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苏南某些水稻土中Cu Pb Hg As的剖面分布及其影响因素 被引量:26
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作者 刘洪莲 李恋卿 潘根兴 《农业环境科学学报》 CAS CSCD 北大核心 2006年第5期1221-1227,共7页
采用田间深度间隔采样法,分析了苏南6个处于不同环境影响下的水稻土剖面中Cu、Pb、As和Hg全量深度分布。结果表明,4种元素在土壤剖面中的移动能力均较差;在工业环境下田块的土壤中的Hg、Cu、Pb的表层富集和垂直分异较为明显,而在非工业... 采用田间深度间隔采样法,分析了苏南6个处于不同环境影响下的水稻土剖面中Cu、Pb、As和Hg全量深度分布。结果表明,4种元素在土壤剖面中的移动能力均较差;在工业环境下田块的土壤中的Hg、Cu、Pb的表层富集和垂直分异较为明显,而在非工业环境下,重金属纵向分异不明显;个别田块存在较严重的As污染,耕层As达56.93 mg.kg-1,超出国家土壤环境质量二级标准;重金属元素在稻田土壤中表层富集系数大于果园利用下的旱地土壤。工业化进程中污染物的输入是影响供试土壤中重金属元素含量的主导因素,土壤的基本性质也在一定程度上影响了重金属的纵向迁移。重金属剖面分布特征可以在一定程度上反映水稻土的重金属污染积累程度。 展开更多
关键词 水稻土 土壤污染 重金属 剖面分布 垂直移动性
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Control of Pinhole Defects Formation in Semi-flexible Coaxial Cable by Vertical Tin-Plating Process 被引量:4
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作者 程方杰 肖鑫 +2 位作者 孙贵铮 杨立军 张凤玉 《Transactions of Tianjin University》 EI CAS 2011年第5期320-323,共4页
Holistic tin-plating on the outer conductor is one of the key processes in the manufacture of semi-flexible coaxial cable, which is widely applied to the third generation (3G) mobile communication system. However, in ... Holistic tin-plating on the outer conductor is one of the key processes in the manufacture of semi-flexible coaxial cable, which is widely applied to the third generation (3G) mobile communication system. However, in the traditional horizontal tin-plating process, disadvantages such as the pinhole defects and low productivity effect cannot be avoided. In this paper, a vertical tin-plating process was proposed to reduce the pinhole defects and improve the tincoating quality. Compared with the traditional horizontal tin-plating process, the immersion length was reduced from 300-400 mm to 10-100 mm and the tin-plating time was reduced from 7 s to 3 s in the proposed method. The experimental results indicate that immersion length and time are key parameters for the tin-plating quality. With this new tin-plating process, the experimental results show that the pinhole defects can be eliminated effectively by controlling the immersion depth below 100 mm and tin-plating time at 3 s. The thickness of tin-coating increased from not more than 5 μm to 12.3 μm with the proposed vertical tin-plating process. Meanwhile, the thickness of the intermetallic compounds (IMCs) layer between the tin-coating and copper wires was reduced from 3.26 μm to 0.62 μm if the immersion time decreased from 30 s to 1 s. Besides, a self-developed flux, which possesses a boiling point or decomposed temperature of active components over 300℃, exhibits a better efficiency in reducing the pinhole formation. 展开更多
关键词 3G communication network semi-flexible coaxial cable vertical tin-plating pinhole defect
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