Proposed herein is a novel non planar cell structure for flash memory which has been fabricated to achieve high programming speed with low operating voltage.This memory cell preserves a simple stacked gate structure ...Proposed herein is a novel non planar cell structure for flash memory which has been fabricated to achieve high programming speed with low operating voltage.This memory cell preserves a simple stacked gate structure which only requires an additional masking step to form the novel structure in the channel.For the cell of the 1 2μm gate length,the programming speed of 43μs under the measuring condition of V g=15V, V d=5V,and the erasing time of 24ms under V g=-5V, V s=8V are obtained.The programming speed is faster than that of the conventional planar cell structure.This superior programming speed makes it suitable for high speed application.展开更多
Step channel direct injection(SCDI)flash memory device which had been developed changes the hot carrier injection method by making a shallow step in the middle of channel .Therefore high speed for programming,hig...Step channel direct injection(SCDI)flash memory device which had been developed changes the hot carrier injection method by making a shallow step in the middle of channel .Therefore high speed for programming,high efficiency for injection,and lower working voltage are obtained.Simulation and analysis for the proposed SCDI structure device are done and an optimization scheme to improve the utmost performance of SCDI device is given...展开更多
Step channel direct injection(SCDI) flash memory device is successfully achieved by 1 2μm CMOS technology,moreover good performance is obtained.At the bias condition of V g=6V, V d=5V,the programming speed ...Step channel direct injection(SCDI) flash memory device is successfully achieved by 1 2μm CMOS technology,moreover good performance is obtained.At the bias condition of V g=6V, V d=5V,the programming speed of SCDI device is 42μs.Under the condition of V g=-8V, V s=8V,the erasing speed is 24ms.Compared with the same size of conventional flash memory device whose corresponding parameters are 500μs and 24ms,respectively,the performance of SCDI device is remarkably improved.During manufacturing of SCDI device,the key technologies are to make the shallow step with appropriate depth and angle,along with eliminating the etch damage during the process of Si 3N 4 spacer.展开更多
A novel p-channel selected n-channel divided bit-line NOR(PNOR) flash memory,which features low programming current,low power,high access current,and slight bit-line disturbance,is proposed.By using the source induced...A novel p-channel selected n-channel divided bit-line NOR(PNOR) flash memory,which features low programming current,low power,high access current,and slight bit-line disturbance,is proposed.By using the source induced band-to-band hot electron injection (SIBE) to perform programming and dividing the bit-line to the sub-bit-lines,the programming current and power can be reduced to 3.5μA and 16.5μW with the sub-bit-line width equaling to 128,and a read current of 60μA is obtained.Furthermore,the bit-line disturbance is also significantly alleviated.展开更多
A 32 kbit OTP(one-time programmable)memory for MCUs(micro-controller units)used in remote controllers was designed.This OTP memory is used for program and data storage.It is required to apply 5.5V to BL(bit-line)and 1...A 32 kbit OTP(one-time programmable)memory for MCUs(micro-controller units)used in remote controllers was designed.This OTP memory is used for program and data storage.It is required to apply 5.5V to BL(bit-line)and 11V to WL(word-line)for a OTP cell of 0.35μm ETOX(EEPROM tunnel oxide)type by MagnaChip.We use 5V transistors on column data paths to reduce the area of column data paths since they require small areas.In addition,we secure device reliability by using HV(high-voltage)transistors in the WL driver.Furthermore,we change from a static logic to a dynamic logic used for the WL driver in the core circuit.Also,we optimize the WD(write data)switch circuit.Thus,we can implement them with a small-area design.In addition,we implement the address predecoder with a small-area logic circuit.The area of the designed 32 kbit OTP with 5V and HV devices is 674.725μm×258.75μm(=0.1745mm2)and is 56.3% smaller than that using 3.3V devices.展开更多
