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Nanoindentation tests on single crystal copper thin film with an AFM 被引量:4
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作者 霍德鸿 梁迎春 +1 位作者 程凯 董申 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2003年第4期408-412,共5页
Nanoindentation tests performed in a commercial atomic force microscope have been utilized to directly measure the elastic modulus and the hardness of single crystal copper thin films fabricated by the vacuum vapor de... Nanoindentation tests performed in a commercial atomic force microscope have been utilized to directly measure the elastic modulus and the hardness of single crystal copper thin films fabricated by the vacuum vapor deposition technique. Nanoindentation tests were conducted at various indentation depths to study the effect of indentation depths on the mechanical properties of thin films. The results were interpreted by using the Oliver-Pharr method with which direct observation and measurement of the contact area are not required. The elastic modulus of the single crystal copper film at various indentation depths was determined as (67.0±(6.9) GPa) on average which is in reasonable agreement with the results reported in literature. The indentation hardness constantly increases with decreasing indentation depth, indicating a strong size effect. 展开更多
关键词 单晶铜薄膜 AFM 纳米压痕测试 真空气相沉积 原子压力显微镜
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Atomic force microscopy observation on nuclear reassembly in a cell-free system
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作者 YANGNing CHENZhongcai +3 位作者 ZHANGZhaohui ZHUXing ZHAIZhonghe TANGXiaowei 《Chinese Science Bulletin》 SCIE EI CAS 2003年第21期2284-2287,共4页
Cell-free system is interesting and useful for studying nuclear assembly in mitosis. Atomic force micro- scopy (AFM), which is a simple way for imaging fixed reas-semble nuclei with high resolution, has not been used ... Cell-free system is interesting and useful for studying nuclear assembly in mitosis. Atomic force micro- scopy (AFM), which is a simple way for imaging fixed reas-semble nuclei with high resolution, has not been used in the cell-free system. In this paper, we put forward an air-drying sample preparation for AFM. Using AFM, we observed nu-clear reassembly process within 100 nm resolution in a cell-free system. As a result, we found that the images were artifact-free, and with higher resolution compared with fluo-rescent optical microscope images. Furthermore, the mor-phology of membrane vesicles was obtained clearly, and a dynamic change of morphology during the vesicles?ap-proaching to nuclear envelope was also observed, which is enlightened to understand the mechanism of nuclear enve-lope assembly. 展开更多
关键词 AFM 原子压力显微镜 有丝分裂 细胞核重组
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