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平行四边形孔的夫琅和费衍射
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作者 王秋薇 杨铭珍 《物理实验》 1992年第2期55-58,共4页
在普物光学实验中,一般观察圆孔、单缝、多缝等规则孔径的夫琅和费衍射,并根据衍射图样与波长、孔径之间的定量关系可测定孔径的大小,如图孔的直径,狭缝的宽度,光栅常数等。但是复杂一些的微孔由于制作上和解释其衍射现象上的困难未被... 在普物光学实验中,一般观察圆孔、单缝、多缝等规则孔径的夫琅和费衍射,并根据衍射图样与波长、孔径之间的定量关系可测定孔径的大小,如图孔的直径,狭缝的宽度,光栅常数等。但是复杂一些的微孔由于制作上和解释其衍射现象上的困难未被列入实验教学。 展开更多
关键词 平行四力形 孔径 夫琅和费 衍射
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Effect of non-uniform stress characteristics on stress measurement in specimen 被引量:6
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作者 廖凯 吴运新 +2 位作者 龚海 闫鹏飞 郭俊康 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2010年第5期789-794,共6页
There is a remarkable difference in stress distribution between a specimen and a plate removed from the specimen.The plate presents a uniform stress distribution whereas the specimen presents a non-uniform stress dist... There is a remarkable difference in stress distribution between a specimen and a plate removed from the specimen.The plate presents a uniform stress distribution whereas the specimen presents a non-uniform stress distribution.Firstly,the real stress distributions in plates with thickness of 30,40 and 50 mm and then in the specimens were obtained through simulation and X-ray surface stress measurement.Secondly,in order to study the impact of specimens shapes and processing ways on the results accuracy,two irregular shapes (parallelogram and trapezoid) and two processing ways (saw and electron discharge machining (EDM)) were compared and analyzed by simulation and experiment using layer removal method,then the specimen effects on measurement results were evaluated.The results show that:1) the non-uniform stress distribution characteristics of the specimen near the surface of the cut is significant,the range of non-uniform stress distribution is approximately one-thickness distance away from the cut,and it decreases gradually along the depth;2) In order to ensure the stability in the results,it is suitable to take the specimen plane size 2-3 times of its thickness;3) Conventional processing methods have little effect on experimental results and the average deviation is less than 5%. 展开更多
关键词 SPECIMEN non-uniform characteristic layer removal method (LRM) stress distribution aluminum alloy plate
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Optimized Ewald sum for electrostatics in molecular self-assembly systems at interfaces 被引量:1
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作者 Cong Pan Zhonghan Hu 《Science China Chemistry》 SCIE EI CAS CSCD 2015年第6期1044-1050,共7页
We extend the recent formulation of the Ewald sum for electrostatics in a two-dimensionally periodic three-dimensional multi- atom layer or two-dimensional single-atom layer system with a rectangular periodic boundary... We extend the recent formulation of the Ewald sum for electrostatics in a two-dimensionally periodic three-dimensional multi- atom layer or two-dimensional single-atom layer system with a rectangular periodic boundary condition (J Chem Theory, Comput, 2014, 10: 534-542) to that with a parallelogrammic periodic boundary condition in general. Following the discussion of an efficient implementation of the formula, we suggest a simple setup of parameters using a relatively smaller screening factor and the associated larger real space cutoff distance to reach an optimized algorithm of an order N computational cost. The connection between the previous application of the Ewald sum to ionic crystal systems and the future application to mo- lecular self-assembly or disassembly systems on solid surfaces or at liquid-liquid interfaces ate illustrated to demonstrate the applicability of the present work to simulate the self-assembly process and to produce dynamical, structural and thermody- namic properties of experimental self-assembly systems of interest. 展开更多
关键词 Ewald summation INTERFACE
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