Polar coded sparse code multiple access(SCMA) system is conceived in this paper. A simple but new iterative multiuser detection framework is proposed, which consists of a message passing algorithm(MPA) based multiuser...Polar coded sparse code multiple access(SCMA) system is conceived in this paper. A simple but new iterative multiuser detection framework is proposed, which consists of a message passing algorithm(MPA) based multiuser detector and a soft-input soft-output(SISO) successive cancellation(SC) polar decoder. In particular, the SISO polar decoding process is realized by a specifically designed soft re-encoder, which is concatenated to the original SC decoder. This soft re-encoder is capable of reconstructing the soft information of the entire polar codeword based on previously detected log-likelihood ratios(LLRs) of information bits. Benefiting from the soft re-encoding algorithm, the resultant iterative detection strategy is able to obtain a salient coding gain. Our simulation results demonstrate that significant improvement in error performance is achieved by the proposed polar-coded SCMA in additive white Gaussian noise(AWGN) channels, where the performance of the conventional SISO belief propagation(BP) polar decoder aided SCMA, the turbo coded SCMA and the low-density parity-check(LDPC) coded SCMA are employed as benchmarks.展开更多
With the development of manufacture technology, the multi-level cell(MLC)technique dramatically increases the storage density of NAND flash memory. As the result,cell-to-cell interference(CCI) becomes more serious and...With the development of manufacture technology, the multi-level cell(MLC)technique dramatically increases the storage density of NAND flash memory. As the result,cell-to-cell interference(CCI) becomes more serious and hence causes an increase in the raw bit error rate of data stored in the cells.Recently, low-density parity-check(LDPC)codes have appeared to be a promising solution to combat the interference of MLC NAND flash memory. However, the decoding complexity of the sum-product algorithm(SPA) is extremely high. In this paper, to improve the accuracy of the log likelihood ratio(LLR) information of each bit in each NAND flash memory cell, we adopt a non-uniform detection(N-UD) which uses the average maximum mutual information to determine the value of the soft-decision reference voltages.Furthermore, with an aim to reduce the decoding complexity and improve the decoding performance, we propose a modified soft reliabilitybased iterative majority-logic decoding(MSRBI-MLGD) algorithm, which uses a non-uniform quantizer based on power function to decode LDPC codes. Simulation results show that our design can offer a desirable trade-off between the performance and complexity for high-column-weight LDPC-coded MLC NAND flash memory.展开更多
A 1 kbit antifuse one time programmable(OTP) memory IP,which is one of the non-volatile memory IPs,was designed and used for power management integrated circuits(ICs).A conventional antifuse OTP cell using a single po...A 1 kbit antifuse one time programmable(OTP) memory IP,which is one of the non-volatile memory IPs,was designed and used for power management integrated circuits(ICs).A conventional antifuse OTP cell using a single positive program voltage(VPP) has a problem when applying a higher voltage than the breakdown voltage of the thin gate oxides and at the same time,securing the reliability of medium voltage(VM) devices that are thick gate transistors.A new antifuse OTP cell using a dual program voltage was proposed to prevent the possibility for failures in a qualification test or the yield drop.For the newly proposed cell,a stable sensing is secured from the post-program resistances of several ten thousand ohms or below due to the voltage higher than the hard breakdown voltage applied to the terminals of the antifuse.The layout size of the designed 1 kbit antifuse OTP memory IP with Dongbu HiTek's 0.18 μm Bipolar-CMOS-DMOS(BCD) process is 567.9 μm×205.135 μm and the post-program resistance of an antifuse is predicted to be several ten thousand ohms.展开更多
