Based on Pomeron exchange model, J/ψ and φ production in electro-proton interaction are investigated with both linear and non-linear Pomeron trajectory. The experimental differential cross sections measured as a fun...Based on Pomeron exchange model, J/ψ and φ production in electro-proton interaction are investigated with both linear and non-linear Pomeron trajectory. The experimental differential cross sections measured as a function of the kinematic variable Q^2,W and t are reproduced successfully in the model. Our conclusions are that the Pomeron exchange model is a successful description of J/ψ and φ electro-productions on the proton, and that the linear trajectory is a good approximation to non-linearity of the Pomeron trajectory.展开更多
In this paper, the optical characteristics of new type hemispherical grid subwavelength grating are studied by using multi-level column structure approximation and rigorous coupled-wave analysis. This kind of grating ...In this paper, the optical characteristics of new type hemispherical grid subwavelength grating are studied by using multi-level column structure approximation and rigorous coupled-wave analysis. This kind of grating could be fabricated by chemical methods, thus simplifying the fab-rication technology of subwavelength gratings for visible light. By computer simulation and calculation, the hemi-spherical grid subwavelength gratings are proved to have antireflective characteristics. Two design schemes of this kind of grating are presented. In the first scheme, the grating could achieve a reflectivity as low as 3.4416×10?7, which can be adapted to 0.46―0.7 μm of visible waveband and ±12° incident angle field. In the second scheme, the grating can achieve a reflectivity as low as 3.112×10?4 and adapted to the whole visible waveband and ±23° incident angle field. The application field of the latter scheme is wider than that of the former. The results of this paper could provide reference for the applications of the hemispherical grid subwavelength gratings for the visible waveband.展开更多
AlN films with preferred c-axis orientation are deposited on Si substrates using the radio frequency(RF) magnetron sputtering method.The post-processing is carried out under the cooling conditions including high vacuu...AlN films with preferred c-axis orientation are deposited on Si substrates using the radio frequency(RF) magnetron sputtering method.The post-processing is carried out under the cooling conditions including high vacuum,low vacuum under deposition gas ambient and low vacuum under dynamic N2 ambient.Structures and morphologies of the films are analyzed by X-ray diffraction(XRD) and atomic force microscopy(AFM).The hardness and Young's modulus are investigated by the nanoindenter.The experimental results indicate that the(100) and(110) peak intensities decrease in the XRD spectra and the root-mean-square of roughness(Rrms) of the film decreases gradually with the increase of the cooling rate.The maximum values of the hardness and Young modulus are obtained by cooling in low vacuum under deposition gas ambient.The reason for orientation variation of the films is explained from the perspective of the Al-N bond formation.展开更多
基金The project supported in part by National Natural Science Foundation of China under Grant Nos. 10565001, 10647002 and the Natural Science Foundation of Guangxi under Grant No. 0481030, 0542042, and 0575020, Guangxi University under Grant No. X051001, and Guangxi University of Technology under Grant No. 05006
文摘Based on Pomeron exchange model, J/ψ and φ production in electro-proton interaction are investigated with both linear and non-linear Pomeron trajectory. The experimental differential cross sections measured as a function of the kinematic variable Q^2,W and t are reproduced successfully in the model. Our conclusions are that the Pomeron exchange model is a successful description of J/ψ and φ electro-productions on the proton, and that the linear trajectory is a good approximation to non-linearity of the Pomeron trajectory.
文摘In this paper, the optical characteristics of new type hemispherical grid subwavelength grating are studied by using multi-level column structure approximation and rigorous coupled-wave analysis. This kind of grating could be fabricated by chemical methods, thus simplifying the fab-rication technology of subwavelength gratings for visible light. By computer simulation and calculation, the hemi-spherical grid subwavelength gratings are proved to have antireflective characteristics. Two design schemes of this kind of grating are presented. In the first scheme, the grating could achieve a reflectivity as low as 3.4416×10?7, which can be adapted to 0.46―0.7 μm of visible waveband and ±12° incident angle field. In the second scheme, the grating can achieve a reflectivity as low as 3.112×10?4 and adapted to the whole visible waveband and ±23° incident angle field. The application field of the latter scheme is wider than that of the former. The results of this paper could provide reference for the applications of the hemispherical grid subwavelength gratings for the visible waveband.
基金supported by the National Natural Science Foundation of China (No.50972105)Tianjin Natural Science Foundation (Nos.09JCZDJC16500,08JCZDJC22700 and 10SYSYJC27700)
文摘AlN films with preferred c-axis orientation are deposited on Si substrates using the radio frequency(RF) magnetron sputtering method.The post-processing is carried out under the cooling conditions including high vacuum,low vacuum under deposition gas ambient and low vacuum under dynamic N2 ambient.Structures and morphologies of the films are analyzed by X-ray diffraction(XRD) and atomic force microscopy(AFM).The hardness and Young's modulus are investigated by the nanoindenter.The experimental results indicate that the(100) and(110) peak intensities decrease in the XRD spectra and the root-mean-square of roughness(Rrms) of the film decreases gradually with the increase of the cooling rate.The maximum values of the hardness and Young modulus are obtained by cooling in low vacuum under deposition gas ambient.The reason for orientation variation of the films is explained from the perspective of the Al-N bond formation.