In order to establish a new method for measuring the dimensions of coarse aggregates, five different-size flat and elongated (F&E) coarse aggregates were glued into two specimens by epoxy resin, respectively, and ...In order to establish a new method for measuring the dimensions of coarse aggregates, five different-size flat and elongated (F&E) coarse aggregates were glued into two specimens by epoxy resin, respectively, and slice images were obtained by X-ray CT, then the aggregates were extracted by the fuzzy c-means clustering algorithm. Attributions of the particle on different cross-sections were determined by the ‘overlap area method’. And unified three-dimensional Cartesian coordinate system was established based on continuous slice images. The coefficient values of spherical harmonics descriptor representing particles surface profile were gained, then each scanned particle was represented by 60×120 discrete points conformably with spherical harmonics descriptor. The chord length and direction angles were determined by the calculation. With the major axis (L) and orthogonal axis (W and T), the calculated results were compared with those measured by caliper. It is concluded that the new L, W, and T dimension measuring method is able to take the place of the present manual measurement.展开更多
ITO （indium tin oxide） thin films were deposited onto glass substrates by RF （radio frequency） magnetron sputtering to study variation of grain growth in pure argon and 99% argon plus 1% oxygen at different substr...ITO （indium tin oxide） thin films were deposited onto glass substrates by RF （radio frequency） magnetron sputtering to study variation of grain growth in pure argon and 99% argon plus 1% oxygen at different substrate temperatures. The average grain size increased with the increasing substrate temperature in pure argon. However, in oxygen presence environment the grain growth is limited at above 150 ℃. The films optoelectronic properties were evaluated. It was found that 200 nm ITO films prepared at 220 ℃ substrate temperature in pure argon possessed optimum sheet resistance of 10 Ω/sq. The transmittance oflTO films was enhanced with increasing the substrate temperature in pure argon but limited by the presence of excess oxygen.展开更多
基金Project(51038004) supported by the National Natural Science Foundation of ChinaProject(2009318000078) supported by the Western China Communications Construction and Technology Program, China
文摘In order to establish a new method for measuring the dimensions of coarse aggregates, five different-size flat and elongated (F&E) coarse aggregates were glued into two specimens by epoxy resin, respectively, and slice images were obtained by X-ray CT, then the aggregates were extracted by the fuzzy c-means clustering algorithm. Attributions of the particle on different cross-sections were determined by the ‘overlap area method’. And unified three-dimensional Cartesian coordinate system was established based on continuous slice images. The coefficient values of spherical harmonics descriptor representing particles surface profile were gained, then each scanned particle was represented by 60×120 discrete points conformably with spherical harmonics descriptor. The chord length and direction angles were determined by the calculation. With the major axis (L) and orthogonal axis (W and T), the calculated results were compared with those measured by caliper. It is concluded that the new L, W, and T dimension measuring method is able to take the place of the present manual measurement.
基金Acknowledgement The authors would like to thank Dr. Q. Qiao and V. Swaminathan for providing AFM measurements. This work has been supported by National Science Foundation/EPSCoR Grant No. 0903804 and by the State of South Dakota. Also acknowledged are National Science Foundation Grant No.IIP-1248454, South Dakota Performance Improvement Funds, and SDSU Research Scholarship Support Fund.
文摘ITO （indium tin oxide） thin films were deposited onto glass substrates by RF （radio frequency） magnetron sputtering to study variation of grain growth in pure argon and 99% argon plus 1% oxygen at different substrate temperatures. The average grain size increased with the increasing substrate temperature in pure argon. However, in oxygen presence environment the grain growth is limited at above 150 ℃. The films optoelectronic properties were evaluated. It was found that 200 nm ITO films prepared at 220 ℃ substrate temperature in pure argon possessed optimum sheet resistance of 10 Ω/sq. The transmittance oflTO films was enhanced with increasing the substrate temperature in pure argon but limited by the presence of excess oxygen.
