Y2000-62028-879 0100422传输线互连的过冲与下冲控制=Overshoot and under-shoot control for transmission line interconnects[会,英]/Lee,J.& Shragowitz,E.//1999 IEEE 49th ElectronicComponents and Technology Conference....Y2000-62028-879 0100422传输线互连的过冲与下冲控制=Overshoot and under-shoot control for transmission line interconnects[会,英]/Lee,J.& Shragowitz,E.//1999 IEEE 49th ElectronicComponents and Technology Conference.—879~884(PC)研究了过冲和下冲特性与电路参数的关系。鉴别了过冲与下冲存在条件。导出了由线长、终端和上升时间引起的过冲与下冲幅度的解析解。并说明了互连长度在过冲与下冲控制中的作用。给出了模拟结果。展开更多
Y2002-63354-211 0314463宽波段微带阵的新类别=A new class of wide-band mi-crostrip arrays[会,英]/Herscovici,N.∥2001 IEEE Ra-dio and Wireless Conference.—211~214(TE)Y2002-63382-88
Y2000-62346-133 0016351采用 S 参数测量的精确与完全频率相关传输线表征=An accurate and complete frequency dependent transmis-sion line charactenzation using S-parameter measure-ments[会,英]/Winkel,T.M.//IEEE 8th Topical...Y2000-62346-133 0016351采用 S 参数测量的精确与完全频率相关传输线表征=An accurate and complete frequency dependent transmis-sion line charactenzation using S-parameter measure-ments[会,英]/Winkel,T.M.//IEEE 8th TopicalMeeting on Electrical Performance of Electronic Packag-ing.—133~136(PC)Y2000-62346-137 0016352传输链辐射:局部化缺陷影响=Transmission link radi-ation:localized defect contribution[会,英]/Martinod,E.& Nadeau,P.//IEEE 8th Topical Meeting on Elec-trical Performance of Electronic Packaging.—137~140(PC)展开更多
文摘Y2000-62028-879 0100422传输线互连的过冲与下冲控制=Overshoot and under-shoot control for transmission line interconnects[会,英]/Lee,J.& Shragowitz,E.//1999 IEEE 49th ElectronicComponents and Technology Conference.—879~884(PC)研究了过冲和下冲特性与电路参数的关系。鉴别了过冲与下冲存在条件。导出了由线长、终端和上升时间引起的过冲与下冲幅度的解析解。并说明了互连长度在过冲与下冲控制中的作用。给出了模拟结果。
文摘Y2002-63354-211 0314463宽波段微带阵的新类别=A new class of wide-band mi-crostrip arrays[会,英]/Herscovici,N.∥2001 IEEE Ra-dio and Wireless Conference.—211~214(TE)Y2002-63382-88
文摘Y2000-62346-133 0016351采用 S 参数测量的精确与完全频率相关传输线表征=An accurate and complete frequency dependent transmis-sion line charactenzation using S-parameter measure-ments[会,英]/Winkel,T.M.//IEEE 8th TopicalMeeting on Electrical Performance of Electronic Packag-ing.—133~136(PC)Y2000-62346-137 0016352传输链辐射:局部化缺陷影响=Transmission link radi-ation:localized defect contribution[会,英]/Martinod,E.& Nadeau,P.//IEEE 8th Topical Meeting on Elec-trical Performance of Electronic Packaging.—137~140(PC)