Immiscible Cu-W alloy thin films were prepared using dual-target magnetron sputtering deposition process. The structure evolution of Cu-W thin films during preparation was investigated by X-ray diffraction, transmissi...Immiscible Cu-W alloy thin films were prepared using dual-target magnetron sputtering deposition process. The structure evolution of Cu-W thin films during preparation was investigated by X-ray diffraction, transmission electron microscopy and high resolution transmission electron microscopy. In the initial stage of dual-target magnetron sputtering deposition process, an amorphous phase formed; then it crystallized and the analogy spinodal structure formed due to the bombardment of the sputtered particles during sputtering deposition process, the surface structure of the film without the bombardment of the sputtered particles was the amorphous one, the distribution of the crystalline and amorphous phase showed layer structure. The solid solubility with the analogy spinodal structure was calculated using the Vegard law. For Cu-13.7%W （mole fraction） film, its structure was composed of Cu-ll%W solution, Cu-37%W solution and pure Cu; for Cu 14.3%W film, it was composed of Cu-15%W solution, Cu-38%W solution, and pure Cu; for Cu-18.1%W film, it was composed of Cu-19%W solution, Cu-36% W solution and pure Cu.展开更多
Using general multi-phase-field model,detailed microstructures corresponding to different initial lamellar sets were simulated in a binary eutectic alloy with an asymmetric phase diagram.The simulation results show th...Using general multi-phase-field model,detailed microstructures corresponding to different initial lamellar sets were simulated in a binary eutectic alloy with an asymmetric phase diagram.The simulation results show that regular or unstable oscillating lamellar structures depend on the initial lamellar widths of two solid phases.A lamellar morphology map associating with the initial widths has been derived,which is capable of showing the condition of forming various lamella structures.For instance,a regular lamella was formed with fast solidification while large lamella resulted from disorder growth with low interfacial velocity. The investigated interface velocities indicate that with fast solidification to form regular lamella,a disorder growth manner or a large lamellar spacing causes a low interface velocity.These results are in good agreement with those proposed by Jackson-Hunt model.展开更多
We report on a Te-seeded epitaxial growth of ultrathin Bi2Te3 nanoplates （down to three quintuple layers （QL）） with large planar sizes （up to tens of micrometers） through vapor transport. Optical contrast has be...We report on a Te-seeded epitaxial growth of ultrathin Bi2Te3 nanoplates （down to three quintuple layers （QL）） with large planar sizes （up to tens of micrometers） through vapor transport. Optical contrast has been systematically investigated for the as-grown Bi2Te3 nanoplates on the SiO2/Si substrates, experimentally and computationally. The high and distinct optical contrast provides a fast and convenient method for the thickness determination of few-QL Bi2Te3 nanoplates. By aberration-corrected scanning transmission electron microscopy, a hexagonal crystalline structure has been identified for the Te seeds, which form naturally during the growth process and initiate an epitaxial growth of the rhombohedral- structured Bi2Te3 nanoplates. The epitaxial relationship between Te and Bi2T% is identified to be perfect along both in-plane and out-of-plane directions of the layered nanoplate. Similar growth mechanism might be expected for other bismuth chalcogenide layered materials.展开更多
文摘Immiscible Cu-W alloy thin films were prepared using dual-target magnetron sputtering deposition process. The structure evolution of Cu-W thin films during preparation was investigated by X-ray diffraction, transmission electron microscopy and high resolution transmission electron microscopy. In the initial stage of dual-target magnetron sputtering deposition process, an amorphous phase formed; then it crystallized and the analogy spinodal structure formed due to the bombardment of the sputtered particles during sputtering deposition process, the surface structure of the film without the bombardment of the sputtered particles was the amorphous one, the distribution of the crystalline and amorphous phase showed layer structure. The solid solubility with the analogy spinodal structure was calculated using the Vegard law. For Cu-13.7%W （mole fraction） film, its structure was composed of Cu-ll%W solution, Cu-37%W solution and pure Cu; for Cu 14.3%W film, it was composed of Cu-15%W solution, Cu-38%W solution, and pure Cu; for Cu-18.1%W film, it was composed of Cu-19%W solution, Cu-36% W solution and pure Cu.
基金Projects(50771041,50801019)supported by the National Natural Science Foundation of ChinaProject(20080430909)supported by China Postdoctoral Science FoundationProject(HITQNJS.2008.018)supported by Development Program for Outstanding Young Teachers in Harbin Institute of Technology,China
文摘Using general multi-phase-field model,detailed microstructures corresponding to different initial lamellar sets were simulated in a binary eutectic alloy with an asymmetric phase diagram.The simulation results show that regular or unstable oscillating lamellar structures depend on the initial lamellar widths of two solid phases.A lamellar morphology map associating with the initial widths has been derived,which is capable of showing the condition of forming various lamella structures.For instance,a regular lamella was formed with fast solidification while large lamella resulted from disorder growth with low interfacial velocity. The investigated interface velocities indicate that with fast solidification to form regular lamella,a disorder growth manner or a large lamellar spacing causes a low interface velocity.These results are in good agreement with those proposed by Jackson-Hunt model.
文摘We report on a Te-seeded epitaxial growth of ultrathin Bi2Te3 nanoplates （down to three quintuple layers （QL）） with large planar sizes （up to tens of micrometers） through vapor transport. Optical contrast has been systematically investigated for the as-grown Bi2Te3 nanoplates on the SiO2/Si substrates, experimentally and computationally. The high and distinct optical contrast provides a fast and convenient method for the thickness determination of few-QL Bi2Te3 nanoplates. By aberration-corrected scanning transmission electron microscopy, a hexagonal crystalline structure has been identified for the Te seeds, which form naturally during the growth process and initiate an epitaxial growth of the rhombohedral- structured Bi2Te3 nanoplates. The epitaxial relationship between Te and Bi2T% is identified to be perfect along both in-plane and out-of-plane directions of the layered nanoplate. Similar growth mechanism might be expected for other bismuth chalcogenide layered materials.
