The degradation characteristics of both wide and narrow devices under V _g= V _d/2 stress mode is investigated.The width-enhanced device degradation can be seen with devices narrowing.The main degradation mechanism is...The degradation characteristics of both wide and narrow devices under V _g= V _d/2 stress mode is investigated.The width-enhanced device degradation can be seen with devices narrowing.The main degradation mechanism is interface state generation for pMOSFETs with different channel width.The cause of the width-enhanced device degradation is attributed to the combination of width-enhanced threshold voltage and series resistance.展开更多
The discrete element method is used to simulate specimens under three different loading conditions（conventional triaxial compression,plane strain,and direct shear）with different initial conditions to explore the und...The discrete element method is used to simulate specimens under three different loading conditions（conventional triaxial compression,plane strain,and direct shear）with different initial conditions to explore the underlying mechanics of the specimen deformation from a microscale perspective.Deformations of specimens with different initial void ratios at different confining stresses under different loading conditions are studied.Results show that the discrete element models successfully capture the specimen deformation and the strain localization.Particle behaviors including particle rotation and displacement and the mesoscale void ratio distributions are used to explain the strain localization and specimen deformation.It is found that the loading condition is one of the most important factors controlling the specimen deformation mode.Microscale behavior of the granular soil is the driving mechanics of the macroscale deformation of the granular assembly.展开更多
In the work of developing extrinsic fabry perot interferometric (EFPI), the key technology of polishing fiber optic endfaces and coating the multilayer of dielectric films on them is raised and resolved to settle the...In the work of developing extrinsic fabry perot interferometric (EFPI), the key technology of polishing fiber optic endfaces and coating the multilayer of dielectric films on them is raised and resolved to settle the disturbance and stability problem of EFPI, which simplifies the sensing system, improves the sensor performance and reduces the cost. In this paper, the relations between the output interferential light intensity and the F P cavity length are calculated based on the theory of mode field coupling. The EFPI fiber optic sensor is adhered to a distributed smart laminate beam to detect vibration frequency and axial strain value, the results coincident with the results tested by PZT.展开更多
文摘The degradation characteristics of both wide and narrow devices under V _g= V _d/2 stress mode is investigated.The width-enhanced device degradation can be seen with devices narrowing.The main degradation mechanism is interface state generation for pMOSFETs with different channel width.The cause of the width-enhanced device degradation is attributed to the combination of width-enhanced threshold voltage and series resistance.
基金The National Natural Science Foundation of China(No.51079030)
文摘The discrete element method is used to simulate specimens under three different loading conditions（conventional triaxial compression,plane strain,and direct shear）with different initial conditions to explore the underlying mechanics of the specimen deformation from a microscale perspective.Deformations of specimens with different initial void ratios at different confining stresses under different loading conditions are studied.Results show that the discrete element models successfully capture the specimen deformation and the strain localization.Particle behaviors including particle rotation and displacement and the mesoscale void ratio distributions are used to explain the strain localization and specimen deformation.It is found that the loading condition is one of the most important factors controlling the specimen deformation mode.Microscale behavior of the granular soil is the driving mechanics of the macroscale deformation of the granular assembly.
文摘In the work of developing extrinsic fabry perot interferometric (EFPI), the key technology of polishing fiber optic endfaces and coating the multilayer of dielectric films on them is raised and resolved to settle the disturbance and stability problem of EFPI, which simplifies the sensing system, improves the sensor performance and reduces the cost. In this paper, the relations between the output interferential light intensity and the F P cavity length are calculated based on the theory of mode field coupling. The EFPI fiber optic sensor is adhered to a distributed smart laminate beam to detect vibration frequency and axial strain value, the results coincident with the results tested by PZT.
