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可视紫外分光技术及其应用
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作者 贾正根 《应用光学》 CAS CSCD 1997年第6期17-21,共5页
介绍可视紫外分光技术、分光装置及可视紫外分光技术的各种应用。
关键词 分光光度计 检出器 分光器 反射格子 紫外
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P-type AlAs/[GaAs/AlAs] Semiconductor/Superlattice DBR Grown by MBE
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作者 YANChang-ling ZHONGJing-chang 《Semiconductor Photonics and Technology》 CAS 2001年第1期8-12,41,共6页
A p-type AlAs(70.2 nm)/16.5 period [GaAs(3 nm)/AlAs(0.7 nm)] semiconductor/superlatice distributed Bragg reflector (DBR) has been grown on n +-GaAs(100) substrate by V80H molecular beam epitaxy system. Experimental re... A p-type AlAs(70.2 nm)/16.5 period [GaAs(3 nm)/AlAs(0.7 nm)] semiconductor/superlatice distributed Bragg reflector (DBR) has been grown on n +-GaAs(100) substrate by V80H molecular beam epitaxy system. Experimental reflection spectrum shows that its central wavelength is 820 nm, with the peak reflectivity for 10-pair DBR of as high as 96 %, and the reflection bandwidth of as wide as 90 nm. We formed a 20×20 μm 2 square mesa to measure the series resistance using wet chemical etching. From the measurement result, the series resistance of about 50 Ω is obtained at a moderate doping (3×10 18 cm -3 ). Finally, the dependence of the resistance of the DBR on the temperature is analyzed. From the experimental result, it is found that the mechanism of the low series resistance of this kind of DBR may increase the tunneling current in the semiconductor/superlattice mirror structure, which will result in a decrease in series resistance. 展开更多
关键词 Distributed Bragg reflector SUPERLATTICE Reflection spectrum Series resistance Molecular beam epitaxy
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Optical characteristics and environmental pollutants detection of porous silicon microcavities
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作者 HUANG JianFeng, LI Sha, CHEN QingWei & CAI LinTao CAS Key Laboratory of Health Informatics Shenzhen Key Laboratory of Cancer Nanotechnology Institute of Biomedical and Health Engineering, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China 《Science China Chemistry》 SCIE EI CAS 2011年第8期1348-1356,共9页
Porous silicon microcavities (PSM) optical crystals consisting of a Fabry-Perot microcavity embedded between two distributed Bragg reflectors have been fabricated by electrochemical etching. Scanning electron microsco... Porous silicon microcavities (PSM) optical crystals consisting of a Fabry-Perot microcavity embedded between two distributed Bragg reflectors have been fabricated by electrochemical etching. Scanning electron microscopy (SEM) clearly depicted their physical sandwich construction. The optical feature of the PSM structure was tuned by varying the anodization parameters. Through proper thermal oxidation and surface chemical modifications, the resulting structures were employed as optical sensors for the detection of environmental pollutants including volatile organic vapors (i.e. acetonitrile, toluene, cyclohexane, chloroform, acetone and ethanol) and interior decoration gases (i.e. toluene, ammonia and formaldehyde). Fourier transform infrared spectroscopy (FTIR) spectra confirmed the effective thermal annealing and surface modification chemistry, and the sensing process was accompanied by recording the modified structures' optical responses when exposed to target analytes. The PSM optical sensors showed good stability, sensitivity and selectivity, implying promising applications in gas sensing and en- vironmental monitoring. 展开更多
关键词 porous silicon microcavity optical sensor thermal oxidation surface modification environmental pollutants detection
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