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Multiple dependent reliability estimation of large range MEMS accelerometers in high temperature environment
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作者 QIN Li HE Cheng +2 位作者 YU Li-xia WANG Wei QIN Li-jun 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2019年第1期9-15,共7页
In the past,only one performance parameter was considered in the reliability estimation of micro-electro-mechanical system (MEMS) accelerometers,resulting in a one-sided reliability evaluation. Aiming at the failure c... In the past,only one performance parameter was considered in the reliability estimation of micro-electro-mechanical system (MEMS) accelerometers,resulting in a one-sided reliability evaluation. Aiming at the failure condition of large range MEMS accelerometers in high temperature environment,the corresponding accelerated degradation test is designed. According to the degradation condition of zero bias and scale factor,multiple dependent reliability estimation of large range MEMS accelerometers is carried out. The results show that the multiple dependent reliability estimation of the large range MEMS accelerometers can improve the accuracy of the estimation and get more accurate results. 展开更多
关键词 large range MEMS accelerometers zero bias scale factor multiple dependent reliability estimation accelerated degradation test
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