为了在地震资料和裂缝储层特征之间建立联系,对裂缝储层采用了等效介质模型.而传统的等效介质模型未充分考虑非完全弹性介质理论和基于频变各向异性理论的双相或多相流体假设,也不能对实际裂缝储层中的地震波频散和衰减现象提供准确合...为了在地震资料和裂缝储层特征之间建立联系,对裂缝储层采用了等效介质模型.而传统的等效介质模型未充分考虑非完全弹性介质理论和基于频变各向异性理论的双相或多相流体假设,也不能对实际裂缝储层中的地震波频散和衰减现象提供准确合理的解释,并且储层参数的反演研究对裂缝储层的定性预测和定量描述举足轻重.为此,本文首先根据所提出的黏弹性Chapman-Kelvin动态等效介质模型,该模型考虑了耦合的双相流体假设、黏弹性理论、喷射流以及斑块效应,并在此基础上分析了裂缝储层参数(主要为裂缝密度、裂缝长度、孔隙度和含水饱和度)对地震波频变特征的影响.然后基于黏弹性Chapman-Kelvin模型与Schoenberg和Protazio概括的Zoeppritz方程所计算出的频变反射系数,分析了反射PP波和PS波的频变AVAZ(Amplitude Versus Angle and Azimuth)特性和PP波频变反射系数与裂缝储层参数的关系.同时考虑到发生地震频散时,反射系数和频率产生关系,构建了在角度、方位和时间域内的新型正演方程.最后,基于PP波频变反射系数对裂缝密度、裂缝长度、孔隙度和含水饱和度的变化有较好的敏感性特点,进行了两种反演方法研究:其一是基于贝叶斯理论直接反演方法,其中以对数绝对范数作为似然函数和高斯分布,即L2范数度量作为先验约束;其二是基于频变反射系数的MCMC(Markov Chain Monte Carlo)随机反演方法.通过频变AVAZ进行裂缝储层参数的反演研究,结果表明,MCMC随机反演方法在缺失先验的储层参数信息时,反演结果的不确定性较强.当存在有效且足够的先验信息时,反演结果的可靠性进一步提升.而基于贝叶斯理论直接反演方法,则显示出基于频变AVAZ来区别大尺度裂缝和微尺度裂隙的潜力.展开更多
Electronic interactions of the Group 2A elements with magnesium have been studied through the dilute solid solutions in binary Mg-Ca,Mg-Sr and Mg-Ba systems.This investigation incorporated the difference in the‘Work ...Electronic interactions of the Group 2A elements with magnesium have been studied through the dilute solid solutions in binary Mg-Ca,Mg-Sr and Mg-Ba systems.This investigation incorporated the difference in the‘Work Function'(ΔWF)measured via Kelvin Probe Force Microscopy(KPFM),as a property directly affected by interatomic bond types,i.e.the electronic structure,nanoindentation measurements,and Stacking Fault Energy values reported in the literature.It was shown that the nano-hardness of the solid-solutionα-Mg phase changed in the order of Mg-Ca>Mg-Sr>Mg-Ba.Thus,it was shown,by also considering the nano-hardness levels,that SFE of a solid-solution is closely correlated with its‘Work Function'level.Nano-hardness measurements on the eutectics andΔWF difference between eutectic phases enabled an assessment of the relative bond strength and the pertinent electronic structures of the eutectics in the three alloys.Correlation withΔWF and at least qualitative verification of those computed SFE values with some experimental measurement techniques were considered important as those computational methods are based on zero Kelvin degree,relatively simple atomic models and a number of assumptions.As asserted by this investigation,if the results of measurement techniques can be qualitatively correlated with those of the computational methods,it can be possible to evaluate the electronic structures in alloys,starting from binary systems,going to ternary and then multi-elemental systems.Our investigation has shown that such a qualitative correlation is possible.After all,the SFE values are not treated as absolute values but rather become essential in comparative investigations when assessing the influences of alloying elements at a fundamental level,that is,free electron density distributions.Our study indicated that the principles of‘electronic metallurgy'in developing multi-elemental alloy systems can be followed via practical experimental methods,i.e.ΔWF measurements using KPFM and nanoindentation.展开更多
Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hund...Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy(TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference(CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.展开更多
