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离散坐标方法在反射层参数计算中的应用研究
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作者 陈长 肖锋 《科技视界》 2017年第18期150-151,共2页
本文介绍离散坐标方法在堆芯反射层参数计算中的应用研究。针对使用TPFAP程序近似计算反射层参数的情况,利用二维离散坐标法程序DOT的输运计算模块替换了TPFAP程序内的穿透几率法子程序TPXY,开发了反射层参数计算程序TPREF。TPREF程序... 本文介绍离散坐标方法在堆芯反射层参数计算中的应用研究。针对使用TPFAP程序近似计算反射层参数的情况,利用二维离散坐标法程序DOT的输运计算模块替换了TPFAP程序内的穿透几率法子程序TPXY,开发了反射层参数计算程序TPREF。TPREF程序计算得到的反射层参数与TPFAP程序较为接近,表明程序开发是正确的。 展开更多
关键词 离散坐标方法 反射层参数
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Application of 3D stereotomography to the deep-sea data acquired in the South China Sea:a tomography inversion case 被引量:2
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作者 邢逢源 杨锴 +2 位作者 薛冬 汪小将 陈宝书 《Applied Geophysics》 SCIE CSCD 2017年第1期142-153,191,192,共14页
A 3D stereotomography algorithm, which is derived from the 3D Cartesian coordinate, is applied for the first time to the deep-sea data acquired in the LH area, South China Sea, to invert a macro velocity model for pre... A 3D stereotomography algorithm, which is derived from the 3D Cartesian coordinate, is applied for the first time to the deep-sea data acquired in the LH area, South China Sea, to invert a macro velocity model for pre-stack depth migration. The successful implementation of stereotomography is highly dependent on the correct extraction of slowness components and the proper application of regularization terms. With the help of the structure tensor algorithm, a high-quality 3D stereotomography data space is achieved in a very efficient manner. Then, considering that the horizontal slowness in cross-line direction is usually unavailable for 3D narrow-azimuth data, the regularization terms must be enhanced to guarantee a stable convergence of the presented algorithm. The inverted model serves as a good model for the 3D pre-stack depth migration. The synthetic and real data examples demonstrated the robustness and effectiveness of the presented algorithm and the related schemes. 展开更多
关键词 3D stereotomography structure tensor extraction of horizontal components of slowness REGULARIZATION
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Investigation of nanometer-scale films using low angle Xray reflectivity analysis in IPOE 被引量:1
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作者 WANG Zhan-shan XU Yao WANG Hong-chang ZHU Jing-tao ZHANG Zhong WANG Feng-li CHEN Ling-yan 《Optoelectronics Letters》 EI 2007年第2期88-90,共3页
The X-ray low angle reflectivity measurement is used to investigate single and bilayer films to determine the parameters of nanometer-scale structures,three effectual methods are presented by using X-ray reflectivity ... The X-ray low angle reflectivity measurement is used to investigate single and bilayer films to determine the parameters of nanometer-scale structures,three effectual methods are presented by using X-ray reflectivity analysis to provide an accurate estimation of the nanometer film structures. The parameters of tungsten (W) single layer, such as the material density, interface roughness and deposition rate, were obtained easily and speedily. The base metal layer was introduced to measure the profiles of single low Z material film. A 0.3 nm chromium (Cr) film was also studied by low angle reflectivity analysis. 展开更多
关键词 IPOE 纳米级薄膜 X线反射率分析 多层结构 参数
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