The coefficient and dynamics of water diffusion in adhesive-graphite joints were calculated in-situ with energy dispersive X-ray (EDX) analysis, a method that is significantly simpler than elemental analysis. Water di...The coefficient and dynamics of water diffusion in adhesive-graphite joints were calculated in-situ with energy dispersive X-ray (EDX) analysis, a method that is significantly simpler than elemental analysis. Water diffusion coefficient and dynamics of adhesive-graphite joints treated by different surface treatment methods were also investigated. Calculation results indicated that the water diffusion rate in adhesive-graphite joints treated by sandpaper was higher than that treated by chemical oxidation or by silane couple agent. Also the durability of graphite joints treated by coupling agent is superior to that treated by chemical oxidation or sandpaper burnishing.展开更多
A new statistical fitting approach, named Statistical Distribution-Based Analytic （SDA） method, is proposed to fit single Gaussian-shaped Ka and KI3 X-ray peaks recorded by Si（PIN） and silicon drift detector （SDD...A new statistical fitting approach, named Statistical Distribution-Based Analytic （SDA） method, is proposed to fit single Gaussian-shaped Ka and KI3 X-ray peaks recorded by Si（PIN） and silicon drift detector （SDD）. In this method, we use the dis- crete distribution theory to calculate standard deviation of energy resolution a. The calibration of cr and energy （E） for two de- tectors between the energy ranges of 4.5-26 keV are also completed by measuring characteristic X-ray spectra of nineteen types of pure elements. With the spectrum fraction （SF） parameter proposed in this paper, the SDA method can be used to re- solve overlapping peaks. In measured spectra, the Gaussian part of X-ray peaks can be fitted by a Gaussian function with two parameters, ~ and SF. This new fitting approach is simpler than traditional methods and it achieves relatively good results when fitting the complex X-ray spectra of national standard alloy samples detected by Si（PIN） and SDD detectors. The 3（2 values are obtained for each spectrum to assess fitting results, and the SDA fitting method gives a preferable fit for the SDD detector.展开更多
文摘The coefficient and dynamics of water diffusion in adhesive-graphite joints were calculated in-situ with energy dispersive X-ray (EDX) analysis, a method that is significantly simpler than elemental analysis. Water diffusion coefficient and dynamics of adhesive-graphite joints treated by different surface treatment methods were also investigated. Calculation results indicated that the water diffusion rate in adhesive-graphite joints treated by sandpaper was higher than that treated by chemical oxidation or by silane couple agent. Also the durability of graphite joints treated by coupling agent is superior to that treated by chemical oxidation or sandpaper burnishing.
基金supported by the National Natural Science Foundation of China(Grant Nos.40974065,41025015)the National High Technology Research and Development Program of China(Grant No.2012AA063501)Ph.D.Programs Foundation of Ministry of Education of China(Grant No.20125122110009)
文摘A new statistical fitting approach, named Statistical Distribution-Based Analytic （SDA） method, is proposed to fit single Gaussian-shaped Ka and KI3 X-ray peaks recorded by Si（PIN） and silicon drift detector （SDD）. In this method, we use the dis- crete distribution theory to calculate standard deviation of energy resolution a. The calibration of cr and energy （E） for two de- tectors between the energy ranges of 4.5-26 keV are also completed by measuring characteristic X-ray spectra of nineteen types of pure elements. With the spectrum fraction （SF） parameter proposed in this paper, the SDA method can be used to re- solve overlapping peaks. In measured spectra, the Gaussian part of X-ray peaks can be fitted by a Gaussian function with two parameters, ~ and SF. This new fitting approach is simpler than traditional methods and it achieves relatively good results when fitting the complex X-ray spectra of national standard alloy samples detected by Si（PIN） and SDD detectors. The 3（2 values are obtained for each spectrum to assess fitting results, and the SDA fitting method gives a preferable fit for the SDD detector.
