip with a sample surface, would result in imprecision of the surface＇s height measurement, i.e., the measured height is lower than expected. Up to now, there is not any effective and rapid method to attenuate this kind of measurement error. Thus, in this paper, an algorithm to obtain high accurate height measurement is proposed. Firstly, the concept of force curve is used to analyze the basic principle of the compression effect. Secondly, an automatic compensation method by fusing the height signal and the deflection signal is proposed. The proposed algorithm can also be used to obtain a surface elasticity image. Finally, in order to validate the proposed method, two experiments are conducted with respect to mufti-wall nano-carbon tubes on a silicon substrate and graphemes on a mica substrate.展开更多
Room-temperature ferromagnetism with a Curie temperature higher than 380 K was studied in GaN: Mn thin films grown by metal-organic chemical vapor deposition. By etching artificial microstructures on the GaN: Mn layer...Room-temperature ferromagnetism with a Curie temperature higher than 380 K was studied in GaN: Mn thin films grown by metal-organic chemical vapor deposition. By etching artificial microstructures on the GaN: Mn layer,strong magnetic responses were observed in the magnetic force microscopy (MFM) measurement,which revealed that the films were independent of dopant particles and clusters. Numerical simulation on the data of atomic force microscope (AFM) and MFM measurements covering the whole microstructure validated the formation of long range magnetic order. This result excluded a variety of controversial origins of room-temperature ferromagnetism in the GaN: Mn and gave a strong evidence of our GaN: Mn as the intrinsic diluted magnetic semiconductor (DMS). The forwarded method for accurate characterization of long range magnetic order could be applied to a wide range of DMS and diluted magnetic oxide (DMO) systems.展开更多
基金Sponsored by the National Natural Science Foundation of China(Grant No.50205006)
文摘An improved arc discharge method is developed to fabricate the carbon nanotube probe. In this method, the silicon probe and the carbon nanotube were manipulated under an optical microscope. When the silicon probe and the carbon nanotube were very close, 30-60 V dc or ae was applied between them, and the carbon nanotube was divided and attached to the end of the silicon probe. Comparing with the arc discharge method, the new method need not coat the silicon probe with metal in advance, which can greatly reduce the fabrication difficulty and cost. The fabricated carbon nanotube probe exhibits the good property of high aspect ratio and can reflect the true topography more accurately than the silicon probe.
基金National Institute of Standards(NIS),11211,Egypt。
文摘Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm.
文摘Objective cytomorphometric differential diagnostic criteria of breast, thyroid, stomach, and cervical cancer were obtained with the method of atomic force microscopy. Statistically significant increased ratio of the nucleus and the cytoplasm height and the nucleolus and the nucleus height is characteristically for cancer cells compared to normal cells. AFM method allows determining the viral changes in squamous cells by detecting the perinuclear area of enlightenment. AFM allows objectifying immunocytochemistry data by quantifying the height of immune complexes. Possibilities of quantitative immunocytochemistry with AFM are shown in the model of Her2/neu oncoprotein expression in breast cancer and thyroglobulin in papillary thyroid cancer.
文摘Non-contact atomic force microscopy（nc-AFM） atomic-scale imaging process of monocrystalline silicon surface using capped single-wall carbon nanotube tip is simulated by molecular dynamic method. The simulation resuhs show that the nc-AFM imaging force mainly comes from the C-Si and C-C chemical covalent bonding forces, especially the former, the nonbonding Van der Waals force change is small during the range of stable imaging height. When the tip-surface distance is smaller than the stable imaging height, several neighboring carbon atoms at the tip apex are attracted, and some of them jump onto the sample surface. Finally the tip apex configuration is destroyed with the tip indenting further.
文摘Silver nanoparticles （Ag-NPs） were prepared using an electrochemical technique. The optical properties were measured by absorption spectroscopy. The dimension of the prepared nanoparticles as estimated by the Atomic Force Microscope （AFM）, was 91.57 nm. This reaserch effort proposes a mechanism for reducing the size of silver nanoparticles by adding the hydrogen peroxide （H202）, and protecting the silver nanoparticle to inhibit agglomeration by adding PVP polymer.
基金supported by the National Natural Science Foundation of China(Grant No.51175182)
文摘The adhesion between two parallel solid surfaces is of great interest with the rapid development of micro-nano devices and instruments.The adhesion forces between a flat tip with a diameter^1.7μm and some surface have been determined by recording the force-displacement curves with an atomic force microscope(AFM).The flat tip is used to prevent wear and mimic the adhesion between two parallel surfaces.The free energy of the solid surface is calculated by the contact angles between the probe liquids and the surface.The adhesion force between parallel solid surfaces cannot be predicted by the theory of thermodynamic surface free energy.The adhesion measurements were carried out under ambient conditions,in a nitrogen-filled glove box,under distilled water,and under potassium chloride(KCl)solution.The outcome shows that the real contact area without the applied load is only a small proportion of the apparent contact area.The measurement stability and repeatability of adhesion by the AFM depend on the surface characterization,measurement methods and the environment.Under different environments,there are different interactions and factors affecting the adhesion force,and the dominant interactions and factors may be different too.The various interactions and factors are mutually coupled to determine the final adhesion force.
基金supported by the CAS FEA International Partnership Program for Creative Research Teams
文摘Atomic force microscope （AFM）, as an important instrument in micro/nano operation, has been widely used to measure sampie＇s height information. However, the so called compression effect, due to force aroused from the contact of AFM tip with a sample surface, would result in imprecision of the surface＇s height measurement, i.e., the measured height is lower than expected. Up to now, there is not any effective and rapid method to attenuate this kind of measurement error. Thus, in this paper, an algorithm to obtain high accurate height measurement is proposed. Firstly, the concept of force curve is used to analyze the basic principle of the compression effect. Secondly, an automatic compensation method by fusing the height signal and the deflection signal is proposed. The proposed algorithm can also be used to obtain a surface elasticity image. Finally, in order to validate the proposed method, two experiments are conducted with respect to mufti-wall nano-carbon tubes on a silicon substrate and graphemes on a mica substrate.
基金supported by the National Natural Science Foundation of China (Grant Nos.60577030,60776041,60876035)the National Key Basic Research Special Foundation of China (Grant Nos.TG2007CB307004,2006CB921607)
文摘Room-temperature ferromagnetism with a Curie temperature higher than 380 K was studied in GaN: Mn thin films grown by metal-organic chemical vapor deposition. By etching artificial microstructures on the GaN: Mn layer,strong magnetic responses were observed in the magnetic force microscopy (MFM) measurement,which revealed that the films were independent of dopant particles and clusters. Numerical simulation on the data of atomic force microscope (AFM) and MFM measurements covering the whole microstructure validated the formation of long range magnetic order. This result excluded a variety of controversial origins of room-temperature ferromagnetism in the GaN: Mn and gave a strong evidence of our GaN: Mn as the intrinsic diluted magnetic semiconductor (DMS). The forwarded method for accurate characterization of long range magnetic order could be applied to a wide range of DMS and diluted magnetic oxide (DMO) systems.
