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碳纳米管的STM观测 被引量:1
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作者 吴雪 李允中 +5 位作者 高立模 陈海建 王玉芳 张天浩 蓝国祥 王磊光 《南开大学学报(自然科学版)》 CAS CSCD 北大核心 2002年第1期124-126,共3页
本文利用隧道扫描显微镜 ( STM)在室温条件下 ,低真空环境中 ,在高定向裂解石墨 ( HOPG)表面 ,对单壁碳纳米管 ( SWCN)以及多壁碳纳米管 ( MWCN)进行了观测 。
关键词 单壁碳纳米管 多壁碳纳米管 隧道扫描显微镜 STM观测 定向裂解石墨表面 隧道电流
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The Origin of Wrinkles on Transferred Graphene 被引量:6
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作者 Nan Liu Zhonghuai Pan +3 位作者 Lei Fu Chaohua Zhang Boya Dai Zhongfan Liu 《Nano Research》 SCIE EI CAS CSCD 2011年第10期996-1004,共9页
When two-dimensional graphene is exfoliated from three-dimensional highly oriented pyrolytic graphite (HOPG), ripples or corrugations always exist due to the intrinsic thermal fluctuations. Surface-grown graphenes a... When two-dimensional graphene is exfoliated from three-dimensional highly oriented pyrolytic graphite (HOPG), ripples or corrugations always exist due to the intrinsic thermal fluctuations. Surface-grown graphenes also exhibit wrinkles, which are larger in dimension and are thought to be caused by the difference in thermal expansion coefficients between graphene and the underlying substrate in the cooling process after high temperature growth. For further characterization and applications, it is necessary to transfer the surface-grown graphenes onto dielectric substrates, and other wrinkles are generated during this process. Here, we focus on the wrinkles of transferred graphene and demonstrate that the surface morphology of the growth substrate is the origin of the new wrinkles which arise in the surface-to-surface transfer process; we call these morphology- induced wrinkles. Based on a careful statistical analysis of thousands of atomic force microscopy (AFM) topographic data, we have concluded that these wrinkles on transferred few-layer graphene (typically 1-3 layers) are determined by both the growth substrate morphology and the transfer process. Depending on the transfer medium and conditions, most of the wrinkles can be either released or preserved. Our work suggests a new route for graphene engineering involving structuring the growth substrate and tailoring the transfer process. 展开更多
关键词 GRAPHENE WRINKLE TRANSFER surface topography atomic force microscopy
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