O484.5 99063794测量多层薄膜材料复介电系数的准光腔技术=Openresonator technique for measuring the complexpermittivity of multilayer thin film materials[刊,中]/王守军,胡乐乐,徐得名(上海大学通信工程系.上海(201800))∥电子...O484.5 99063794测量多层薄膜材料复介电系数的准光腔技术=Openresonator technique for measuring the complexpermittivity of multilayer thin film materials[刊,中]/王守军,胡乐乐,徐得名(上海大学通信工程系.上海(201800))∥电子学报.—1998,26(5).—30—33,59提出用准光腔测量薄膜材料复介电系数的新技术。展开更多
文摘O484.5 99063794测量多层薄膜材料复介电系数的准光腔技术=Openresonator technique for measuring the complexpermittivity of multilayer thin film materials[刊,中]/王守军,胡乐乐,徐得名(上海大学通信工程系.上海(201800))∥电子学报.—1998,26(5).—30—33,59提出用准光腔测量薄膜材料复介电系数的新技术。