文摘为了在地震资料和裂缝储层特征之间建立联系,对裂缝储层采用了等效介质模型.而传统的等效介质模型未充分考虑非完全弹性介质理论和基于频变各向异性理论的双相或多相流体假设,也不能对实际裂缝储层中的地震波频散和衰减现象提供准确合理的解释,并且储层参数的反演研究对裂缝储层的定性预测和定量描述举足轻重.为此,本文首先根据所提出的黏弹性Chapman-Kelvin动态等效介质模型,该模型考虑了耦合的双相流体假设、黏弹性理论、喷射流以及斑块效应,并在此基础上分析了裂缝储层参数(主要为裂缝密度、裂缝长度、孔隙度和含水饱和度)对地震波频变特征的影响.然后基于黏弹性Chapman-Kelvin模型与Schoenberg和Protazio概括的Zoeppritz方程所计算出的频变反射系数,分析了反射PP波和PS波的频变AVAZ(Amplitude Versus Angle and Azimuth)特性和PP波频变反射系数与裂缝储层参数的关系.同时考虑到发生地震频散时,反射系数和频率产生关系,构建了在角度、方位和时间域内的新型正演方程.最后,基于PP波频变反射系数对裂缝密度、裂缝长度、孔隙度和含水饱和度的变化有较好的敏感性特点,进行了两种反演方法研究:其一是基于贝叶斯理论直接反演方法,其中以对数绝对范数作为似然函数和高斯分布,即L2范数度量作为先验约束;其二是基于频变反射系数的MCMC(Markov Chain Monte Carlo)随机反演方法.通过频变AVAZ进行裂缝储层参数的反演研究,结果表明,MCMC随机反演方法在缺失先验的储层参数信息时,反演结果的不确定性较强.当存在有效且足够的先验信息时,反演结果的可靠性进一步提升.而基于贝叶斯理论直接反演方法,则显示出基于频变AVAZ来区别大尺度裂缝和微尺度裂隙的潜力.
基金financial support for this work provided by Eski sehir Technical University Scientific Research Projects Unit with Grant Number 20DRP059support provided by the Turkish Ministry of Science,Industry and Technology under the SANTEZ Project 0286.STZ.2013±2。
文摘Electronic interactions of the Group 2A elements with magnesium have been studied through the dilute solid solutions in binary Mg-Ca,Mg-Sr and Mg-Ba systems.This investigation incorporated the difference in the‘Work Function'(ΔWF)measured via Kelvin Probe Force Microscopy(KPFM),as a property directly affected by interatomic bond types,i.e.the electronic structure,nanoindentation measurements,and Stacking Fault Energy values reported in the literature.It was shown that the nano-hardness of the solid-solutionα-Mg phase changed in the order of Mg-Ca>Mg-Sr>Mg-Ba.Thus,it was shown,by also considering the nano-hardness levels,that SFE of a solid-solution is closely correlated with its‘Work Function'level.Nano-hardness measurements on the eutectics andΔWF difference between eutectic phases enabled an assessment of the relative bond strength and the pertinent electronic structures of the eutectics in the three alloys.Correlation withΔWF and at least qualitative verification of those computed SFE values with some experimental measurement techniques were considered important as those computational methods are based on zero Kelvin degree,relatively simple atomic models and a number of assumptions.As asserted by this investigation,if the results of measurement techniques can be qualitatively correlated with those of the computational methods,it can be possible to evaluate the electronic structures in alloys,starting from binary systems,going to ternary and then multi-elemental systems.Our investigation has shown that such a qualitative correlation is possible.After all,the SFE values are not treated as absolute values but rather become essential in comparative investigations when assessing the influences of alloying elements at a fundamental level,that is,free electron density distributions.Our study indicated that the principles of‘electronic metallurgy'in developing multi-elemental alloy systems can be followed via practical experimental methods,i.e.ΔWF measurements using KPFM and nanoindentation.
基金Project supported by the Zhejiang Provincial Natural Science Foundation of China (Grant No. LZ22A040003)the National Natural Science Foundation of China (Grant No. 52027809)。
文摘Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy(TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference(CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.