By controlling the amorphous-to-crystalline relative volume,chalcogenide phase-change memory materials can provide multi-level data storage(MLS),which offers great potential for high-density storageclass memory and ne...By controlling the amorphous-to-crystalline relative volume,chalcogenide phase-change memory materials can provide multi-level data storage(MLS),which offers great potential for high-density storageclass memory and neuro-inspired computing.However,this type of MLS system suffers from high power consumption and a severe time-dependent resistance increase(‘‘drift")in the amorphous phase,which limits the number of attainable storage levels.Here,we report a new type of MLS system in yttriumdoped antimony telluride,utilizing reversible multi-level phase transitions between three states,i.e.,amorphous,metastable cubic and stable hexagonal crystalline phases,with ultralow power consumption(0.6–4.3 p J)and ultralow resistance drift for the lower two states(power-law exponent<0.007).The metastable cubic phase is stabilized by yttrium,while the evident reversible cubic-to-hexagonal transition is attributed to the sequential and directional migration of Sb atoms.Finally,the decreased heat dissipation of the material and the increase in crystallinity contribute to the overall high performance.This study opens a new way to achieve advanced multi-level phase-change memory without the need for complicated manufacturing procedures or iterative programming operations.展开更多
SRAM(static random access memory)-based FPGA(field programmable gate array), owing to its large capacity, high performance, and dynamical reconfiguration, has become an attractive platform for So PC(system on programm...SRAM(static random access memory)-based FPGA(field programmable gate array), owing to its large capacity, high performance, and dynamical reconfiguration, has become an attractive platform for So PC(system on programmable chip) development. However, as the configuration memory and logic memory of the SRAM-based FPGA are highly susceptible to SEUs(single-event upsets) in deep space, it is a challenge to design and implement a highly reliable FPGA-based system for spacecraft, and no practical architecture has been proposed. In this paper, a new architecture for a reliable and reconfigurable FPGAbased computer in a highly critical GNC(guidance navigation and control) system is proposed. To mitigate the effect of an SEU on the system, multi-layer reconfiguration and multi-layer TMR(triple module redundancy) techniques are proposed, with a reliable reconfigurable real-time operating system(Space OS) managing the system level fault tolerance of the computer in the architecture. The proposed architecture for the reconfigurable FPGA-based computer has been implemented with COTS(commercial off the shelf) FPGA and has firstly been applied to the GNC system of a circumlunar return and reentry flight vehicle. The in-orbit results show that the proposed architecture is capable of meeting the requirements of high reliability and high availability, and can provide the expressive varying functionality and runtime flexibility for an FPGA-based GNC computer in deep space.展开更多
文摘Proposed herein is a novel non planar cell structure for flash memory which has been fabricated to achieve high programming speed with low operating voltage.This memory cell preserves a simple stacked gate structure which only requires an additional masking step to form the novel structure in the channel.For the cell of the 1 2μm gate length,the programming speed of 43μs under the measuring condition of V g=15V, V d=5V,and the erasing time of 24ms under V g=-5V, V s=8V are obtained.The programming speed is faster than that of the conventional planar cell structure.This superior programming speed makes it suitable for high speed application.
文摘Step channel direct injection(SCDI)flash memory device which had been developed changes the hot carrier injection method by making a shallow step in the middle of channel .Therefore high speed for programming,high efficiency for injection,and lower working voltage are obtained.Simulation and analysis for the proposed SCDI structure device are done and an optimization scheme to improve the utmost performance of SCDI device is given...
文摘Step channel direct injection(SCDI) flash memory device is successfully achieved by 1 2μm CMOS technology,moreover good performance is obtained.At the bias condition of V g=6V, V d=5V,the programming speed of SCDI device is 42μs.Under the condition of V g=-8V, V s=8V,the erasing speed is 24ms.Compared with the same size of conventional flash memory device whose corresponding parameters are 500μs and 24ms,respectively,the performance of SCDI device is remarkably improved.During manufacturing of SCDI device,the key technologies are to make the shallow step with appropriate depth and angle,along with eliminating the etch damage during the process of Si 3N 4 spacer.
