To advance the printing manufacturing industry towards intelligence and address the challenges faced by supervised learning,such as the high workload,cost,poor generalization,and labeling issues,an unsupervised and tr...To advance the printing manufacturing industry towards intelligence and address the challenges faced by supervised learning,such as the high workload,cost,poor generalization,and labeling issues,an unsupervised and transfer learning-based method for printing defect detection was proposed in this study.This method enabled defect detection in printed surface without the need for extensive labeled defect.The ResNet101-SSTU model was used in this study.On the public dataset of printing defect images,the ResNet101-SSTU model not only achieves comparable performance and speed to mainstream supervised learning detection models but also successfully addresses some of the detection challenges encountered in supervised learning.The proposed ResNet101-SSTU model effectively eliminates the need for extensive defect samples and labeled data in training,providing an efficient solution for quality inspection in the printing industry.展开更多
The defect detection of wafers is an important part of semiconductor manufacturing.The wafer defect map formed from the defects can be used to trace back the problems in the production process and make improvements in...The defect detection of wafers is an important part of semiconductor manufacturing.The wafer defect map formed from the defects can be used to trace back the problems in the production process and make improvements in the yield of wafer manufacturing.Therefore,for the pattern recognition of wafer defects,this paper uses an improved ResNet convolutional neural network for automatic pattern recognition of seven common wafer defects.On the basis of the original ResNet,the squeeze-and-excitation(SE)attention mechanism is embedded into the network,through which the feature extraction ability of the network can be improved,key features can be found,and useless features can be suppressed.In addition,the residual structure is improved,and the depth separable convolution is added to replace the traditional convolution to reduce the computational and parametric quantities of the network.In addition,the network structure is improved and the activation function is changed.Comprehensive experiments show that the precision of the improved ResNet in this paper reaches 98.5%,while the number of parameters is greatly reduced compared with the original model,and has well results compared with the common convolutional neural network.Comprehensively,the method in this paper can be very good for pattern recognition of common wafer defect types,and has certain application value.展开更多
To segment defects from the quad flat non-lead QFN package surface a multilevel Otsu thresholding method based on the firefly algorithm with opposition-learning is proposed. First the Otsu thresholding algorithm is ex...To segment defects from the quad flat non-lead QFN package surface a multilevel Otsu thresholding method based on the firefly algorithm with opposition-learning is proposed. First the Otsu thresholding algorithm is expanded to a multilevel Otsu thresholding algorithm. Secondly a firefly algorithm with opposition-learning OFA is proposed.In the OFA opposite fireflies are generated to increase the diversity of the fireflies and improve the global search ability. Thirdly the OFA is applied to searching multilevel thresholds for image segmentation. Finally the proposed method is implemented to segment the QFN images with defects and the results are compared with three methods i.e. the exhaustive search method the multilevel Otsu thresholding method based on particle swarm optimization and the multilevel Otsu thresholding method based on the firefly algorithm. Experimental results show that the proposed method can segment QFN surface defects images more efficiently and at a greater speed than that of the other three methods.展开更多
By taking into account the two-spin interaction in the transverse Ising model （TIM）, the influence of the defect layers （including JB and ΩB） on the polarization and Curie temperature are calculated numerically, ...By taking into account the two-spin interaction in the transverse Ising model （TIM）, the influence of the defect layers （including JB and ΩB） on the polarization and Curie temperature are calculated numerically, within the framework of the decoupling approximation under Green＇s function. The numerical results show that the polarization and Curie temperature will both become large sensitively due to the large values of JB and the small value of ΩB of the defect layers. Meanwhile, the dependence of the crossover values of the exchange interaction JA, the transverse field ΩA of the bulk material on the exchange interaction JB and the transverse field ΩB of the defect layers are shown in 3-Dimensional （3-D） figures for the first time. Moreover, the transition features of the ferroelectric thin film with defect layers are presented.展开更多
文摘To advance the printing manufacturing industry towards intelligence and address the challenges faced by supervised learning,such as the high workload,cost,poor generalization,and labeling issues,an unsupervised and transfer learning-based method for printing defect detection was proposed in this study.This method enabled defect detection in printed surface without the need for extensive labeled defect.The ResNet101-SSTU model was used in this study.On the public dataset of printing defect images,the ResNet101-SSTU model not only achieves comparable performance and speed to mainstream supervised learning detection models but also successfully addresses some of the detection challenges encountered in supervised learning.The proposed ResNet101-SSTU model effectively eliminates the need for extensive defect samples and labeled data in training,providing an efficient solution for quality inspection in the printing industry.
基金supported by the 2021 Annual Scientific Research Funding Project of Liaoning Pro-vincial Department of Education(Nos.LJKZ0535,LJKZ0526)the Natural Science Foundation of Liaoning Province(No.2021-MS-300)。
文摘The defect detection of wafers is an important part of semiconductor manufacturing.The wafer defect map formed from the defects can be used to trace back the problems in the production process and make improvements in the yield of wafer manufacturing.Therefore,for the pattern recognition of wafer defects,this paper uses an improved ResNet convolutional neural network for automatic pattern recognition of seven common wafer defects.On the basis of the original ResNet,the squeeze-and-excitation(SE)attention mechanism is embedded into the network,through which the feature extraction ability of the network can be improved,key features can be found,and useless features can be suppressed.In addition,the residual structure is improved,and the depth separable convolution is added to replace the traditional convolution to reduce the computational and parametric quantities of the network.In addition,the network structure is improved and the activation function is changed.Comprehensive experiments show that the precision of the improved ResNet in this paper reaches 98.5%,while the number of parameters is greatly reduced compared with the original model,and has well results compared with the common convolutional neural network.Comprehensively,the method in this paper can be very good for pattern recognition of common wafer defect types,and has certain application value.
基金The National Natural Science Foundation of China(No.50805023)the Science and Technology Support Program of Jiangsu Province(No.BE2008081)+1 种基金the Transformation Program of Science and Technology Achievements of Jiangsu Province(No.BA2010093)the Program for Special Talent in Six Fields of Jiangsu Province(No.2008144)
文摘To segment defects from the quad flat non-lead QFN package surface a multilevel Otsu thresholding method based on the firefly algorithm with opposition-learning is proposed. First the Otsu thresholding algorithm is expanded to a multilevel Otsu thresholding algorithm. Secondly a firefly algorithm with opposition-learning OFA is proposed.In the OFA opposite fireflies are generated to increase the diversity of the fireflies and improve the global search ability. Thirdly the OFA is applied to searching multilevel thresholds for image segmentation. Finally the proposed method is implemented to segment the QFN images with defects and the results are compared with three methods i.e. the exhaustive search method the multilevel Otsu thresholding method based on particle swarm optimization and the multilevel Otsu thresholding method based on the firefly algorithm. Experimental results show that the proposed method can segment QFN surface defects images more efficiently and at a greater speed than that of the other three methods.
文摘By taking into account the two-spin interaction in the transverse Ising model （TIM）, the influence of the defect layers （including JB and ΩB） on the polarization and Curie temperature are calculated numerically, within the framework of the decoupling approximation under Green＇s function. The numerical results show that the polarization and Curie temperature will both become large sensitively due to the large values of JB and the small value of ΩB of the defect layers. Meanwhile, the dependence of the crossover values of the exchange interaction JA, the transverse field ΩA of the bulk material on the exchange interaction JB and the transverse field ΩB of the defect layers are shown in 3-Dimensional （3-D） figures for the first time. Moreover, the transition features of the ferroelectric thin film with defect layers are presented.
