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J/ψ and φ Electro-production in Pomeron Exchange Model
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作者 LIU Bao-Rong ZHOU Li-Juan +3 位作者 MA Wei-Xing TAN Zhen-Qiang GU Yun-Ting HE Xiao-Rong 《Communications in Theoretical Physics》 SCIE CAS CSCD 2007年第2X期326-330,共5页
Based on Pomeron exchange model, J/ψ and φ production in electro-proton interaction are investigated with both linear and non-linear Pomeron trajectory. The experimental differential cross sections measured as a fun... Based on Pomeron exchange model, J/ψ and φ production in electro-proton interaction are investigated with both linear and non-linear Pomeron trajectory. The experimental differential cross sections measured as a function of the kinematic variable Q^2,W and t are reproduced successfully in the model. Our conclusions are that the Pomeron exchange model is a successful description of J/ψ and φ electro-productions on the proton, and that the linear trajectory is a good approximation to non-linearity of the Pomeron trajectory. 展开更多
关键词 vector meson electro-production diffractive process Pomeron exchange model
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Antireflective characteristics of hemispherical grid grating
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作者 RENZhibin JIANGHuilin +1 位作者 LIUGuojun SUNQiang 《Chinese Science Bulletin》 SCIE EI CAS 2005年第13期1309-1314,共6页
In this paper, the optical characteristics of new type hemispherical grid subwavelength grating are studied by using multi-level column structure approximation and rigorous coupled-wave analysis. This kind of grating ... In this paper, the optical characteristics of new type hemispherical grid subwavelength grating are studied by using multi-level column structure approximation and rigorous coupled-wave analysis. This kind of grating could be fabricated by chemical methods, thus simplifying the fab-rication technology of subwavelength gratings for visible light. By computer simulation and calculation, the hemi-spherical grid subwavelength gratings are proved to have antireflective characteristics. Two design schemes of this kind of grating are presented. In the first scheme, the grating could achieve a reflectivity as low as 3.4416×10?7, which can be adapted to 0.46―0.7 μm of visible waveband and ±12° incident angle field. In the second scheme, the grating can achieve a reflectivity as low as 3.112×10?4 and adapted to the whole visible waveband and ±23° incident angle field. The application field of the latter scheme is wider than that of the former. The results of this paper could provide reference for the applications of the hemispherical grid subwavelength gratings for the visible waveband. 展开更多
关键词 半球格子栅 连续波 抗反射 向量衍射
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Impact of cooling condition on the crystal structure and surface quality of preferred c-axis-oriented AlN films for SAW devices 被引量:2
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作者 张庚宇 杨保和 +2 位作者 赵健 李翠平 李明吉 《Optoelectronics Letters》 EI 2011年第4期273-276,共4页
AlN films with preferred c-axis orientation are deposited on Si substrates using the radio frequency(RF) magnetron sputtering method.The post-processing is carried out under the cooling conditions including high vacuu... AlN films with preferred c-axis orientation are deposited on Si substrates using the radio frequency(RF) magnetron sputtering method.The post-processing is carried out under the cooling conditions including high vacuum,low vacuum under deposition gas ambient and low vacuum under dynamic N2 ambient.Structures and morphologies of the films are analyzed by X-ray diffraction(XRD) and atomic force microscopy(AFM).The hardness and Young's modulus are investigated by the nanoindenter.The experimental results indicate that the(100) and(110) peak intensities decrease in the XRD spectra and the root-mean-square of roughness(Rrms) of the film decreases gradually with the increase of the cooling rate.The maximum values of the hardness and Young modulus are obtained by cooling in low vacuum under deposition gas ambient.The reason for orientation variation of the films is explained from the perspective of the Al-N bond formation. 展开更多
关键词 Acoustic surface wave devices Atomic force microscopy Crystal atomic structure Crystal orientation Elastic moduli ELASTICITY HARDNESS Magnetron sputtering Surface structure VACUUM X ray diffraction
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