文摘A novel p-channel selected n-channel divided bit-line NOR(PNOR) flash memory,which features low programming current,low power,high access current,and slight bit-line disturbance,is proposed.By using the source induced band-to-band hot electron injection (SIBE) to perform programming and dividing the bit-line to the sub-bit-lines,the programming current and power can be reduced to 3.5μA and 16.5μW with the sub-bit-line width equaling to 128,and a read current of 60μA is obtained.Furthermore,the bit-line disturbance is also significantly alleviated.
基金Project supported by the Second Stage of Brain Korea 21 Projects,Korea
文摘A 32 kbit OTP(one-time programmable)memory for MCUs(micro-controller units)used in remote controllers was designed.This OTP memory is used for program and data storage.It is required to apply 5.5V to BL(bit-line)and 11V to WL(word-line)for a OTP cell of 0.35μm ETOX(EEPROM tunnel oxide)type by MagnaChip.We use 5V transistors on column data paths to reduce the area of column data paths since they require small areas.In addition,we secure device reliability by using HV(high-voltage)transistors in the WL driver.Furthermore,we change from a static logic to a dynamic logic used for the WL driver in the core circuit.Also,we optimize the WD(write data)switch circuit.Thus,we can implement them with a small-area design.In addition,we implement the address predecoder with a small-area logic circuit.The area of the designed 32 kbit OTP with 5V and HV devices is 674.725μm×258.75μm(=0.1745mm2)and is 56.3% smaller than that using 3.3V devices.
基金supported in part by National Natural Science Foundation of China (no. 61571373, no. 61501383, no. U1734209, no. U1709219)in part by Key International Cooperation Project of Sichuan Province (no. 2017HH0002)+2 种基金in part by Marie Curie Fellowship (no. 792406)in part by the National Science and Technology Major Project under Grant 2016ZX03001018-002in part by NSFC China-Swedish project (no. 6161101297)
文摘Polar coded sparse code multiple access(SCMA) system is conceived in this paper. A simple but new iterative multiuser detection framework is proposed, which consists of a message passing algorithm(MPA) based multiuser detector and a soft-input soft-output(SISO) successive cancellation(SC) polar decoder. In particular, the SISO polar decoding process is realized by a specifically designed soft re-encoder, which is concatenated to the original SC decoder. This soft re-encoder is capable of reconstructing the soft information of the entire polar codeword based on previously detected log-likelihood ratios(LLRs) of information bits. Benefiting from the soft re-encoding algorithm, the resultant iterative detection strategy is able to obtain a salient coding gain. Our simulation results demonstrate that significant improvement in error performance is achieved by the proposed polar-coded SCMA in additive white Gaussian noise(AWGN) channels, where the performance of the conventional SISO belief propagation(BP) polar decoder aided SCMA, the turbo coded SCMA and the low-density parity-check(LDPC) coded SCMA are employed as benchmarks.
基金supported in part by the NSF of China (61471131, 61771149, 61501126)NSF of Guangdong Province 2016A030310337+1 种基金the open research fund of National Mobile Communications Research Laboratory, Southeast University (No. 2018D02)the Guangdong Province Universities and Colleges Pearl River Scholar Funded Scheme (2017-ZJ022)
文摘With the development of manufacture technology, the multi-level cell(MLC)technique dramatically increases the storage density of NAND flash memory. As the result,cell-to-cell interference(CCI) becomes more serious and hence causes an increase in the raw bit error rate of data stored in the cells.Recently, low-density parity-check(LDPC)codes have appeared to be a promising solution to combat the interference of MLC NAND flash memory. However, the decoding complexity of the sum-product algorithm(SPA) is extremely high. In this paper, to improve the accuracy of the log likelihood ratio(LLR) information of each bit in each NAND flash memory cell, we adopt a non-uniform detection(N-UD) which uses the average maximum mutual information to determine the value of the soft-decision reference voltages.Furthermore, with an aim to reduce the decoding complexity and improve the decoding performance, we propose a modified soft reliabilitybased iterative majority-logic decoding(MSRBI-MLGD) algorithm, which uses a non-uniform quantizer based on power function to decode LDPC codes. Simulation results show that our design can offer a desirable trade-off between the performance and complexity for high-column-weight LDPC-coded MLC NAND flash memory.
