The new method of measuring the ratio of thermal emission rate to the photoexcitation constant is presented. The temperature dependence of the ratio for Cr:GaAs is calculated by using the previously published data of ...The new method of measuring the ratio of thermal emission rate to the photoexcitation constant is presented. The temperature dependence of the ratio for Cr:GaAs is calculated by using the previously published data of two-wave mixing. Results show that the calculating data and previous phenomenological theoretic ones coincide with each other very well.展开更多
One of the most important electron density diagnostics, microwave reflectometry, has been developed on many large and medium nuclear fusion devices in recent years . Not only the electron density profiles with high te...One of the most important electron density diagnostics, microwave reflectometry, has been developed on many large and medium nuclear fusion devices in recent years . Not only the electron density profiles with high temporal and spatial resolutions, but also the profiles of plasma rotation and turbulence can be obtained with this diagnostic system.展开更多
文摘The new method of measuring the ratio of thermal emission rate to the photoexcitation constant is presented. The temperature dependence of the ratio for Cr:GaAs is calculated by using the previously published data of two-wave mixing. Results show that the calculating data and previous phenomenological theoretic ones coincide with each other very well.
文摘One of the most important electron density diagnostics, microwave reflectometry, has been developed on many large and medium nuclear fusion devices in recent years . Not only the electron density profiles with high temporal and spatial resolutions, but also the profiles of plasma rotation and turbulence can be obtained with this diagnostic system.