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A study of specific interaction of the transcription factor and the DNA element by atomic force microscopy 被引量:4
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作者 QINFeng JIANGYaxin +4 位作者 MAXinyong CHENFeng FANGXiaohong BAIChunli LIYiqin 《Chinese Science Bulletin》 SCIE EI CAS 2004年第13期1376-1380,共5页
Atomic force microscopy (AFM) was employed to quantitatively detect the interaction between a transcription factor, ZmDREBIA, and its target DNA sequence (DRE).The specificity of the interaction was revealed by compar... Atomic force microscopy (AFM) was employed to quantitatively detect the interaction between a transcription factor, ZmDREBIA, and its target DNA sequence (DRE).The specificity of the interaction was revealed by comparing the binding probability of ZmDREBIA to DRE element with core sequence ACCGAC and to the ERE element with core sequence AGCCGCC. Moreover, the single-molecular unbinding force between ZmDREBIA and DRE element was determined using Poisson statistical method to be 99±9 pN.The results indicated that AFM could serve as a sensitive and reliable technique to probe the interaction properties of the transcription factor and DNA element at single-molecular level, thus indicating that AFM is advantageous over the traditional methods, such as the electrophoretic mobility shift assay, regarding to the functional analysis of transcription factors. 展开更多
关键词 转录因子 DNA 原子增强显微镜方法 AFM ZmDREBIA 转基因作物 玉米
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