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An Improvement on Si-etching Tetramethyl Ammonium Hydroxide Solution
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作者 杨笛 余金中 +2 位作者 陈少武 樊中朝 李运涛 《Chinese Journal of Chemical Engineering》 SCIE EI CAS CSCD 2005年第1期48-50,共3页
An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (NH4)2S208, was achieved in this paper. For this etching solution, the etching rates o... An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (NH4)2S208, was achieved in this paper. For this etching solution, the etching rates of silicon and silicon dioxide were about 1.1μm.min^-1 and 0.5 nm.min^-1, respectively. The etching ratio between (100) and (111) planes was about 34:1, and the etched surface was very smooth. 展开更多
关键词 硅氧 四甲基铵羟化物 蚀刻技术 光学设备 加工技术
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