The circuit testable realization and its fault detection for logic functions with ESOP （EXOR-Sum-Of-Products） expressions are studied. First of all, for the testable realization by using XOR gate cascade, a test set...The circuit testable realization and its fault detection for logic functions with ESOP （EXOR-Sum-Of-Products） expressions are studied. First of all, for the testable realization by using XOR gate cascade, a test set with 2n ＋ m ＋ 1 vectors for the detections of AND bridging faults and a test set with 2n ＋ m vectors for the detections of OR bridging faults are presented. Secondly, for the testable realization by using ）（OR gate tree, a test set with 2n ＋ m vectors for the detections of AND bridging faults and a test set with 3n ＋ m ＋ 1 vectors for the detections of OR bridging faults are presented. Finally, a single fault test set with n ＋ 5 vectors for the XOR gate tree realization is presented. Where n is the number of input variables and m is the number of product terms in a logic function.展开更多
We prove that for any p perfect set of positive measure and for it＇s any density point x0 one can construct a measurable function f（x）, bounded on [0,1）, such that each measurable and bounded function, which coinc...We prove that for any p perfect set of positive measure and for it＇s any density point x0 one can construct a measurable function f（x）, bounded on [0,1）, such that each measurable and bounded function, which coincides with f（x） on the set p has diverging Fourier-Walsh series on the point xo.展开更多
基金Supported by the National Natural Science Foundation of China (No.60006002)the Education Department of Guangdong Province of China (No.02019).
文摘The circuit testable realization and its fault detection for logic functions with ESOP （EXOR-Sum-Of-Products） expressions are studied. First of all, for the testable realization by using XOR gate cascade, a test set with 2n ＋ m ＋ 1 vectors for the detections of AND bridging faults and a test set with 2n ＋ m vectors for the detections of OR bridging faults are presented. Secondly, for the testable realization by using ）（OR gate tree, a test set with 2n ＋ m vectors for the detections of AND bridging faults and a test set with 3n ＋ m ＋ 1 vectors for the detections of OR bridging faults are presented. Finally, a single fault test set with n ＋ 5 vectors for the XOR gate tree realization is presented. Where n is the number of input variables and m is the number of product terms in a logic function.
文摘We prove that for any p perfect set of positive measure and for it＇s any density point x0 one can construct a measurable function f（x）, bounded on [0,1）, such that each measurable and bounded function, which coincides with f（x） on the set p has diverging Fourier-Walsh series on the point xo.
