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Cost-effective test solutions for smart card and other integrated flash applications
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作者 Thomas M.Trexler 《半导体技术》 CAS CSCD 北大核心 2004年第6期49-51,67,共3页
关键词 智能卡 闪存 多电测试 测试成本
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Design of cable tester based on multi-thread parallel testing technology
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作者 WEN feng YUAN Xiao hang +2 位作者 DING Zhi zhao WANG Xiao li ZHEN Guo yong 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2018年第3期214-218,共5页
In order to realize the efficiency, reliability and safety tests on the complex cable network of an electronic system, an efficient cable network resistance tester is designed. Firstly, the design background and hardw... In order to realize the efficiency, reliability and safety tests on the complex cable network of an electronic system, an efficient cable network resistance tester is designed. Firstly, the design background and hardware structure are briefly described. Then aiming at the multi task parallelism considering real time measurement of parameters and real time control of the system in the tester testing, a real time muhi task control software is developed by using multi thread testing technology in parallel test to realize multi task complex control. Finally, the least squares method is used to improve the test accuracyof the tester. The test results show that the test error is basically within 0.3%, and the test speed can reach 345 point/min. 展开更多
关键词 cable tester multi thread parallel least square method
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