基金Work supported by the Second Stage of Brain Korea 21 Projectssupported by Changwon National University in 2009-2010
文摘A 1 kbit antifuse one time programmable(OTP) memory IP,which is one of the non-volatile memory IPs,was designed and used for power management integrated circuits(ICs).A conventional antifuse OTP cell using a single positive program voltage(VPP) has a problem when applying a higher voltage than the breakdown voltage of the thin gate oxides and at the same time,securing the reliability of medium voltage(VM) devices that are thick gate transistors.A new antifuse OTP cell using a dual program voltage was proposed to prevent the possibility for failures in a qualification test or the yield drop.For the newly proposed cell,a stable sensing is secured from the post-program resistances of several ten thousand ohms or below due to the voltage higher than the hard breakdown voltage applied to the terminals of the antifuse.The layout size of the designed 1 kbit antifuse OTP memory IP with Dongbu HiTek's 0.18 μm Bipolar-CMOS-DMOS(BCD) process is 567.9 μm×205.135 μm and the post-program resistance of an antifuse is predicted to be several ten thousand ohms.
基金the National Key Research and Development Program of China(2017YFB0701700)the National Natural Science Foundation of China(51872017)the High-Performance Computing(HPC)Resources at Beihang University。
文摘By controlling the amorphous-to-crystalline relative volume,chalcogenide phase-change memory materials can provide multi-level data storage(MLS),which offers great potential for high-density storageclass memory and neuro-inspired computing.However,this type of MLS system suffers from high power consumption and a severe time-dependent resistance increase(‘‘drift")in the amorphous phase,which limits the number of attainable storage levels.Here,we report a new type of MLS system in yttriumdoped antimony telluride,utilizing reversible multi-level phase transitions between three states,i.e.,amorphous,metastable cubic and stable hexagonal crystalline phases,with ultralow power consumption(0.6–4.3 p J)and ultralow resistance drift for the lower two states(power-law exponent<0.007).The metastable cubic phase is stabilized by yttrium,while the evident reversible cubic-to-hexagonal transition is attributed to the sequential and directional migration of Sb atoms.Finally,the decreased heat dissipation of the material and the increase in crystallinity contribute to the overall high performance.This study opens a new way to achieve advanced multi-level phase-change memory without the need for complicated manufacturing procedures or iterative programming operations.
基金supported by the Major Special Projects on National Medium and Long-term Science and Technology Development Planning
文摘SRAM(static random access memory)-based FPGA(field programmable gate array), owing to its large capacity, high performance, and dynamical reconfiguration, has become an attractive platform for So PC(system on programmable chip) development. However, as the configuration memory and logic memory of the SRAM-based FPGA are highly susceptible to SEUs(single-event upsets) in deep space, it is a challenge to design and implement a highly reliable FPGA-based system for spacecraft, and no practical architecture has been proposed. In this paper, a new architecture for a reliable and reconfigurable FPGAbased computer in a highly critical GNC(guidance navigation and control) system is proposed. To mitigate the effect of an SEU on the system, multi-layer reconfiguration and multi-layer TMR(triple module redundancy) techniques are proposed, with a reliable reconfigurable real-time operating system(Space OS) managing the system level fault tolerance of the computer in the architecture. The proposed architecture for the reconfigurable FPGA-based computer has been implemented with COTS(commercial off the shelf) FPGA and has firstly been applied to the GNC system of a circumlunar return and reentry flight vehicle. The in-orbit results show that the proposed architecture is capable of meeting the requirements of high reliability and high availability, and can provide the expressive varying functionality and runtime flexibility for an FPGA-based GNC computer in deep space.